Diagnostic method and system

• US 7,584,074 B2
• Filed: 06/19/2007
• Issued: 09/01/2009
• Est. Priority Date: 12/21/2004
• Status: Expired due to Fees

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Neyt, Jean-Lois, Cousin, Benoit
• Primary Examiner(s): Barbee; Manuel L
• Application Number:
  US11/764,954
• Publication Number:
  US 20070288794A1
• Time in Patent Office: 805 Days
• Field of Search: 702/58, 702/59, 702182-185, 702/188, 701/29, 701 31- 35, 706911-918
• US Class Current: 702/183
• CPC Class Codes: G05B 23/0248 Causal models, e.g. fault tree; digraphs; qualitative physics
• CPC Class Codes: G05B 23/0278 Qualitative, e.g. if-then rules; Fuzzy logic; Lookup tables; Symptomatic search; FMEA
• CPC Class Codes: G06F 11/2257 using expert systems

Abstract

A method and system comprising a diagnostic symptom tree system for diagnosing a failing system element causing a symptom in a system-under-test. A diagnostic symptom tree comprises symptom roots and dependent lower function nodes and sub-function nodes. Element nodes depend from the function or sub-function nodes, and a plurality of penultimate failure mode leaves depend from the element nodes. The function and sub-function nodes and the failure mode leaves comprise test information. Responsive to positive test results, the diagnostic symptom tree is configured to identify a function or sub-function or element node associated to a lowest symptom tree node or failure mode leaf for which a test is positive, or advise that no failing function or sub-function or element is found. In one aspect of the invention, nodes may include parameter values allowing successive selections of the nodes of the symptom tree for test iterations according to the parameter values.

Claims

1. A method for diagnosing a system-under-test, comprising:

identifying a symptom;

selecting each of a first series of function tests associated with the symptom on the system-under-test and a first parameter value;

performing each of the first series of function tests until a positive first series function test result is generated or until each of the first series of function tests is performed and generates a negative test result;

responsive to the generated positive first series function test result, selecting and performing each of a first series of dependent tests, each associated with the positive first series function test result and the first parameter value until a positive first series dependent test result is generated or until each of the first series of dependent tests is performed and generates a negative test result;

responsive to the generated positive first series dependent test result, identifying a system element associated with the generated positive first series dependent test result as a failing element and selecting and performing each of a first series of failure tests associated with the failing element and the first parameter value until a positive first series failure test result is generated or until each of the first series of failure tests is performed and generates a negative test result;

identifying a failure mode associated with the generated first series positive failure test result;

determining that no failure mode is found in response to the each of the performed first series of failure tests generating negative test results; and

in response to the each of the performed first series of function tests generating negative test results and the each of the performed first series of dependent tests generating negative test results, determining that no failing element is found and ordering a second series of function tests, a second series of dependent tests and a second series of failure tests, wherein each of the second series of function tests, the second series of dependent tests and the second series of failure tests are associated with a second parameter value;

wherein the first and the second parameter values comprise a test cost; and

wherein the selecting the each of the first series of function tests, the first series of dependent tests and the first series of failure tests comprises selecting a test having a low test cost value, and the ordering the second series of function tests, the second series of dependent tests and the second series of failure tests comprises selecting a test having a higher test cost value relative to the low test cost value.

2. The method of claim 1, further comprising:

identifying the system-under-test; and

selecting each of at least one of the first series of function tests, the first series of dependent tests and the first series of failure tests responsive to identifying the system-under-test.

3. The method of claim 1, further comprising:

collecting system-under-test variables from at least one system-under-test element;

providing an automatic test defined as a logical expression of the system-under-test variables, a system-under-test context and an associated manual-confirmation; and

wherein at least one of the performing the first series of function tests, the first series of dependent tests and the first series of failure tests further comprises;

performing an automatic test responsive to system-under-test variables values and by computing logical expressions;

if a computed logical expression is true, executing an associated manual-confirmation test;

if the associated manual-confirmation test generates a positive result, then performing a series of tests associated with the manual-confirmation test until the positive result is generated and reporting a positive test result;

or

reporting a negative test result.

