Apparatus and method for holding a rotatable eddy-current magnetic probe, and for rotating the probe around a boundary

• US 7,626,383 B1
• Filed: 11/27/2007
• Issued: 12/01/2009
• Est. Priority Date: 04/25/2005
• Status: Active Grant

• Current Assignee: Innovative Materials Testing Technologies, Inc.
• Original Assignee: Innovative Materials Testing Technologies, Inc.
• Inventors: Sun, Yushi, Ouyang, Tianhe
• Primary Examiner(s): Patidar; Jay M
• Application Number:
  US11/946,009
• Publication Number:
  US 20090302835A1
• Time in Patent Office: 735 Days
• Field of Search: 324217-243
• US Class Current: 324/240
• CPC Class Codes: G01N 27/82 for investigating the presence of flaws

Abstract

An RFEC excitation unit and sensor apparatus and method that facilitate detection of cracks or other anomalies within or under a surface and immediately next to an expected structure (such as a rivet) that would otherwise cause a signal change preventing detection of the cracks. In some embodiments, the apparatus includes actuators and control that move the apparatus and analyze sensed RFEC signals to determine the location of the rivet, and then to rotate (mechanically or electronically) the sensed signal and/or excitation signal to maintain a constant relationship to the edge of the rivet in order that signals from the rivet edge are suppressed and signals from the cracks are detected. In some embodiments, the excitation unit is maintained at the center of the rivet surface, and the sensor is moved around the rivet in a circle centered on the rivet.

Claims

1. An apparatus for examining an object having a first surface, wherein the object includes a structure that penetrates the first surface, and wherein the structure includes a circular boundary, the apparatus comprising:

a rotatable magnetic-eddy-current probe that includes an excitation unit that generates an alternating magnetic excitation signal, wherein the rotatable probe has an axis of rotation, wherein the probe, when placed adjacent the first surface of the object, is configured to detect interaction of the alternating magnetic excitation signal with the object, and

wherein the apparatus is configured to constrain side-to-side movement of the axis of rotation while the probe is rotated around the axis of rotation such that at least a portion of the probe moves along the first surface of the object substantially concentric to the circular boundary of the structure,

wherein the structure includes a fastener that has a head,

wherein the head of the fastener includes a dimple aligned with the center axis of the fastener, and

wherein the probe includes a sharp protrusion that has a size and shape to fit into the dimple in the fastener to provide a pivot point and constrain side-to-side movement of the axis of rotation while the probe is rotated.

2. An apparatus for examining an object having a first surface, wherein the object includes a structure that penetrates the first surface, and wherein the structure includes a circular boundary, the apparatus comprising:

a rotatable magnetic-eddy-current probe that includes an excitation unit that generates an alternating magnetic excitation signal, wherein the rotatable probe has an axis of rotation, wherein the probe, when placed adjacent the first surface of the object, is configured to detect interaction of the alternating magnetic excitation signal with the object, and

wherein the apparatus is configured to constrain side-to-side movement of the axis of rotation while the probe is rotated around the axis of rotation such that at least a portion of the probe moves along the first surface of the object substantially concentric to the circular boundary of the structure,

wherein the structure includes a fastener that has a raised head, and

wherein the probe includes an indentation that has a size and shape to fit on the raised head of the fastener, wherein the indentation is configured to constrain side-to-side movement of the axis of rotation while the probe is rotated.

3. An apparatus for examining an object having a first surface, wherein the object includes a structure that penetrates the first surface, and wherein the structure includes a circular boundary, the apparatus comprising:

a rotatable magnetic-eddy-current probe that includes an excitation unit that generates an alternating magnetic excitation signal, wherein the rotatable probe has an axis of rotation, wherein the probe, when placed adjacent the first surface of the object, is configured to detect interaction of the alternating magnetic excitation signal with the object, and

wherein the apparatus is configured to constrain side-to-side movement of the axis of rotation while the probe is rotated around the axis of rotation such that at least a portion of the probe moves along the first surface of the object substantially concentric to the circular boundary of the structure,

wherein the structure includes a fastener that has a raised head, and

wherein the probe includes a bottom surface that surrounds an indentation, wherein a circular edge between the indentation and the bottom surface is operatively configured to fit around the raised head of the fastener with sufficient snugness to constrain side-to-side movement of the axis of rotation while the probe is rotated.

