System, method, and device including built-in self tests for communication bus device

• US 7,600,156 B2
• Filed: 12/19/2006
• Issued: 10/06/2009
• Est. Priority Date: 12/19/2006
• Status: Active Grant

• Current Assignee: Dell Products LP (Dell Technologies Inc.)
• Original Assignee: Dell Products LP (Dell Technologies Inc.)
• Inventors: Chaiken, Craig, O'Rourke, Andrew, Makhija, Vinod, Thornley, Bryan J.
• Primary Examiner(s): Iqbal; Nadeem
• Application Number:
  US11/612,823
• Publication Number:
  US 20080148101A1
• Time in Patent Office: 1,022 Days
• Field of Search: 714 18- 20, 714/27, 714/30, 714/37, 714/39, 714/43, 714/45, 714/46, 714/56
• US Class Current: 714/43
• CPC Class Codes: G06F 11/27 Built-in tests

Abstract

A method, device, and system including built-in self tests for a communication bus device is disclosed. In one form, a method of testing a device operable to be coupled to a communication port an information handling system includes accessing a configuration descriptor of a first device operable to be coupled to a communication bus of an information handling system. The method can also include detecting a self-test descriptor associated with the configuration descriptor and testing a portion of the first device using test information associated with the self-test descriptor. The device and system can include logic to perform the methods described herein.

Claims

1. A method of testing an electronic device, the method comprising:

accessing a configuration descriptor of a first device operable to be coupled to a communication bus of an information handling system;

detecting a self-test descriptor associated with the configuration descriptor;

testing a portion of the first device using test information associated with the self-test descriptor;

scanning a communication bus of the information handling system;

detecting the first device is coupled to the communication bus during the scanning;

sending a request to read the configuration descriptor;

parsing the self-test descriptor and the configuration descriptor; and

enabling a test mode after parsing the self-test descriptor and the configuration descriptor.

2. The method of claim 1, further comprising:

reading the test information from the configuration descriptor;

determining a test identifier within the test information; and

enabling a test mode to test the portion of the first device using the test identifier.

3. The method of claim 2, further comprising:

determining a time-out value associated with the test identifier; and

outputting an error message in response to exceeding a time-out value.

4. The method of claim 1, further comprising:

receiving a request to enable a test mode;

enabling the test mode;

determining when the testing a portion of the first device is complete; and

disabling the test mode.

5. The method of claim 1, further comprising:

reading the test information;

generating a test list based on reading the test information; and

using the test information within the test list to initiate the testing.

6. The method of claim 1, further comprising:

executing a system diagnostic process using the information handling system;

initiating the scanning of the communication bus scan using the system diagnostic process;

detecting the first device;

detecting a second device;

testing the first device using the test information;

testing the second device using a system diagnostic test; and

testing the first device using the system diagnostic test.

7. The method of claim 1, further comprising:

testing the first device using a first test identifier associated with a first test;

determining if the first device passed the first test;

determining a second test identifier associated with a second test;

testing the first device using the second test identifier; and

determining if the first device passed the second test.

8. The method of claim 1, further comprising:

determining when a test is not available for testing the first device;

disabling a test mode; and

enabling operating system commands in association with the first device.

9. A method of testing an electronic device, the method comprising:

accessing a configuration descriptor of a first device operable to be coupled to a communication bus of an information handling system;

detecting a self-test descriptor associated with the configuration descriptor;

testing a portion of the first device using test information associated with the self-test descriptor;

testing the first device using a first test identifier associated with a first test;

determining if the first device passed the first test;

determining a second test identifier associated with a second test;

testing the first device using the second test identifier; and

determining if the first device passed the second test.

10. The method of claim 9, further comprising:

reading the test information from the configuration descriptor;

determining a test identifier within the test information; and

enabling a test mode to test the portion of the first device using the test identifier.

11. The method of claim 10, further comprising:

determining a time-out value associated with the test identifier; and

outputting an error message in response to exceeding a time-out value.

12. The method of claim 9, further comprising:

receiving a request to enable a test mode;

enabling the test mode;

determining when the testing a portion of the first device is complete; and

disabling the test mode.

13. The method of claim 9, further comprising:

scanning a communication bus of the information handling system;

detecting the first device is coupled to the communication bus during the scanning;

sending a request to read the configuration descriptor;

parsing the self-test descriptor and the configuration descriptor; and

enabling a test mode after parsing the self-test descriptor and the configuration descriptor.

14. The method of claim 9, further comprising:

determining when a test is not available for testing the first device;

disabling a test mode; and

enabling operating system commands in association with the first device.

15. A method of testing an electronic device, the method comprising:

accessing a configuration descriptor of a first device operable to be coupled to a communication bus of an information handling system;

detecting a self-test descriptor associated with the configuration descriptor;

testing a portion of the first device using test information associated with the self-test descriptor;

scanning a communication bus of the information handling system;

detecting the first device is coupled to the communication bus during the scanning;

sending a request to read the configuration descriptor;

parsing the self-test descriptor and the configuration descriptor;

enabling a test mode after parsing the self-test descriptor and the configuration descriptor;

reading the test information from the configuration descriptor;

determining a test identifier within the test information; and

enabling the test mode to test the portion of the first device using the test identifier.

16. The method of claim 15, further comprising:

determining a time-out value associated with the test identifier; and

outputting an error message in response to exceeding a time-out value.

17. The method of claim 15, further comprising:

receiving a request to enable a test mode;

enabling the test mode;

determining when the testing a portion of the first device is complete; and

disabling the test mode.

18. The method of claim 15, further comprising:

scanning a communication bus of the information handling system;

detecting the first device is coupled to the communication bus during the scanning;

sending a request to read the configuration descriptor;

parsing the self-test descriptor and the configuration descriptor; and

enabling a test mode after parsing the self-test descriptor and the configuration descriptor.

19. The method of claim 15, further comprising:

testing the first device using a first test identifier associated with a first test;

determining if the first device passed the first test;

determining a second test identifier associated with a second test;

testing the first device using the second test identifier; and

determining if the first device passed the second test.

20. The method of claim 15, further comprising:

determining when a test is not available for testing the first device;

disabling a test mode; and

enabling operating system commands in association with the first device.