Dynamic determination of sampling rates
First Claim
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1. A system that facilitates determination of a sampling rate to utilize in connection with sampling data in an industrial environment, comprising:
- one or more data repositories comprising historical data associated with at least one of industrial machines or industrial processes;
a receiver component that receives data from one or more I/O ports of a controller; and
an analysis component that employs probabilistic analysis to correlate the historical data to the received data to predict a failure of the at least one of industrial machines or industrial processes, the analysis component automatically determines a rate at which data associated with the one or more I/O ports is to be sampled based at least in part upon the predicted failure.
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Abstract
A system that facilitates determination of a sampling rate to utilize in connection with sampling data in an industrial environment comprises a receiver component that receives data from an I/O port of a controller. An analysis component automatically and dynamically determines a rate at which data associated with the I/O port is to be sampled based at least in part upon the received data. The system can further comprise a sampling component that samples data at the rate determined by the analysis component.
62 Citations
28 Claims
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1. A system that facilitates determination of a sampling rate to utilize in connection with sampling data in an industrial environment, comprising:
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one or more data repositories comprising historical data associated with at least one of industrial machines or industrial processes; a receiver component that receives data from one or more I/O ports of a controller; and an analysis component that employs probabilistic analysis to correlate the historical data to the received data to predict a failure of the at least one of industrial machines or industrial processes, the analysis component automatically determines a rate at which data associated with the one or more I/O ports is to be sampled based at least in part upon the predicted failure. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. A methodology for automatically and dynamically determining a sampling rate, comprising:
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controlling one or more industrial processes with a plurality of controllers; logging historical data associated with the one or more industrial processes; configuring a hardware device to monitor a plurality of I/O ports, the plurality of I/O ports are associated with the plurality of controllers; receiving data from monitoring the I/O ports; predicting a failure of the one or more industrial processes based upon identifying a pattern associated with the received data and historical data; and automatically determining one or more rates at which to sample data associated with the plurality of I/O ports based at least in part upon the predicted failure of the one or more industrial processes. - View Dependent Claims (19, 20, 21, 22, 23, 24, 25, 26)
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27. An industrial data sampling system, comprising:
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a data mining component that performs data mining on data from an I/O card of a controller and historical data associated with the controller, and employs computational techniques based on one or more of statistics, machine learning, or pattern recognition to identify a pattern, a trend, or a correlation predicative of at least one of a device failure associated with the controller or a process failure associated with the controller; an analysis component that analyzes data and determines selects a sampling rate to sample data associated with the I/O card based at least in part upon the predicted device failure or process failure; and a sampling component communicatively coupled to the analysis component that samples data associated with the I/O card at the selected sampling rate.
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28. A system that facilitates dynamic alteration of sampling rates associated with multiple controllers, comprising:
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means for analyzing data associated with an I/O card of a controller, wherein the controller controls at least one of an industrial device or an industrial process; means for predicating a failure of at least one of the industrial device or the industrial process based upon the analysis; means for identifying a sampling rate at which to sample data associated with the I/O card based at least in part upon the predicted failure; and means for effectuating the sampling rate with respect to the I/O card.
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Specification