Integrated displacement sensors for probe microscopy and force spectroscopy
First Claim
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1. A force sensor for a probe based instrument, the force sensor comprising:
- a detection surface;
an optical diffraction grating disposed on the detection surface;
a flexible mechanical structure disposed a first distance from the detection surface so as to form a gap between the flexible mechanical structure and the detection surface, wherein the flexible mechanical structure is configured to deflect upon exposure to an external force, thereby changing the first distance, the flexible mechanical structure including a reflective surface;
a plurality of probe tips extending outwardly from an outer surface of the flexible mechanical structure;
a light source configured to direct a light beam toward the reflective surface;
at least one optical interferometric sensor configured to sense an intensity of a beam of a diffraction order diffracted by the diffraction grating, wherein the intensity indicates a displacement between the optical diffraction grating and the reflective surface; and
a first electrical connection coupled to the detection surface and a second electrical connection coupled to the flexible mechanical structure, the first electrical connection and the second electrical connection being configured to supply electrostatic forces to actuate the flexible mechanical structure.
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Abstract
In accordance with an embodiment of the invention, there is a force sensor for a probe based instrument. The force sensor can comprise a detection surface and a flexible mechanical structure disposed a first distance above the detection surface so as to form a gap between the flexible mechanical structure and the detection surface, wherein the flexible mechanical structure is configured to deflect upon exposure to an external force, thereby changing the first distance.
69 Citations
8 Claims
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1. A force sensor for a probe based instrument, the force sensor comprising:
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a detection surface; an optical diffraction grating disposed on the detection surface; a flexible mechanical structure disposed a first distance from the detection surface so as to form a gap between the flexible mechanical structure and the detection surface, wherein the flexible mechanical structure is configured to deflect upon exposure to an external force, thereby changing the first distance, the flexible mechanical structure including a reflective surface; a plurality of probe tips extending outwardly from an outer surface of the flexible mechanical structure; a light source configured to direct a light beam toward the reflective surface; at least one optical interferometric sensor configured to sense an intensity of a beam of a diffraction order diffracted by the diffraction grating, wherein the intensity indicates a displacement between the optical diffraction grating and the reflective surface; and a first electrical connection coupled to the detection surface and a second electrical connection coupled to the flexible mechanical structure, the first electrical connection and the second electrical connection being configured to supply electrostatic forces to actuate the flexible mechanical structure. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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Specification