4. An apparatus for examining an object having a first surface, wherein the object includes a structure that penetrates the first surface, and wherein the structure includes a circular boundary, the apparatus comprising:

a rotatable magnetic-eddy-current probe that includes an excitation unit that generates an alternating magnetic excitation signal, wherein the rotatable probe has an axis of rotation, wherein the probe, when placed adjacent the first surface of the object, is configured to detect interaction of the alternating magnetic excitation signal with the object, and

wherein the apparatus is configured to constrain side-to-side movement of the axis of rotation while the probe is rotated around the axis of rotation such that at least a portion of the probe moves along the first surface of the object substantially concentric to the circular boundary of the structure,

wherein the structure includes a fastener that has a head, and

wherein the probe includes a sharp protrusion that has a size and a shape to slightly dent the head of the fastener to provide a pivot point and constrain side-to-side movement of the axis of rotation while the probe is rotated.

5. An apparatus for examining an object having a first surface wherein the object includes a structure that penetrates the first surface, and wherein the structure includes a circular boundary, the apparatus comprising:

a rotatable magnetic-eddy-current probe that includes an excitation unit that generates an alternating magnetic excitation signal, wherein the rotatable probe has an axis of rotation, wherein the probe, when placed adjacent the first surface of the object, is configured to detect interaction of the alternating magnetic excitation signal with the object; and

a platform configured to be held in a fixed position relative to the first surface of the object and configured to hold the probe such that the probe can be rotated around the axis of rotation;

wherein the platform includes one or more immobilization support members,

wherein the one or more immobilization support members are operably attached to the object to be inspected, and

wherein the platform is configured to constrain side-to-side movement of the axis of rotation while the probe is rotated around the axis of rotation such that at least a portion of the probe moves along the first surface of the object substantially concentric to the circular boundary of the structure.

6. The apparatus of claim 5, wherein the one or more immobilization support members include at least one suction cup configured to be temporarily attached to the object to be inspected to hold the platform in the fixed position relative to the first surface of the object.

7. The apparatus of claim 5, wherein the one or more immobilization support members include an adhesive configured to be temporarily attached to the structure to be inspected to hold the platform in the fixed position relative to the first surface of the object.

8. The apparatus of claim 5, wherein the one or more immobilization supports include at least one permanent magnet configured to be temporarily attached to the structure to be inspected to hold the platform in the fixed position relative to the first surface of the object.

19. The apparatus of claim 8, wherein the means for holding the platform in a fixed position relative to the first surface of the object includes using at least one suction cup temporarily holding the platform in the fixed position relative to the first surface of the object.

9. A method for examining an object having a first surface, wherein the object includes a structure that penetrates the first surface, and wherein the structure includes a circular boundary, the method comprising:

providing a rotatable magnetic-eddy-current probe that includes an excitation unit;

generating an alternating magnetic excitation signal with the excitation unit;

placing the probe adjacent the first surface of the object;

constraining side-to-side movement of an axis of rotation while rotating the probe around the axis of rotation such that at least a portion of the probe moves along the first surface of the object substantially concentric to the circular boundary of the structure; and

detecting interaction of the alternating magnetic excitation signal with the object,

wherein the structure includes a fastener that has a raised head, and

wherein constraining side-to-side movement of the axis of rotation includes providing a bottom surface of the probe that surrounds an indentation of the probe, wherein a circular edge between the indentation and the bottom surface is operatively configured to fit around the raised head of the fastener with sufficient snugness to constrain side-to-side movement of the axis of rotation while the probe is rotated.

10. A method for examining an object having a first surface, wherein the object includes a structure that penetrates the first surface, and wherein the structure includes a circular boundary, the method comprising:

providing a rotatable magnetic-eddy-current probe that includes an excitation unit;

generating an alternating magnetic excitation signal with the excitation unit;

placing the probe adjacent the first surface of the object;

constraining side-to-side movement of an axis of rotation while rotating the probe around the axis of rotation such that at least a portion of the probe moves along the first surface of the object substantially concentric to the circular boundary of the structure; and

detecting interaction of the alternating magnetic excitation signal with the object,

wherein the structure includes a fastener that has a head, and

wherein constraining side-to-side movement of the axis of rotation includes providing a sharp protrusion that has a size and a shape to slightly dent the head of the fastener to provide a pivot point for rotating the probe around the axis of rotation.

