Emulation of extended input/output measurement block facilities
First Claim
Patent Images
1. A method for obtaining a block of I/O measurement data, the method comprising:
- emulating the execution of a modify subchannel instruction, in the emulated execution storing a measurement block address for a subchannel of a channel subsystem, the measurement block address directly specifying a location in memory of a measurement block assigned to the subchannel;
obtaining measurement data, the measurement data related to the performance of an I/O operation of the subchannel, the measurement data comprising device busy time, wherein device busy time is the sum of time intervals when a subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel;
storing the obtained measurement data comprising the device busy time in the measurement block specified by the measurement block address, the measurement block comprising a device busy time field.
0 Assignments
0 Petitions
Accused Products
Abstract
An Extended Input/output (I/O) measurement block facility is emulated. The facility provides for the collection of relevant I/O measurement data, and the storing for later efficient retrieval of that data in an extended measurement block. The stored data relates to the performance of an I/O subchannel.
112 Citations
20 Claims
-
1. A method for obtaining a block of I/O measurement data, the method comprising:
-
emulating the execution of a modify subchannel instruction, in the emulated execution storing a measurement block address for a subchannel of a channel subsystem, the measurement block address directly specifying a location in memory of a measurement block assigned to the subchannel; obtaining measurement data, the measurement data related to the performance of an I/O operation of the subchannel, the measurement data comprising device busy time, wherein device busy time is the sum of time intervals when a subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel; storing the obtained measurement data comprising the device busy time in the measurement block specified by the measurement block address, the measurement block comprising a device busy time field. - View Dependent Claims (2, 3, 4)
-
-
5. A computer program product for obtaining a bloc of I/O measurement data, the computer program product comprising:
-
a storage medium readable by a processing circuit and storing instructions for execution by the processing circuit for performing a method comprising; emulating the execution of a modify subchannel instruction, in the emulated execution storing a measurement block address for a subchannel of a channel subsystem, the measurement block address directly specifying a location in memory of a measurement block assigned to the subchannel; obtaining measurement data the measurement data related to the performance of an I/O operation of the subchannel, the measurement data comprising device busy time, wherein device busy time is the sum of time intervals when a subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel; storing the obtained measurement data comprising the device busy time in the measurement block specified by the measurement block address, the measurement block comprising a device busy time field. - View Dependent Claims (6, 7, 8, 9, 10, 11, 12)
-
-
13. A system for obtaining a block of I/O measurement data, the system comprising:
-
a memory; a computer system in communication with the memory, the computer system comprising an instruction fetching unit for fetching instructions from memory and one or more execution units for executing fetched instructions; wherein the computer system includes instructions to execute a method comprising; emulating the execution of a modify subchannel instruction, the emulated execution storing a measurement block address for a subchannel of a channel subsystem, the measurement block address directly specifying a location in memory of a measurement block assigned to the subchannel; obtaining measurement data the measurement data related to the performance of an I/O operation of the subchannel, the measurement data comprising device busy time, wherein device busy time is the sum of time intervals when a subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel; storing the obtained measurement data comprising the device busy time in the measurement block specified by the measurement block address, the measurement block comprising a device busy time field. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20)
-
Specification