4. The method of claim 1, further comprising computing a frequency count of failure findings for each test at the end of a diagnostic session;

and

computing at least one of the first and the second parameter values responsive to the frequency count.

5. A diagnostic system, comprising a computer processing means configured to:

apply logic to select each of a first series of function tests responsive to an association of each of the selected tests with an identified symptom and a first parameter value and perform each of the selected first series of function tests until a positive function test result is generated or until each is performed and generates a negative result;

responsive to a first series positive junction test result, select each of a first series of dependent tests associated with the positive function test result and the first parameter value and perform each of the selected first series of dependent tests until a positive dependent test result is generated or until each is performed and generates a negative result;

responsive to a first series positive dependent test result, identify a system element associated with the positive dependent test result as a failing element, select each of a first series of failure tests associated with the failing element and the first parameter value and perform each of the selected first series of failure tests until a positive failure test result is generated or until each is performed and generates a negative result;

identify a failure mode associated with the generated first series positive failure test result or determine that no failure mode is found in response to the each of the performed first series of failure tests generating negative test results; and

determine that no failing element is identified in response to the each of the performed first series of function and dependent tests generating negative results; and

in response to determining that no failing element is identified, order a second series of function tests, a second series of dependent tests and a second series of failure tests responsive to an association of each of the selected second series tests with a second parameter value;

wherein the first and second parameter values comprise a test cost; and

wherein the computer means is further configured to select each of the first series of function tests, the first series of dependent tests and the first series of failure tests by selecting tests having a low test cost value, and order each of the second series of function tests, the second series of dependent tests and the second series of failure tests by selecting tests having a higher test cost value relative to the low test cost value.

6. The system of claim 5, wherein the computer means further configured to select each of at least one of the first series of function tests, the first series of dependent tests and the first series of failure tests in response to identifying a system-under-test.

7. The system of claim 5, wherein the computer means is further configured to collect system-under-test variables from at least one system-under-test element;

define an automatic test as a logical expression of the system-under-test variables, a system-under-test context and an associated manual-confirmation; and

perform at least one of the first series of the function, the dependent and the failure tests by performing an automatic test responsive to system-under-test variables values and computing logical expressions;

execute an associated manual-confirmation test if a computed logical expression is true,

perform a next associated manual test if the associated manual-confirmation test generates a positive result and report a positive test result;

or

report a negative test result.

8. The system of claim 5, wherein the computer means is further configured to compute a frequency count of failure findings for each test at the end of a diagnostic session;

and

compute at least one of the first and the second parameter values responsive to the frequency count.

9. The system of claim 5, wherein at least one of the first and the second parameter values is determined by the computer means in response to a result of a previous diagnostic session.

10. A method comprising:

providing computer executable program code to be deployed to and executed on a computer system, wherein the computer executable program code is stored in a computer readable storage medium;

the program code comprising instructions which, when executed on the computer system, causes the computer to;

select each of a first series of function tests responsive to an association of each of the selected tests with an identified symptom and a first parameter value and perform each of the selected first series of function tests until a positive function test result is generated or until each is performed and generates a negative result;

responsive to a first series positive function test result, select each of a first series of dependent tests associated with the positive function test result and the first parameter value and perform each of the selected first series of dependent tests until a positive dependent test result is generated or until each is performed and generates a negative result;

responsive to a first series positive dependent test result, identify a system element associated with the positive dependent test result as a failing element, select each of a first series of failure tests associated with the failing element and the first parameter value and perform each of the selected first series of failure tests until a positive failure test result is generated or until each is performed and generates a negative result;

identify a failure mode associated with the generated first series positive failure test result or determine that no failure mode is found in response to the each of the performed first series of failure tests generating negative test results; and

determine that no failing element is identified in response to the each of the performed first series of function and dependent tests generating negative results; and

in response to determining that no failing element is identified, order a second series of function tests, a second series of dependent tests and a second series of failure tests responsive to an association of each of the selected second series tests with a second parameter value, wherein the first and second parameter values comprise a test cost;

select each of the first series of function tests, the first series of dependent tests and the first series of failure tests by selecting tests having a low test cost value; and

select each of the second series of function tests, the second series of dependent tests and the second series of failure tests by selecting tests having a higher test cost value relative to the low test cost value.

