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RFID temperature sensing wafer, system and method

  • US 7,629,184 B2
  • Filed: 03/20/2007
  • Issued: 12/08/2009
  • Est. Priority Date: 03/20/2007
  • Status: Expired due to Fees
First Claim
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1. A method of manufacturing semiconductor wafers comprising:

  • processing a semiconductor wafer to form at least one temperature-sensing RF device on the wafer;

    further processing the wafer to form a plurality of semiconductor products on the wafer; and

    during the further processing of the wafer, sensing temperature at locations on the wafer corresponding to each of the at least one RF device and wirelessly transmitting data, including temperature data, from the at least one RF device.

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