In-situ monitor of process and device parameters in integrated circuits
First Claim
1. An integrated circuit, comprising:
- at least one test circuit embedded within the integrated circuit, the at least one test circuit capable of providing data regarding at least one process, device, or circuit parameter, the test circuit comprising;
a parameter testing circuit designed to provide test data regarding at least one process, device, or circuit parameter, the parameter test circuit including an input driver coupled to provide at least one input signal to the parameter testing circuit; and
an output driver coupled to receive a parameter signal from the parameter testing circuit,wherein the input driver is further coupled to a scan-path testing circuit.
3 Assignments
0 Petitions
Accused Products
Abstract
In accordance with the invention, a testing circuit formed on the integrated circuit is presented. A testing circuit according to the present invention includes an input circuit coupled to a parameter testing circuit and an output driver coupled to the parameter testing circuit. Embodiments of the parameter testing circuit can include circuits for testing process, device, and circuit characteristics of the integrated circuit. Further, some embodiments of the testing circuit can be included in a scan path system where sequences of various testing circuits are included. Further, test parameters obtained from the parameter testing circuits can be utilized to adjust operating parameters of the integrated circuit.
35 Citations
63 Claims
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1. An integrated circuit, comprising:
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at least one test circuit embedded within the integrated circuit, the at least one test circuit capable of providing data regarding at least one process, device, or circuit parameter, the test circuit comprising; a parameter testing circuit designed to provide test data regarding at least one process, device, or circuit parameter, the parameter test circuit including an input driver coupled to provide at least one input signal to the parameter testing circuit; and an output driver coupled to receive a parameter signal from the parameter testing circuit, wherein the input driver is further coupled to a scan-path testing circuit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method of testing and monitoring an integrated circuit, comprising:
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placing the integrated circuit in a test controller, wherein said test controller has the capability of generating variable input signals and monitoring output signals from a test circuit; providing input signals from the test controller to an input circuit in a test circuit embedded onto the integrated circuit; monitoring output signals from the test circuit, wherein the test circuit includes an input driver that receives the input signals from the test controller, a parameter test circuit designed to provide test data regarding at least one process, device, or circuit parameter coupled to the input driver to perform a parameter test, and an output driver coupled to receive signals from the parameter test circuit and provide an output signal to the test controller, and wherein providing input signals and monitoring output signals includes interacting with a scan path testing circuit on the integrated circuit. - View Dependent Claims (13, 14, 15, 16, 17, 18)
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19. A method of monitoring an integrated circuit, comprising:
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providing input signals to an input circuit in a test circuit embedded onto the integrated circuit; monitoring output signals from the test circuit, wherein the test circuit includes an input driver that receives the input signals from a test controller, a parameter test circuit designed to provide test data regarding at least one process, device, or circuit parameter coupled to the input driver to perform a parameter test, and an output driver coupled to receive signals from the parameter test circuit and provide an output signal to the test controller; and adjusting at least one parameter in the integrated circuit based on the output signals from the test circuit. - View Dependent Claims (20, 21, 22, 23, 24, 25, 26, 27, 28)
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29. An integrated circuit, comprising:
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at least one test circuit embedded within the integrated circuit, the at least one test circuit capable of providing data regarding at least one process, device, or circuit parameter, the test circuit comprising; a delay line test circuit designed to provide test data regarding signal delay time, the delay line test circuit including an input driver coupled to provide at least one input signal to the delay line test circuit; and an output driver coupled to receive a parameter signal from the parameter testing circuit, wherein the output driver is coupled to an adjustment circuit that provides at least one adjusted parameter to the integrated circuit. - View Dependent Claims (30, 31)
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32. An integrated circuit, comprising:
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at least one test circuit embedded within the integrated circuit, the at least one test circuit capable of providing data regarding at least one process, device, or circuit parameter, the test circuit comprising; a parameter testing circuit designed to provide test data regarding at least one process, device, or circuit parameter, the parameter test circuit including an input driver coupled to provide at least one input signal to the parameter testing circuit; and an analog-to-digital converter coupled to receive a parameter signal from the parameter testing circuit, wherein the analog-to-digital converter is coupled to an adjustment circuit that provides at least one adjusted parameter to the integrated circuit. - View Dependent Claims (33, 34, 35, 36, 37, 38, 39, 40)
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41. A method of testing and monitoring an integrated circuit, comprising:
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placing the integrated circuit in a test controller, wherein said test controller has the capability of generating variable input signals and monitoring output signals from a test circuit; providing input signals from the test controller to an input circuit in a test circuit embedded onto the integrated circuit; and monitoring output signals from the test circuit, wherein the test circuit includes an input driver that receives the input signals from the test controller, a parameter test circuit designed to provide test data regarding at least one process, device, or circuit parameter coupled to the input driver to perform a parameter test, and an output driver coupled to receive signals from the parameter test circuit and provide an output signal to the test controller, and wherein providing input signals and monitoring output signals includes interacting with dedicated pins on the integrated circuit that are coupled to the input driver. - View Dependent Claims (42, 43, 44, 45, 46, 47)
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48. A method of testing and monitoring an integrated circuit, comprising:
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placing the integrated circuit in a test controller, wherein said test controller has the capability of generating variable input signals and monitoring output signals from a test circuit; providing input signals from the test controller to an input circuit in a test circuit embedded onto the integrated circuit; monitoring output signals from the test circuit; and adjusting at least one parameter in the integrated circuit based on the output signals from the test circuit, wherein the test circuit includes an input driver that receives the input signals from the test controller, a parameter test circuit designed to provide test data regarding at least one process, device, or circuit parameter coupled to the input driver to perform a parameter test, and an output driver coupled to receive signals from the parameter test circuit and provide an output signal to the test controller. - View Dependent Claims (49, 50, 51, 52, 53, 54, 55, 56)
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57. A method of testing and monitoring an integrated circuit, comprising:
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placing the integrated circuit in a test controller, wherein said test controller has the capability of generating variable input signals and monitoring output signals from a test circuit; providing input signals from the test controller to an input circuit in a test circuit embedded onto the integrated circuit; and monitoring output signals from the test circuit, wherein the test circuit includes an input driver that receives the input signals from the test controller, a parameter test circuit designed to provide test data regarding at least one process, device, or circuit parameter coupled to the input driver to perform a parameter test, and an output driver coupled to receive signals from the parameter test circuit and provide an output signal to the test controller, and wherein providing input signals and monitoring output signals includes coupling to a scan path. - View Dependent Claims (58, 59, 60, 61, 62, 63)
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Specification