Non-contact reflectometry system and method
First Claim
Patent Images
1. A non-contact reflectometry system for testing a signal path comprising:
- a) an injection probe comprising a first conductive body shaped to create electrical capacitance between the first conductive body and the signal path when placed in near proximity to the signal path and configured to inject a test signal into the signal path via capacitive coupling to the signal path when placed in near proximity to a first point on the signal path;
b) an extraction probe comprising a second conductive body shaped to create electrical capacitance between the second conductive body and the signal path when placed in near proximity to the signal path and configured to extract a response signal from the signal path via capacitive coupling to the signal path when placed in near proximity to a second point on the signal path; and
c) a reflectometry instrument operatively coupled to the injection probe and to the extraction probe and configured to generate the test signal, accept the response signal, and determine a signal path characteristic from the response signal.
4 Assignments
0 Petitions
Accused Products
Abstract
Non-contact reflectometry for testing a signal path is described. The technique includes using capacitive coupling to inject a test signal into the signal path and extract a response signal from the signal path. Reflectometry techniques are used to determine characteristics of the signal path from the response signal. The technique is compatible with performing testing of a signal path carrying an operational signal.
44 Citations
20 Claims
-
1. A non-contact reflectometry system for testing a signal path comprising:
-
a) an injection probe comprising a first conductive body shaped to create electrical capacitance between the first conductive body and the signal path when placed in near proximity to the signal path and configured to inject a test signal into the signal path via capacitive coupling to the signal path when placed in near proximity to a first point on the signal path; b) an extraction probe comprising a second conductive body shaped to create electrical capacitance between the second conductive body and the signal path when placed in near proximity to the signal path and configured to extract a response signal from the signal path via capacitive coupling to the signal path when placed in near proximity to a second point on the signal path; and c) a reflectometry instrument operatively coupled to the injection probe and to the extraction probe and configured to generate the test signal, accept the response signal, and determine a signal path characteristic from the response signal. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
-
-
13. A method of non-contact reflectometry testing of a signal path comprising:
-
a) generating a test signal; b) capacitively coupling to the signal path by placing a first conductive body in near proximity to the signal path to create capacitive between the first conductive body and the signal path to inject the test signal into the signal path at a first point; c) capacitively coupling to the signal path by placing a second conductive body in near proximity to the signal path to create capacitive between the second conductive body and the signal path to extract a response signal from the signal path at a second point; and d) determining a characteristic of the signal path from the response signal using reflectometry techniques. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20)
-
Specification