Method and system for collection, analysis, and display of semiconductor manufacturing information
First Claim
1. A method for processing semi-conductor manufacturing data comprising:
- capturing files from a plurality of manufacturing data sites having semi-conductor manufacturing data;
the semi-conductor manufacturing data including test data;
the test data indicating electrical characteristics;
converting the files into a standard format for storage in a database;
building a query from a client device using a plurality of sets of selections, wherein when a first selection is made by the client device in a first set of the sets of selections, a second set of the sets of selections is dynamically changed to only display a displayed set of selections on the client device limited to selections associated with the first selection;
checking limits of the test data of the semi-conductor manufacturing data by accessing the database and comparing the test data of the semi-conductor manufacturing data stored in the database with limits therefor;
a portion of the limits being user defined limits including a parameter limit associated with the electrical characteristics, the parameter limit being for threshold voltage;
alerting the client device, when any stored semi-conductor manufacturing data exceeds one or more limit of the portion of the limits; and
generating a report for the client device based on the built query and the converted files stored in the database.
1 Assignment
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Accused Products
Abstract
A server system for receiving and processing manufacturing data from a plurality of semi-conductor manufacturers is disclosed. The server system includes: a file capture module for receiving the manufacturing data from the plurality of semi-conductor manufacturers; a format conversion module coupled to the file capture module, the format conversion module converting the manufacturing data to a standard database format for storage in a database; a query builder module coupled to a client web browser for interactively changing contents of the client web browser depending upon a plurality of client selections on the client web browser, the query builder module configured to build a final query based on the plurality of client selections; and a report generation module coupled to the database and the query builder module, the report generation module generating a report based on the final query.
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Citations
18 Claims
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1. A method for processing semi-conductor manufacturing data comprising:
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capturing files from a plurality of manufacturing data sites having semi-conductor manufacturing data; the semi-conductor manufacturing data including test data; the test data indicating electrical characteristics; converting the files into a standard format for storage in a database; building a query from a client device using a plurality of sets of selections, wherein when a first selection is made by the client device in a first set of the sets of selections, a second set of the sets of selections is dynamically changed to only display a displayed set of selections on the client device limited to selections associated with the first selection; checking limits of the test data of the semi-conductor manufacturing data by accessing the database and comparing the test data of the semi-conductor manufacturing data stored in the database with limits therefor; a portion of the limits being user defined limits including a parameter limit associated with the electrical characteristics, the parameter limit being for threshold voltage; alerting the client device, when any stored semi-conductor manufacturing data exceeds one or more limit of the portion of the limits; and generating a report for the client device based on the built query and the converted files stored in the database. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A server system, including a processor, for receiving and processing manufacturing data from a plurality of semi-conductor manufacturers, comprising:
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a file capture module for receiving the manufacturing data from the plurality of semi-conductor manufacturers; the manufacturing data including test data; the test data indicating electrical characteristics; a format conversion module coupled to the file capture module, the format conversion module converting the manufacturing data to a standard database format for storage in a database; a query builder module coupled to a client web browser for interactively changing contents of the client web browser depending upon a plurality of client selections on the client web browser, the query builder module configured to build a final query based on the plurality of client selections; a limit checker and alert module configured to check a predetermined limit of at least some of the test data of the manufacturing data stored in the database; the predetermined limit being a user defined limit for a parameter associated with the electrical characteristics, the parameter being for threshold voltage; and a report generation module coupled to the database and the query builder module, the report generation module generating a report based on the final query. - View Dependent Claims (12, 13, 14, 15, 16, 17)
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18. A computer program stored in a computer readable storage medium, the computer program comprising;
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code for capturing files from a plurality of manufacturers having programmable logic device (“
PLD”
) manufacturing data;the PLD manufacturing data including test data; the test data indicating electrical characteristics; code for converting the files into a standard format for storage in a database; code for building a query from a client web browser using a plurality of sets of selections, wherein when a first selection is made by the client device in a first set of the sets of selections, a second set of the sets of selections has a displayed set of selections on the web browser limited to selections associated with the first selection; code for generating a report for the client web browser based on the built query and the converted files stored in the database; code for checking limits of the PLD manufacturing data by accessing the database; code for comparing the test data of the PLD manufacturing data stored in the database with limits therefor, the limits being user defined limits including a parameter limit associated with the electrical characteristics, the parameter limit being for threshold voltage; and code for alerting the client device, when any stored PLD manufacturing data exceeds the limits during the comparing.
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Specification