Backscatter inspection portal

• US 7,593,506 B2
• Filed: 07/10/2008
• Issued: 09/22/2009
• Est. Priority Date: 04/09/2004
• Status: Active Grant

• Current Assignee: American Science and Engineering Incorporated (OSI Systems Incorporated)
• Original Assignee: American Science and Engineering Incorporated (OSI Systems Incorporated)
• Inventors: Cason, W. Randall
• Primary Examiner(s): Ho; Allen C.
• Application Number:
  US12/171,020
• Publication Number:
  US 20080310591A1
• Time in Patent Office: 439 Days
• Field of Search: 378/7, 378/9, 378/57, 378/86, 378/87, 378/90, 378/88, 378/89, 378/146
• US Class Current: 378/90
• CPC Class Codes: G01N 23/20 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
• CPC Class Codes: G01V 5/222 measuring scattered radiation

Abstract

A system and method for inspecting an object with multiple sources of substantially coplanar penetrating radiation. Irradiation of the inspected object by the sources is temporally sequenced such that the source of detected scattered radiation is unambiguous. Thus, multiple views of the inspected object may be obtained and image quality may be enhanced.

Claims

1. An inspection system for inspecting an object, the system comprising:

a. a first source for providing a first beam of penetrating radiation of specific cross-section directed in a first beam direction;

b. a second source for providing a second beam of penetrating radiation of specific cross-section directed in a second beam direction substantially coplanar with the first beam direction and temporally interspersed with the first beam of penetrating radiation;

c. at least one scatter detector for detecting radiation scattered from at least one of the first beam and the second beam by any scattering material within the inspected object and for generating a scattered radiation signal;

d. a controller for creating a scatter image of the scattering material based at least on the scattered radiation signal;

e. a third source for providing a third beam of penetrating radiation; and

f. a transmission detector disposed distally to the object with respect to the third source for imaging the object in transmitted x-rays to augment the scatter image.

2. The inspection system as set forth in claim 1, wherein the third source is an x-ray source.

3. The inspection systems as set forth in claim 1, wherein the third source includes a beam scanning mechanism.

4. The inspection system as set forth in claim 1, further comprising at least one transmission detector for detecting at least one of the first beam and the second beam as transmitted through the inspected object and for generating a transmitted radiation signal.

5. The inspection system as set forth in claim 1, wherein the third source is disposed above the inspected object.