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Parallel testing of semiconductor devices using a dividing voltage supply unit

  • US 7,626,413 B2
  • Filed: 08/04/2008
  • Issued: 12/01/2009
  • Est. Priority Date: 01/11/2005
  • Status: Expired due to Fees
First Claim
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1. A method of performing a parallel test, the method comprising:

  • testing a plurality of sets of semiconductor devices in parallel, each set including at least two semiconductor devices;

    determining if at least one of the semiconductor devices of a set is defective as a result of the testing of the sets of semiconductor devices; and

    disconnecting the set with at least one defective semiconductor device from at least one power signal line.

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