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In-situ monitor of process and device parameters in integrated circuits

  • US 7,583,087 B2
  • Filed: 02/22/2005
  • Issued: 09/01/2009
  • Est. Priority Date: 02/22/2005
  • Status: Active Grant
First Claim
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1. An integrated circuit, comprising:

  • at least one test circuit embedded within the integrated circuit, the at least one test circuit capable of providing data regarding at least one process, device, or circuit parameter, the test circuit comprising;

    a parameter testing circuit designed to provide test data regarding at least one process, device, or circuit parameter, the parameter test circuit including an input driver coupled to provide at least one input signal to the parameter testing circuit; and

    an output driver coupled to receive a parameter signal from the parameter testing circuit,wherein the input driver is further coupled to a scan-path testing circuit.

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