Low noise sense amplifier array and method for nonvolatile memory

• US 7,593,265 B2
• Filed: 12/28/2007
• Issued: 09/22/2009
• Est. Priority Date: 12/28/2007
• Status: Active Grant

• Current Assignee: SanDisk Technologies LLC (Western Digital Corporation)
• Original Assignee: SanDisk Corporation (Western Digital Corporation)
• Inventors: Lee, Seungpil, Mui, Man Lung, Nguyen, Hao Thai
• Primary Examiner(s): Tran; Andrew Q
• Application Number:
  US11/966,325
• Publication Number:
  US 20090168540A1
• Time in Patent Office: 634 Days
• Field of Search: 365/185.12, 365/185.11, 365/185.17, 365/185.21, 365/185.22, 365/185.25, 365/185.33, 365/185.02
• US Class Current: 365/185.21
• CPC Class Codes: G11C 11/5642 Sensing or reading circuits; Data output circuits
• CPC Class Codes: G11C 16/26 Sensing or reading circuits; Data output circuits
• CPC Class Codes: G11C 7/02 with means for avoiding parasitic signals
• CPC Class Codes: G11C 7/065 Differential amplifiers of latching type
• CPC Class Codes: G11C 7/08 Control thereof
• CPC Class Codes: G11C 7/12 Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines

Abstract

In sensing a page of nonvolatile memory cells with a corresponding group of sense modules in parallel, as each high current cell is identified, it is locked out from further sensing while others in the page continued to be sensed. The sense module involved in the locked out is then in a lockout mode and becomes inactive. A noise source from the sense module becomes significant when in the lockout mode. The noise is liable to interfere with the sensing of neighboring cells by coupling through its bit line to neighboring ones. The noise can also couple through the common source line of the page to affect the accuracy of ongoing sensing of the cells in the page. Improved sense modules and method isolate the noise from the lockout sense module from affecting the other sense modules still active in sensing memory cell in the page.

Claims

1. A method of sensing a conduction current of a non-volatile memory cell among sensing a group thereof in parallel, comprising:

providing a node accessible by the memory cell via an intermediate circuit;

precharging the node to an initial voltage;

providing a voltage boosting circuit coupled to the node;

boosting the initial voltage on the node by a predetermined amount;

measuring the conduction current by a rate of voltage discharge at the node; and

whenever the conduction current is determined to be higher than a predetermined value, isolating the voltage boosting circuit from the intermediate circuit of the memory cell until at least sensing for the group of memory cells is completed.

2. A method as in claim 1, wherein:

each memory cell of the group is accessible by an associated bit line; and

the intermediate circuit is coupled to the associated bit line.

3. A method as in claim 2, wherein:

said isolating the voltage boosting circuit includes disabling a transfer gate circuit disposed between the node and the intermediate circuit.

4. A method as in claim 2, wherein:

said isolating the voltage boosting circuit includes disabling a transfer gate circuit disposed between the voltage boosting circuit and the node.

5. A method as in claim 1, wherein:

each memory cell of the group includes a source coupled to a common source line for the group; and

the intermediated circuit is coupled to the common source line.

6. A method as in claim 5, wherein:

said isolating the voltage boosting circuit includes disabling a transfer gate circuit disposed between the node and the intermediate circuit.

7. A method as in claim 5, wherein:

said isolating the voltage boosting circuit includes disabling a transfer gate circuit disposed between the voltage boosting circuit and the node.

8. A method as in claim 1, wherein:

said isolating the voltage boosting circuit includes disabling a transfer gate circuit disposed between the node and the intermediate circuit.

9. A method as in claim 8, wherein:

said disabling the transfer gate circuit includes disabling a parallel pair of N-type and P-type transistors in the transfer gate circuit.

10. A method as in claim 1, wherein:

said isolating the voltage boosting circuit includes disabling a transfer gate circuit disposed between the voltage boosting circuit and the node.

11. The method as in claim 1, wherein said sensing is a part of a program operation to verify if any of the memory cells has been programmed to a target state.

12. A sensing circuit for sensing a conduction current of a memory cell among a group of nonvolatile memory cells being sensing in parallel, comprising:

a node;

an intermediate circuit coupled between the memory cell and said node;

a precharge circuit coupled to said node for charging said node to an initial voltage;

a voltage boosting circuit coupled to the node to boost the initial voltage on the node by a predetermined amount;

a transfer gate disposed between the voltage boosting circuit and said intermediate circuit;

a comparator coupled to said node to determine the conduction current by a rate of voltage discharge at the node; and

said transfer gate turning off in response to the conduction current being determined to be higher than a predetermined value, thereby isolating the voltage boosting circuit from the intermediate circuit of the memory cell and wherein said transfer gate remains off until at least sensing for the group of memory cells is completed.

13. A sensing circuit as in claim 12, wherein:

each memory cell of the group is accessible by an associated bit line; and

said intermediate circuit is coupled to the associated bit line.

14. A sensing circuit as in claim 12, wherein:

each memory cell of the group includes a source coupled to a common source line for the group; and

said intermediated circuit is coupled to the common source line.

15. A sensing circuit as in claim 12, wherein:

said transfer gate is disposed between the voltage boosting circuit and said node.

16. A sensing circuit as in claim 12, wherein said transfer gate further comprises:

a pair of p-transistor and n-transistor each having a source a drain and a gate;

a first node formed by coupling the source of the p-transistor to the drain of the n-transistor;

a second node formed by coupling the drain of the p-transistor to the source of the n-transistor;

whereby a pair of complementary signals on the gates of the pair of p-transistor and n-transistor controls passage between the first and second nodes.

17. A sensing circuit as in claim 16, further comprising:

a supply voltage source for precharge operation;

when the transfer gate is also coupled to said supply voltage source, said p-transistor when enabled by the pair of complementary signals serves to pull up the first and second nodes to the supply voltage source during the precharge operation.

18. A sensing circuit as in claim 12, wherein:

said transfer gate is disposed between the node and the intermediate circuit.

19. A sensing circuit as in claim 12, wherein the group of nonvolatile memory cells are a portion of a flash EEPROM.

20. A sensing circuit as in claim 19, wherein the flash EEPROM is of NAND type.

21. A sensing circuit as in claim 12, wherein individual non-volatile memory cells each contain a charge storage element.

22. A sensing circuit as in claim 21, wherein the charge storage element is a floating gate.

23. A sensing circuit as in claim 21, wherein the charge storage element is a dielectric layer.

24. A sensing circuit as in claim 12, wherein the nonvolatile memory cells are embodied in a memory card.