Field programmable gate array utilizing dedicated memory stacks in a vertical layer format

• US 7,649,386 B2
• Filed: 08/31/2007
• Issued: 01/19/2010
• Est. Priority Date: 01/17/2002
• Status: Expired due to Term

• Current Assignee: Nytell Software LLC (Intellectual Ventures LLC)
• Original Assignee: Aprolase Development Co LLC (Intellectual Ventures LLC)
• Inventors: Gann, Keith D., Boyd, W. Eric, Ozguz, Volkan H., Carlson, Randolph S., Leon, John
• Primary Examiner(s): Tran; Anh Q
• Application Number:
  US11/897,938
• Publication Number:
  US 20080074144A1
• Time in Patent Office: 872 Days
• Field of Search: 326 39- 41, 326/47, 326/101
• US Class Current: 326/101
• CPC Class Codes: G01R 31/318519 Test of field programmable gate arrays [FPGA]
• CPC Class Codes: G06F 9/3802 Instruction prefetching
• CPC Class Codes: H03K 19/177 arranged in matrix form
• CPC Class Codes: H03K 19/1776 for memories
• CPC Class Codes: H03K 19/17792 for operating speed

Abstract

A field programmable gate array, an access lead network coupled to the FPGA, and a plurality of memories electrically coupled to the access lead network. The FPGA, access lead network, and plurality of memories are arranged and configured to operate with a variable word width, namely with a word width between 1 and a maximum number of bits. The absolute maximum word width may be as large as m.times.N where m is the number of word width bits per memory chip and N is the number of memory chips.

Claims

1. An electronic module comprising:

a field-programmable gate array (FPGA);

an access lead network electrically coupled and proximate to the FPGA; and

a memory stack located external to the FPGA and electrically coupled to the access lead network, wherein the memory stack defines a planar surface and includes a plurality of layers, and wherein each of the layers comprises a memory IC;

wherein the memory stack further includes a conductive I/O pad located on the planar surface and configured to route an electrical signal between the memory IC and the access lead network; and

wherein the electronic module further includes a plurality of vertically-stacked prepackaged IC chips.

2. The electronic module of claim 1, wherein the FPGA is configured to operate with a variable word width.

3. The electronic module of claim 1, wherein the access lead network is electrically coupled to the FPGA by a first ball grid array and is electrically coupled to the memory stack by a second ball grid array.

4. The electronic module of claim 1, wherein the access lead network comprises a metallized trace configured to electrically connect the conductive I/O pad to the FPGA.

5. The electronic module of claim 4, wherein the conductive I/O pad is electrically connected to the metallized trace by a I-connect structure.

6. An electronic module comprising:

a field-programmable gate array (FPGA);

an access lead network electrically coupled and proximate to the FPGA; and

a memory stack located external to the FPGA and electrically coupled to the access lead network, wherein the memory stack defines a planar surface and includes a plurality of layers, and wherein each of the layers comprises a memory IC;

wherein the memory stack further includes a conductive I/O pad located on the planar surface and configured to route an electrical signal between the memory IC and the access lead network; and

wherein the electronic module further includes a plurality of vertically-stacked neo-chips.

7. The electronic module of claim 6, wherein the FPGA is configured to operate with a variable word width.

8. The electronic module of claim 6, wherein the access lead network is electrically coupled to the FPGA by a first ball grid array and is electrically coupled to the memory stack by a second ball grid array.

9. The electronic module of claim 6, wherein the access lead network comprises a metallized trace disposed on a lateral surface of the memory stack and configured to electrically connect the conductive I/O pad to the FPGA.

10. The electronic module of claim 8, wherein the conductive I/O pad is electrically connected to the metallized trace by a T-connect structure.

11. An electronic module comprising:

a field-programmable gate array (FPGA);

an access lead network electrically coupled and proximate to the FPGA; and

a memory stack electrically coupled to the access lead network, wherein the memory stack includes;

a plurality of layers each comprising an integrated circuit; and

a plurality of I/O terminals disposed on a planar surface of the stack,

wherein the 110 terminals are configured to route electrical signals between the integrated circuits and the access lead network.

12. The electronic module of claim 11, wherein the FPGA is configured to operate with a variable word width.

13. The electronic module of claim 12, wherein the variable word width is between 1 and m*N bits, where m represents a number of bits in a word width of each integrated circuit and N represents a number of the integrated circuits.

