Method and apparatus for improved signal to noise ratio in Raman signal detection for MEMS based spectrometers

• US 7,586,603 B2
• Filed: 04/17/2008
• Issued: 09/08/2009
• Est. Priority Date: 07/24/2006
• Status: Expired due to Fees

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Maity, Sandip, Goravar, Shivappa, Claydon, Glenn, Chandrasekaran, Shankar, Banerjee, Ayan, Zribi, Anis, Que, Long, Kennerly, Stacey
• Primary Examiner(s): Geisel; Kara E
• Application Number:
  US12/104,471
• Publication Number:
  US 20080204743A1
• Time in Patent Office: 509 Days
• Field of Search: 356/301
• US Class Current: 356/301
• CPC Class Codes: G01J 1/44 Electric circuits for command of an exposure part G03B7/02
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/0229 using masks, aperture plates, spatial light modulators or spatial filters, e.g. reflective filters
• CPC Class Codes: G01J 3/0232 using shutters
• CPC Class Codes: G01J 3/0256 Compact construction
• CPC Class Codes: G01J 3/0264 Electrical interface; User interface
• CPC Class Codes: G01J 3/0272 Handheld
• CPC Class Codes: G01J 3/0286 Constructional arrangements for compensating for fluctuations caused by temperature, humidity or pressure, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a spectrometer, e.g. vacuum
• CPC Class Codes: G01J 3/0297 Constructional arrangements for removing other types of optical noise or for performing calibration
• CPC Class Codes: G01J 3/1895 using fiber Bragg gratings or gratings integrated in a waveguide
• CPC Class Codes: G01J 3/4338 Frequency modulated spectrometry
• CPC Class Codes: G01J 3/44 Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
• CPC Class Codes: G02B 26/04 by periodically varying the intensity of light, e.g. using choppers shutters, diaphragms for cameras G03B9/00; devices for eliminating or reducing the effect of flicker in projection systems G03B21/40
• CPC Class Codes: H01L 31/107 the potential barrier working in avalanche mode, e.g. avalanche photodiodes

Abstract

A method of Raman detection for a portable, integrated spectrometer instrument includes directing Raman scattered photons by a sample to an avalanche photodiode (APD), the APD configured to generate an output signal responsive to the intensity of the Raman scattered photons incident thereon. The output signal of the APD is amplified and passed through a discriminator so as to reject at least one or more of amplifier noise and dark noise. A number of discrete output pulses within a set operational range of the discriminator is counted so as to determine a number of photons detected by the APD.

Claims

1. A method of Raman detection for a portable, integrated spectrometer instrument, the method comprising:

directing Raman scattered photons by a sample to an avalanche photodiode (APD), said APD configured to generate an output signal responsive to the intensity of said Raman scattered photons incident thereon;

amplifying said output signal of said APD and passing said amplified output signal through a discriminator so as to reject at least one or more of amplifier noise and dark noise;

counting a number of discrete output pulses within a set operational range of said discriminator so as to determine a number of photons detected by said APD; and

passing said output signal of said APD through a preamplifier so as to shape an output current pulse from said APD to a NIM standard pulse.

2. The method of claim 1, further comprising cooling said APD by thermoelectric cooling.

3. The method of claim 2, wherein said APD is biased in a sub-Geiger mode of operation.

4. The method of claim 1, further comprising chopping an input optical beam prior to Raman scattering.

5. The method of claim 4, wherein said chopping is implemented though frequency modulation of an acousto-optic modulator.

6. The method of claim 4, wherein said chopping is implemented though frequency modulation of a deflectable cantilever positioned within the path of said input optical beam.

7. An apparatus for Raman detection within a portable, integrated spectrometer instrument, comprising:

an avalanche photodiode (APD) integrated on a chip, said APD configured to receive Raman scattered photons by a sample and generate an output signal responsive to the intensity of said Raman scattered photons incident thereon, wherein said APD is biased in a sub-Geiger mode of operation;

an amplifier integrated on said chip, said amplifier configured to amplify said output signal of said APD and pass said amplified output signal though a discriminator integrated on said chip, so as to reject at least one or more of amplifier noise and dark noise; and

a digitizer integrated on said chip, configured to count a number of discrete output pulses within a set operational range of said discriminator so as to determine a number of photons detected by said APD.

8. The apparatus of claim 7, wherein said APD is cooled by thermoelectric cooling.

9. The apparatus of claim 7, further comprising a preamplifier integrated on said chip, said preamplifier configured to shape an output current pulse from said APD to a NIM standard pulse.

10. The apparatus of claim 7, further comprising a beam-interrupting mechanism configured to chop an input optical beam prior to Raman scattering.

11. The apparatus of claim 10, wherein said beam-interrupting mechanism comprises a frequency modulated acousto-optic modulator.

12. The apparatus of claim 10, wherein said beam-interrupting mechanism comprises a frequency modulated, deflectable cantilever positioned within the path of said input optical beam.

13. A method of Raman detection for a portable, integrated spectrometer instrument, the method comprising:

directing Raman scattered photons by a sample to an avalanche photodiode (APD), said APD configured to generate an output signal responsive to the intensity of said Raman scattered photons incident thereon;

cooling said APD by thermoelectric cooling, wherein said APD is biased in a sub-Geiger mode of operation;

amplifying said output signal of said APD and passing said amplified output signal though a discriminator so as to reject at least one or more of amplifier noise and dark noise; and

counting a number of discrete output pulses within a set operational range of said discriminator so as to determine a number of photons detected by said APD.

14. An apparatus for Raman detection within a portable, integrated spectrometer instrument, comprising:

an avalanche photodiode (APD) integrated on a chip, said APD configured to receive Raman scattered photons by a sample and generate an output signal responsive to the intensity of said Raman scattered photons incident thereon;

a preamplifier integrated on said chip, said preamplifier configured to shape an output current pulse from said APD to a NIM standard pulse;

an amplifier integrated on said chip, said amplifier configured to amplify said output signal of said APD and pass said amplified output signal though a discriminator integrated on said chip, so as to reject at least one or more of amplifier noise and dark noise; and

a digitizer integrated on said chip, configured to count a number of discrete output pulses within a set operational range of said discriminator so as to determine a number of photons detected by said APD.