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Methods and systems for semiconductor diode junction screening and lifetime estimation

  • US 7,592,825 B1
  • Filed: 08/22/2006
  • Issued: 09/22/2009
  • Est. Priority Date: 08/22/2005
  • Status: Expired due to Fees
First Claim
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1. A method for screening semiconductor junction devices, the method comprising the steps of:

  • detecting, while testing a semiconductor junction device, anomalous behavior of the semiconductor junction;

    determining a rate substantially equal to a number of anomalous behavior events in a predetermined time period;

    comparing the rate to a predetermined rate value; and

    culling, if the rate is at least equal to the predetermined rate value, the semiconductor junction device.

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