X-ray backscatter system for imaging at shallow depths

• US 7,620,150 B1
• Filed: 01/30/2008
• Issued: 11/17/2009
• Est. Priority Date: 01/30/2007
• Status: Active Grant

• Current Assignee: Martin Annis Patent Trust - 2009
• Original Assignee: Martin Annis Patent Trust - 2009
• Inventors: Annis, Martin
• Primary Examiner(s): KAO, CHIH CHENG G
• Application Number:
  US12/022,751
• Time in Patent Office: 657 Days
• Field of Search: 378/86, 378/87, 378/88, 378/89
• US Class Current: 378/87
• CPC Class Codes: A61B 5/441 Skin evaluation, e.g. for skin disorder diagnosis
• CPC Class Codes: A61B 6/483 involving scattered radiation
• CPC Class Codes: A61B 6/502 for diagnosis of breast, i.e. mammography
• CPC Class Codes: G01T 1/163 Whole body counters hand or feet contamination measurement G01T1/167; lung, brain, thyroid, kidney or the like counting G01T1/16
• CPC Class Codes: G01T 1/203 the detector being made of plastics

Abstract

The apparatus has an x-ray source that emits an x-ray cone beam through a tubular, x-ray-blocking guide to a planar template with a small pinhole to produce a pencil beam. The template is movable so the pencil beam can scan the target region to be imaged. Between the template and target region is an x-ray detector assembly with a plastic scintillator. The scintillator has an opening about the same size and shape as the target region that allows the pencil beam to pass to the target region. Photo-multiplier detectors receive the light generated by the backscattered x-rays in the scintillator. The method of the present invention employs the apparatus. Multiple x-rays source locations permit the generation of 3D images.

Claims

1. An apparatus for x-ray imaging of a target region of an object at shallow depths comprising:

(a) an x-ray source generating a cone beam at least one peak voltage in the range of from approximately 10 keV to approximately 500 keV;

(b) a planar template receiving said cone beam, said template in the range of from approximately 2.5 cm to approximately 30 cm from said source, said template having a pinhole with a width and an area in the range of from approximately 0.01 mm² to approximately 4 mm², said template passing only said x-rays impinging on said pinhole as a pencil beam;

(c) means for moving said template in the plane of said template in increments of approximately one half of said pinhole width so as to scan said target region with a spatial resolution of one half of said pinhole width; and

(d) a detector having a scintillator with a thickness in the range of from approximately 0.5 mm to approximately 3 cm, said scintillator having an opening through which said pencil beam passes to said target region, said scintillator being adapted to be located adjacent to said target region;

(e) whereby, as said pencil beam scans said target region, backscatter x-rays from said target region are received by said scintillator, which are used to form images of said target region.

2. The apparatus of claim 1 wherein said scintillator is fixed relative to said x-ray source and said opening is approximately the size of said target region.

3. The apparatus of claim 1 wherein said scintillator is fixed relative to said template such that said scintillator moves with said template, and said scintillator opening is slightly larger than said pinhole.

4. The apparatus of claim 1 further comprising a guide between said source and said template.

5. The apparatus of claim 1 wherein said means for moving said template include stepping or servo motors.

6. The method of claim 1 wherein said x-ray source emits x-rays at multiple peak voltages and said images are compared to derive information about the atomic or molecular composition or density of the material in said target region.

7. A method for x-ray imaging a target region of an object at shallow depths comprising the steps of:

(a) providing, in the following order, an x-ray source, a planar template having a pinhole having an area in the range of from approximately 0.01 mm² to approximately 4 mm², and a detector assembly with a scintillator parallel to said template and having a thickness in the range of from approximately 0.5 mm to approximately 3 cm, said scintillator being adapted to be located adjacent to said target region;

(b) said x-ray source emitting an x-ray cone beam to said template at least one peak voltage in the range of from approximately 10 keV to approximately 500 keV,

(c) said template blocking said x-ray cone beam except at said pinhole, said pinhole passing said x-ray cone beam as a pencil beam;

(d) said pencil beam passing through an opening in said scintillator and impinging on said target region;

(e) moving said template in the plane of said template such that said pencil beam scans said target region;

(f) said scintillator receiving backscatter x-rays from said target region; and

(g) forming images of said target region from said backscatter x-rays.

8. The method of claim 7 wherein a guide between said source and said template is provided.

9. The method of claim 7 wherein said scintillator is fixed relative to said x-ray source and said opening is approximately the size of said target region.

10. The method of claim 7 wherein said scintillator is fixed relative to said template such that said scintillator moves with said template, and said scintillator opening is slightly larger than said pinhole.

11. The method of claim 7 wherein said x-ray source emits x-rays at multiple peak voltages and said images are compared to derive information about the atomic or molecular composition or density of the material in said target region.

12. A method for x-ray imaging a target region of an object at shallow depths comprising the steps of:

(a) providing, in the following order, at least three x-ray sources at different locations, a planar template having a pinhole having an area in the range of from approximately 0.01 mm² to approximately 4 mm², and a detector assembly with a scintillator parallel to said template and having a thickness in the range of from approximately 0.5 mm to approximately 3 cm, said scintillator being adapted to be located adjacent to said target region;

(b) each of said x-ray sources emitting x-ray cone beams successively to said template at least one peak voltage in the range of from approximately 10 keV to approximately 500 keV;

(c) said template blocking each of said x-ray cone beams except at said pinhole, said pinhole passing each of said x-ray cone beams as a pencil beam;

(d) each of said pencil beams passing through an opening in said scintillator sheet and impinging on said target region;

(e) moving said template in the plane of said template such that each of said pencil beams scans said target region;

(f) said scintillator receiving backscatter x-rays from said target region; and

(g) forming images of said target region from said backscatter x-rays from said x-ray sources.

13. The method of claim 12 wherein said opening is approximately the same size as said target region.

14. The method of claim 12 wherein said scintillator is fixed relative to said template such that said scintillator moves with said template, and said scintillator opening is slightly larger than said pinhole.

15. The method of claim 12 wherein said x-ray sources are located along a line.

16. The method of claim 12 wherein said x-ray sources are located along a line parallel to said template.

17. The method of claim 12 wherein said x-ray sources are located in a plane parallel to said template.

18. The method of claim 12 wherein the images are combined to produce a three-dimensional digital tomography image of the volume of said target region.

19. The method of claim 12 wherein said x-ray sources emit x-rays at multiple peak voltages and said images are compared to derive information about the atomic or molecular composition or density of the material in said target region.