11. The method of claim 10, wherein the program code, when executed on a computer, causes the computer to select each of at least one of the first series of function tests, the first series of dependent tests and the first series of failure tests responsive to a identifying the system-under-test.

12. The method of claim 10, wherein the program, when executed on a computer, causes the computer to:

collect system-under-test variables from at least one system-under-test element;

provide an automatic test defined as a logical expression of the system-under-test variables, a system-under-test context and an associated manual-confirmation; and

perform at least one of the first series function tests, the first series dependent tests and the first series failure tests by;

performing an automatic test responsive to system-under-test variables values and by computing logical expressions;

if a computed logical expression is true, executing an associated manual-confirmation test;

if the associated manual-confirmation test generates a positive result, then the performing a series of tests associated with the manual-confirmation test until a positive result is generated and reporting a positive test result;

or

reporting a negative test result.

13. The method of claim 10, wherein the program code, when executed on a computer, causes the computer to compute a frequency count of failure findings for each test at the end of a diagnostic session;

and

compute at least one of the first and second parameter values responsive to the frequency count.

14. A method for deploying an application for diagnosing a system-under-test, comprising providing a computer infrastructure being operable to:

select each of a first series of function tests responsive to an association of each of the selected tests with an identified symptom and a first parameter value and perform each of the selected first series of function tests until a positive function test result is generated or until each is performed and generates a negative result;

responsive to a first series positive function test result, select each of a first series of dependent tests associated with the positive function test result and the first parameter value and perform each of the selected first series of dependent tests until a positive dependent test result is generated or until each is performed and generates a negative result;

responsive to a first series positive dependent test result, identity a system element associated with the positive dependent test result as a failing element, select each of a first series of failure tests associated with the failing element and the first parameter value and perform each of the selected first series of failure tests until a positive failure test result is generated or until each is performed and generates a negative result;

identify a failure mode associated with the generated first series positive failure test result or determine that no failure mode is found in response to the each of the performed first series of failure tests generating negative test results; and

determine that no failing element is identified in response to the each of the performed first series of function and dependent tests generating negative results;

in response to determining that no failing element is identified, order a second series of function tests, a second series of dependent tests and a second series of failure tests responsive to an association of each of the selected second series tests with a second parameter value, wherein the first and second parameter values comprise a test cost;

select each of the first series of function tests, the first series of dependent tests and the first series of failure tests by selecting tests having a low test cost value; and

select each of the second series of function tests, the second series of dependent tests and the second series of failure tests by selecting tests having a higher test cost value relative to the low test cost value.

15. The method of claim 14, wherein the computer infrastructure is further operable to select each of at least one of the first series of function tests, the first series of dependent tests and the first series of failure tests responsive to identifying the system-under-test.

16. The method of claim 14, wherein the computer infrastructure is further operable to collect system-under-test variables from at least one system-under-test element;

provide an automatic test defined as a logical expression of the system-under-test variables, a system-under-test context and an associated manual-confirmation; and

perform at least one of the first series of function tests, the first series of dependent tests and the first series of failure tests by;

performing an automatic test responsive to system-under-test variables values and by computing logical expressions;

if a computed logical expression is true, executing an associated manual-confirmation test;

if the associated manual-confirmation test generates a positive result, then the performing a series of tests associated the manual-confirmation test until a positive result is generated and reporting a positive test result;

or

reporting a negative test result.

17. The method of claim 14, wherein the computer infrastructure is further operable to compute a frequency count of failure findings for each test at the end of a diagnostic session;

and

compute at least one of the first and the second parameter values responsive to the frequency count.