Large field of view projection optical system with aberration correctability
First Claim
Patent Images
1. An exposure system, comprising:
- a reticle with patterns on it;
a substrate; and
a reflective optical system configured to image the patterns on the reticle onto the substrate, components of the reflective optical system comprising;
a primary mirror including a first mirror and a second mirror, anda secondary mirror,wherein relative positions of the first and second mirrors of the reflective optical system are adjustable post-design, andwherein the optical system provides at least ten (10) degrees of freedom for both alignment and correction of aberrations without incorporating additional optical surfaces, when projecting an image of the patterns on the reticle onto the substrate by reflections off the first mirror, the secondary mirror, and the second mirror.
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Abstract
An exposure system for manufacturing flat panel displays (FPDs) includes a reticle stage adapted to support a reticle. A substrate stage is adapted to support a substrate. A reflective optical system is adapted to image the reticle onto the substrate. The reflective optical system includes a primary mirror including a first mirror and a second mirror, and a secondary mirror. The reflective optical system has sufficient degrees of freedom for both alignment and correction of third order aberrations when projecting an image of the reticle onto the substrate by reflections off the first mirror, the secondary mirror, and the second mirror.
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Citations
26 Claims
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1. An exposure system, comprising:
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a reticle with patterns on it; a substrate; and a reflective optical system configured to image the patterns on the reticle onto the substrate, components of the reflective optical system comprising; a primary mirror including a first mirror and a second mirror, and a secondary mirror, wherein relative positions of the first and second mirrors of the reflective optical system are adjustable post-design, and wherein the optical system provides at least ten (10) degrees of freedom for both alignment and correction of aberrations without incorporating additional optical surfaces, when projecting an image of the patterns on the reticle onto the substrate by reflections off the first mirror, the secondary mirror, and the second mirror. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25)
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26. A method, comprising:
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projecting patterns located on a reticle onto a substrate after reflecting off a first mirror portion of a primary mirror, a secondary mirror, and a second mirror portion of the primary mirror; adjusting relative positions of the first and second mirrors post-design; and providing at least ten (10) degrees of freedom for both alignment and correction of aberrations without incorporating additional optical surfaces.
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Specification