Methods and systems for semiconductor diode junction screening and lifetime estimation
First Claim
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1. A method for screening semiconductor junction devices, the method comprising the steps of:
- detecting, while testing a semiconductor junction device, anomalous behavior of the semiconductor junction;
determining a rate substantially equal to a number of anomalous behavior events in a predetermined time period;
comparing the rate to a predetermined rate value; and
culling, if the rate is at least equal to the predetermined rate value, the semiconductor junction device.
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Abstract
Screening methods and systems that can detect semiconductor junction devices that may exhibit sudden failure.
18 Citations
19 Claims
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1. A method for screening semiconductor junction devices, the method comprising the steps of:
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detecting, while testing a semiconductor junction device, anomalous behavior of the semiconductor junction; determining a rate substantially equal to a number of anomalous behavior events in a predetermined time period; comparing the rate to a predetermined rate value; and culling, if the rate is at least equal to the predetermined rate value, the semiconductor junction device. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A system for screening semiconductor junction devices, the system comprising:
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a sensing component capable of providing a sensing output indicative of whether behavior of a semiconductor junction device is substantially anomalous; a comparator subsystem capable of comparing the sensing output to at least one predetermined value;
an output of said comparator subsystem indicating whether behavior of the device is substantially anomalous;a counter/rate determining component capable of receiving the output of the comparator subsystem and of providing a rate, said rate being substantially equal to a number of anomalous behavior events in a predetermined time period; another comparator subsystem capable of comparing the rate to the at least one predetermined rate value;
an output of said another comparator subsystem indicating whether to cull the semiconductor junction device from testing. - View Dependent Claims (9, 10, 11, 12)
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13. A method for predicting lifetime for a semiconductor junction device, the method comprising the steps of:
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a) operating the semiconductor junction device at an operating power lower than a predetermined power; b) detecting, while operating the semiconductor junction device, anomalous behavior of the semiconductor junction; c) determining a rate substantially equal to a number of anomalous behavior events in a predetermined time period; d) recording the rate; e) comparing the rate to a predetermined rate value; f) identifying, if the rate is at least equal to the predetermined rate value, the semiconductor junction device as a failed device; g) increasing the operating power by a predetermined increment; h) repeating, if the operating power is less than the predetermined power and if the semiconductor junction device is not identified as failed, the steps a) and f); i) obtaining, if the operating power is at least equal to the predetermined power or if the semiconductor junction device is identified as failed, a relationship between rate and operating power. - View Dependent Claims (14, 15, 16, 17, 18)
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19. A system for screening semiconductor junction devices, the system comprising:
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means for detecting, while testing a semiconductor junction device, anomalous behavior of the semiconductor junction; means for determining a rate substantially equal to a number of anomalous behavior events in a predetermined time period; means for comparing the rate to a predetermined rate value; and means for culling, if the rate is at least equal to the predetermined rate value, the semiconductor junction device.
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Specification