System for clearance measurement and method of operating the same
First Claim
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1. A clearance sensing system comprising:
- a probe separated from a test object by a variable distance d;
an alternating current (AC) source for supplying a current through the probe, wherein the AC source and the probe are configured to generate and sustain a controlled plasma channel between a tip of the probe and the test object; and
a processing unit for measuring a voltage difference between the tip of the probe and the test object and computing the variable distance d from the voltage difference.
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Abstract
A clearance sensing system is disclosed. The system includes a probe separated from a test object by a variable distance d. The system also includes an alternating current (AC) source for supplying a current through the probe, wherein the AC source and the probe are configured to generate a controlled plasma channel between a tip of the probe and the test object. The system further includes a processing unit configured to determine the variable distance d based on a voltage difference between the tip of the probe and the test object.
41 Citations
18 Claims
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1. A clearance sensing system comprising:
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a probe separated from a test object by a variable distance d; an alternating current (AC) source for supplying a current through the probe, wherein the AC source and the probe are configured to generate and sustain a controlled plasma channel between a tip of the probe and the test object; and a processing unit for measuring a voltage difference between the tip of the probe and the test object and computing the variable distance d from the voltage difference. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. A method for measuring a distance to an electrically conductive rotating object, the method comprising:
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disposing a probe a variable distance d from the electrically conductive rotating object; initiating and stabilizing a plasma discharge between a tip of the probe and the electrically conductive rotating object; measuring at least one of a voltage drop between the tip of the probe and the test object, a current through a plasma formed between the tip of the probe and the electrically conductive rotating object, and an impedance of the probe; and computing the variable distance d to the electrically conductive rotating object based upon at least one of the voltage drop between the tip of the probe and the test object, the current and the impedance. - View Dependent Claims (16, 17, 18)
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Specification