Accessing semiconductor memory device according to an address and additional access information

• US 7,623,406 B2
• Filed: 02/12/2007
• Issued: 11/24/2009
• Est. Priority Date: 02/13/2006
• Status: Expired due to Fees

• Current Assignee: Samsung Electronics Co. Ltd.
• Original Assignee: Samsung Electronics Co. Ltd.
• Inventors: Jung, Gun-Ok, Park, Gi-Ho
• Primary Examiner(s): Ho; Hoai V
• Assistant Examiner(s): Graham; Kretelia
• Application Number:
  US11/705,485
• Publication Number:
  US 20070195598A1
• Time in Patent Office: 1,016 Days
• Field of Search: 365/230.06, 365/189.09, 365/207, 365/191
• US Class Current: 365/230.06
• CPC Class Codes: G11C 11/413 Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
• CPC Class Codes: G11C 16/08 Address circuits; Decoders; Word-line control circuits
• CPC Class Codes: G11C 8/10 Decoders

Abstract

A semiconductor memory device includes a memory cell array, a decoder, and an access control unit. The decoder generates a word line voltage according to an address for a plurality of memory cells in the memory cell array. The access control unit controls access to the plurality of memory cells according to the word line voltage and additional access information separate from the address.

Claims

1. A semiconductor memory device comprising:

a memory cell array;

a decoder for generating a word line voltage according to an address for a plurality of memory cells in the memory cell array;

an access control unit that controls access to the plurality of memory cells according to the word line voltage and additional access information separate from said address, wherein the access control unit includes;

an access information storage unit for storing said additional access information; and

a logic unit performing logical operation on the word line voltage and the access information to generate a control signal; and

a sense amplifier, wherein the control signal is used as a sense amplifier enable signal that controls coupling of bit-lines of the plurality of memory cells to the sense amplifier.

2. The semiconductor memory device of claim 1, wherein the access information storage unit is an SRAM cell storing 1-bit data.

3. The semiconductor memory device of claim 1, wherein the logic unit performs logical operation on the word line voltage, the access information, and a write signal.

4. The semiconductor memory device of claim 3, wherein the logic unit includes:

an OR-gate inputting the access information and the write signal; and

an AND-gate inputting an output of the OR-gate and the word line voltage, wherein an output of the AND-gate is the control signal that determines whether the plurality of memory cells are accessed for a write operation.

5. The semiconductor memory device of claim 4, wherein the output of the OR-gate causes the plurality of the memory cells to be accessed for the write operation.

6. The semiconductor memory device of claim 1, further comprising:

a plurality of access control units;

wherein the decoder generates a respective word line voltage for each row in the memory cell array according to the address,

and wherein each of the access control units controls access to a respective row of memory cells according to the respective word line voltage and a respective additional access information for the respective row.

7. A method of accessing a semiconductor memory device, comprising:

generating a word line voltage for a plurality of memory cells in a memory cell array of the semiconductor memory device according to an address;

controlling access to the plurality of memory cells according to the word line voltage and additional access information separate from said address;

storing said additional access information in said semiconductor memory device;

performing logical operation on the word line voltage and the access information to generate a control signal; and

using the control signal as a sense amplifier enable signal that controls coupling of bit-lines of the plurality of memory cells to a sense amplifier of the semiconductor memory device.

8. The method of claim 7, wherein the access information storage unit is an SRAM cell storing 1-bit data.

9. The method of claim 7, further comprising:

performing logical operation on the word line voltage, the access information, and a write signal to generate the control signal.

10. The method of claim 9, further comprising:

applying the access information and the write signal to inputs of an OR-gate; and

applying an output of the OR-gate and the word line voltage to inputs of an AND-gate, wherein an output of the AND-gate generates the control signal that determines whether the plurality of memory cells are accessed for a write operation.

11. The method of claim 10, wherein the output of the OR-gate causes the plurality of the memory cells to be accessed for the write operation.

12. The method of claim 7, further comprising:

generating a respective word line voltage for each row in the memory cell array according to the address; and

controlling access to each row of the memory cell array according to the respective word line voltage and a respective additional access information for each row.

13. A semiconductor memory device comprising:

a memory cell array;

a decoder for generating a word line voltage according to an address for a plurality of memory cells in the memory cell array;

an access control unit that controls access to the plurality of memory cells according to the word line voltage and additional access information separate from said address,

wherein the semiconductor memory device is a branch target buffer, and wherein the additional access information is generated by a branch target predictor;

wherein the access control unit includes;

an access information storage unit for storing said additional access information; and

a logic unit performing logical operation on the word line voltage and the access information to generate a control signal; and

a sense amplifier, wherein the control signal is used as a sense amplifier enable signal that controls coupling of bit-lines of the plurality of memory cells to the sense amplifier.

14. A method of accessing a semiconductor memory device, comprising:

generating a word line voltage for a plurality of memory cells in a memory cell array of the semiconductor memory device according to an address;

controlling access to the plurality of memory cells according to the word line voltage and additional access information separate from said address;

wherein the semiconductor memory device is a branch target buffer, and wherein the additional access information is generated by a branch target predictor;

storing said additional access information in said semiconductor memory device;

performing logical operation on the word line voltage and the access information to generate a control signal; and

using the control signal as a sense amplifier enable signal that controls coupling of bit-lines of the plurality of memory cells to a sense amplifier of the semiconductor memory device.