Substrate detecting apparatus and method, substrate transporting apparatus and method, and substrate processing apparatus and method

• US 7,596,425 B2
• Filed: 06/02/2004
• Issued: 09/29/2009
• Est. Priority Date: 06/13/2003
• Status: Active Grant

• Current Assignee: SCREEN Holdings Co., Ltd.
• Original Assignee: SCREEN Holdings Co., Ltd.
• Inventors: Asa, Fuminori
• Primary Examiner(s): Mackey; Patrick
• Assistant Examiner(s): Butler; Michael E.
• Application Number:
  US10/860,267
• Publication Number:
  US 20040261550A1
• Time in Patent Office: 1,945 Days
• Field of Search: 700/228, 700/213, 738/659
• US Class Current: 700/213
• CPC Class Codes: H01L 21/67259 Position monitoring, e.g. misposition detection or presence detection
• CPC Class Codes: H01L 21/681 using optical controlling means

Abstract

A substrate is supported by planes of four substrate supporters arranged on the top surface of a transport arm. Three ultrasonic distance measuring sensors are fixed on a fixing base arranged above the substrate. The three ultrasonic distance measuring sensors are arranged to measure the distances to the top surface of the substrate in the vicinity of its periphery. In this case, the ultrasonic distance measuring sensors are positioned so that measurement values of the ultrasonic distance measuring sensors may become equal to each other with the substrate being normally supported. The ultrasonic distance measuring sensors each measure the distances to the top surface of the substrate to supply the measurement values to a controller.

Claims

1. A substrate detecting apparatus for detecting an inclined state of a substrate with respect to a horizontal plane, comprising:

a supporting device that supports a substrate; and

a detector that detects said inclined state of the substrate by measuring a distance to the surface of the substrate supported by said supporting device,

said detector including;

a distance measuring sensor that measures as reference values distances to at least three measurement points on the surface of the substrate substantially horizontally supported by said supporting device, and subsequently measures as measurement value distances to said at least three measurement points on the surface of the substrate supported by said supporting device; and

a determiner that calculates differences between the reference values obtained from said distance measuring sensor and the measurement values obtained from said distance measuring sensor respectively and determines the inclined state of the substrate based on said differences for said at least three measurement points

wherein said detector detects an angle of inclination of the substrate as the inclined state of the substrate supported by said supporting device;

further comprising a second determiner that determines that the inclined state of the substrate is abnormal when the angle detected by said detector is not less than a predetermined value.

2. The substrate detecting apparatus according to claim 1, wherein said detector includes an ultrasonic distance measuring sensor.

3. The substrate detecting apparatus according to claim 1, wherein said detector includes a laser distance measuring sensor.

4. The substrate detecting apparatus according to claim 1, wherein said detector includes a microwave distance measuring sensor.

5. The substrate detecting apparatus according to claim 1, wherein said detector includes three or more distance measuring sensors that measure the distances to the surface of the substrate supported by said supporting device.

6. The substrate detecting apparatus according to claim 1, wherein said detector includes:

a distance measuring sensor that measures the distance to the surface of the substrate supported by said supporting device; and

a moving device that moves said distance measuring sensor relative to the substrate supported by said supporting device.

7. The substrate detecting apparatus according to claim 1, wherein said detector detects the presence/absence of an inclination of the substrate as the inclined state of the substrate supported by said supporting device.

8. The substrate detecting apparatus according to claim 1, wherein said detector detects a direction of inclination of the substrate as the inclined state of the substrate supported by said supporting device.

9. The substrate detecting apparatus according to claim 1, further comprising a correction mechanism that corrects a state of the substrate supported by said supporting device based on the inclined state of the substrate detected by said detector.

10. The substrate detecting apparatus according to claim 9, wherein said correction mechanism includes:

an abutting member; and

a controller that corrects the inclined state of the substrate supported by said supporting device by allowing the substrate supported by said supporting device to abut said abutting member.