14. The electronic module of claim 11, wherein the access lead network comprises an interposer board.

15. The electronic module of claim 11, wherein the access lead network is electrically coupled to the FPGA by a first ball grid array and is electrically coupled to the memory stack by a second ball grid array.

16. The electronic module of claim 15, wherein the access lead network comprises a plurality of vias configured to electrically connect the first ball grid array to the second ball grid array.

17. The electronic module of claim 15, wherein the memory stack further comprises a plurality of interleaved lines electrically connecting the second ball grid array to a third ball grid array disposed on a surface of the memory stack.

18. The electronic module of claim 11, wherein the integrated circuit for each of the plurality of layers comprises a synchronous dynamic random access memory.

19. The electronic module of claim 11, wherein the memory stack further comprises a plurality of insulative layers.

20. The electronic module of claim 11, wherein the access lead network is electrically coupled to the FPGA by a first pin grid array and is electrically coupled to the memory stack by a second pin grid array.

21. The electronic module of claim 11, wherein the plurality of layers of the memory stack are vertically stacked.

22. The electronic module of claim 11, wherein the access lead network comprises a plurality of metallized traces configured to electrically connect the plurality of I/O terminals to the FPGA.

23. The electronic module of claim 22, wherein at least one of the plurality of I/O terminals is electrically connected to at least one of the plurality of metallized traces by a T- connect structure.

24. The electronic module of claim 22, wherein at least one layer of the plurality of layers further comprises conductive rerouting configured to electrically route signals from the plurality of I/O terminals to a lateral surface of the memory stack.

25. The electronic module of claim 11, wherein the plurality of layers comprise a plurality of vertically-stacked prepackaged IC chips.

26. The electronic module of claim 11, wherein the plurality of layers comprise a plurality of vertically-stacked neo-chips.

27. A method comprising:

disposing a field-programmable gate array (FPGA) proximate an access lead network;

electrically connecting the FPGA to the access lead network; and

electrically connecting a memory stack to the access lead network, wherein the memory stack includes a plurality of layers, each layer comprising an integrated circuit and a plurality of I/O terminals disposed on a surface of the stack, wherein the plurality of I/O terminals are configured to route electrical signals between the integrated circuits and the access lead network.

28. The method of claim 27, wherein the FPGA is configured to utilize a variable word width.

29. The method of claim 28, wherein the variable word width is between 1 and m*N bits, where m represents a number of bits for a word width of each integrated circuit N represents a number of the integrated circuits.

30. The method of claim 27, wherein said electrically connecting the FPGA to the access lead network comprises electrically connecting the FPGA to the access lead network using a first ball grid array, and wherein said electrically connecting a memory stack to the access lead network comprises electrically connecting the memory stack to the access lead network using a second ball grid array.

31. The method of claim 30, wherein the access lead network comprises a plurality of vias configured to electrically connect the first ball grid array to the second ball grid array.

32. The method of claim 31, wherein the memory stack further comprises a plurality of interleaved lines electrically connecting the second ball grid array to a third ball grid array disposed on a surface of the memory stack.

33. The method of claim 27, wherein at least one of the integrated circuits comprises a synchronous dynamic random access memory.

34. The method of claim 27, wherein said electrically connecting the FPGA to the access lead network comprises electrically connecting the FPGA to the access lead network using a first pin grid array, and wherein said electrically connecting a memory stack to the access lead network comprises electrically connecting the memory stack to the access lead network using a second pin grid array.

35. The method of claim 27, wherein the plurality of layers of the memory stack are vertically stacked.

36. The method of claim 27, wherein the access lead network comprises a plurality of metallized traces, and wherein said electrically connecting a memory stack to the access lead network further comprises electrically connecting the plurality of metallized traces to the plurality of 110 terminals for each of the plurality of layers.

37. The method of claim 36, wherein at least one of the plurality of I/O terminals is electrically connected to at least one of the plurality of metallized traces by a I- connect structure.

38. The method of claim 36, wherein at least one layer of the plurality of layers further comprises conductive rerouting configured to electrically route signals from the plurality of I/O terminals to a lateral surface of the memory stack.

39. The method of claim 27, wherein the plurality of layers comprise a plurality of vertically-stacked prepackaged IC chips.

40. The method of claim 27, wherein the plurality of layers comprise a plurality of vertically-stacked neo-chips.