11. A method for examining an object having a first surface, wherein the object includes a structure that penetrates the first surface, and wherein the structure includes a circular boundary, the method comprising:

providing a rotatable magnetic-eddy-current probe that includes an excitation unit;

generating an alternating magnetic excitation signal with the excitation unit;

placing the probe adjacent the first surface of the object;

constraining side-to-side movement of an axis of rotation while rotating the probe around the axis of rotation such that at least a portion of the probe moves along the first surface of the object substantially concentric to the circular boundary of the structure; and

detecting interaction of the alternating magnetic excitation signal with the object,

wherein the structure includes a fastener that has a head,

wherein the head of the fastener includes a dimple aligned with the center axis of the fastener, and

wherein constraining side-to-side movement of the axis of rotation includes providing a sharp protrusion that has a size and shape to fit into the dimple in the fastener to provide a pivot point for rotating the probe around the axis of rotation.

12. A method for examining an object having a first surface, wherein the object includes a structure that penetrates the first surface, and wherein the structure includes a circular boundary, the method comprising:

providing a rotatable magnetic-eddy-current probe that includes an excitation unit;

generating an alternating magnetic excitation signal with the excitation unit;

placing the probe adjacent the first surface of the object;

constraining side-to-side movement of an axis of rotation while rotating the probe around the axis of rotation such that at least a portion of the probe moves along the first surface of the object substantially concentric to the circular boundary of the structure;

detecting interaction of the alternating magnetic excitation signal with the object;

providing a platform configured to be held in a fixed position relative to the first surface of the object and configured to hold the probe such that the probe can be rotated around the axis of rotation, wherein the platform includes one or more immobilization support members; and

operably attaching the one or more immobilization support members to the object to be inspected.

13. The method of claim 12, wherein the operably attaching the one or more immobilization support members to the object to be inspected includes using at least one suction cup temporarily holding the platform in the fixed position relative to the first surface of the object.

14. The method of claim 12, wherein the operably attaching the one or more immobilization support members to the object to be inspected includes temporarily adhesively attaching the platform to the structure to be inspected to hold the platform in the fixed position relative to the first surface of the object.

15. The method of claim 12, wherein the operably attaching the one or more immobilization support members to the object to be inspected includes temporarily magnetically attaching the platform to the structure to be inspected to hold the platform in the fixed position relative to the first surface of the object.

16. An apparatus for examining an object having a first surface, wherein the object includes a structure that penetrates the first surface, and wherein the structure includes a circular boundary, the apparatus comprising:

a rotatable magnetic-eddy-current probe that includes an excitation unit that generates an alternating magnetic excitation signal wherein the probe when placed adjacent the first surface of the object, is configured to detect interaction of the alternating magnetic excitation signal with the object,

means for rotating the probe around an axis of rotation, and

means for constraining side-to-side movement of the axis of rotation while rotating the probe around the axis of rotation such that at least a portion of the probe moves along the first surface of the object substantially concentric to the circular boundary of the structure, wherein the structure includes a fastener that has a raised head, and wherein the means for constraining includes a bottom surface of the probe that surrounds an indentation of the probe, wherein a circular edge between the indentation and the bottom surface is operatively configured to fit around the raised head of the fastener with sufficient snugness to constrain side-to-side movement of the axis of rotation while the probe is rotated.

17. An apparatus for examining an object having a first surface, wherein the object includes a structure that penetrates the first surface, and wherein the structure includes a circular boundary, the apparatus comprising:

a rotatable magnetic-eddy-current probe that includes an excitation unit that generates an alternating magnetic excitation signal, wherein the probe, when placed adjacent the first surface of the object, is configured to detect interaction of the alternating magnetic excitation signal with the object,

means for rotating the probe around an axis of rotation, and means for constraining side-to-side movement of the axis of rotation while rotating the probe around the axis of rotation such that at least a portion of the probe moves along the first surface of the object substantially concentric to the circular boundary of the structure,

wherein the structure includes a fastener that has a head, and

wherein the means for constraining side-to-side movement of the axis of rotation of rotation includes a sharp protrusion means for slightly denting the head of the fastener to provide a pivot point for rotating the probe around the axis.

18. An apparatus for examining an object having a first surface, wherein the object includes a structure that penetrates the first surface and wherein the structure includes a circular boundary, the apparatus comprising:

a rotatable magnetic-eddy-current probe that includes an excitation unit that generates an alternating magnetic excitation signal, wherein the probe, when placed adjacent the first surface of the object, is configured to detect interaction of the alternating magnetic excitation signal with the object,

means for rotating the probe around an axis of rotation,

means for constraining side-to-side movement of the axis of rotation while rotating the probe around the axis of rotation such that at least a portion of the probe moves along the first surface of the object substantially concentric to the circular boundary of the structure,

a platform; and

suction means for temporarily affixing the platform to the surface in a fixed position relative to the first surface of the object and holding the probe such that the probe can be rotated around the axis of rotation.