High performance stress-enhance MOSFET and method of manufacture
First Claim
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1. A method of manufacturing a semiconductor structure:
- forming, simultaneously, a layered structure with an underlying stress inducing material, in a p-type field-effect-transistor (PFET) channel region and a n-type field-effect-transistor (NFET) channel region;
protecting the NFET channel region while forming a layer over the underlying stress inducing material of the PFET channel region; and
etching an island in the NFET channel region and the PFET channel region, creating a higher resultant stress component in the NFET channel region; and
forming a stress inducing material in the etched portions of the PFET channel region creating an opposite stress component in the PFET channel region than in the NFET channel region.
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Abstract
The invention relates to a semiconductor structure and method of manufacturing and more particularly to a CMOS device with a stress inducing material embedded in both gates and also in the source/drain region of the PFET and varying thickness of the PFET and NFET channel. In one embodiment, the structure enhances the device performance by varying the thickness of the top Silicon layer respective to the NFET or the PFET.
123 Citations
10 Claims
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1. A method of manufacturing a semiconductor structure:
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forming, simultaneously, a layered structure with an underlying stress inducing material, in a p-type field-effect-transistor (PFET) channel region and a n-type field-effect-transistor (NFET) channel region; protecting the NFET channel region while forming a layer over the underlying stress inducing material of the PFET channel region; and etching an island in the NFET channel region and the PFET channel region, creating a higher resultant stress component in the NFET channel region; and forming a stress inducing material in the etched portions of the PFET channel region creating an opposite stress component in the PFET channel region than in the NFET channel region. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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