Probing apparatus for illuminating an electrical device under test

• US 7,595,628 B1
• Filed: 06/04/2008
• Issued: 09/29/2009
• Est. Priority Date: 06/04/2008
• Status: Active Grant

• Current Assignee: Teledyne LeCroy, Inc. (Teledyne Technologies Incorporated)
• Original Assignee: Lecroy Corporation (Teledyne Technologies Incorporated)
• Inventors: Hertz, Michael G, Antonin, Frederic
• Primary Examiner(s): TANG, MINH NHUT
• Application Number:
  US12/132,726
• Time in Patent Office: 482 Days
• Field of Search: None
• US Class Current: 324/72.5
• CPC Class Codes: G01R 1/025 concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards G01R31/31912 takes precedence
• CPC Class Codes: G01R 1/06788 Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments end pieces terminating in a probe H01R11/18

Abstract

A probe for probing an electrical device under test is provided. The probe comprises a selectively positionable door defining a recessed compartment and a light source positioned within the recessed compartment. When the door is in a first position, the compartment is closed, and when the door is in a second position, the compartment is opened. When opened, the light source is reflected from a reflective surface of the door to illuminate a device being probed. The door may further comprise a magnifying element to allow for magnification of the area being probed by a user.

Claims

1. A probe for probing an electrical device under test, comprising:

a selectively positionable door defining a recessed compartment;

a light source positioned within the recessed compartment; and

a reflective surface on an internal surface of the door, the reflective surface being configured to focus light emitted from the light source to illuminate the electrical device under test;

whereby when the door is in a first position, the compartment is closed, and when the door is in a second position, the compartment is opened and light from the light source illuminates the electrical device under test.

2. The probe of claim 1, wherein the reflected light source illuminates an area about the tip of the probe.

3. The probe of claim 1, wherein the light source is activated upon the positioning of the door in the second position.

4. The probe of claim 1, wherein the light source is an LED.

5. The probe of claim 4, wherein a color of the LED indicates a state of the probe.

6. The probe of claim 5, wherein at least one LED color indicates electrical contact with a device under test.

7. The probe of claim 1, further comprising:

a magnifying element positioned within the door.

8. The probe of claim 7, wherein when the door is in the second position, light from the probe is magnified for a probe operator.