Characterization of micro- and nano scale materials by acoustic wave generation with a CW modulated laser
First Claim
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1. Apparatus for analyzing thin surface layers comprising:
- A source of laser radiation;
Means for modulating the laser radiation at a single frequency, capable of operating over a broad bandwidth from the MHz-GHz frequency range;
An optical system for directing the modulated radiation to at least a first point on a surface of a thin surface layer to cause an acoustic wave therein;
Means for sensing a response of the thin surface layer to the acoustic wave;
Means for limiting the sensor bandwidth to a narrow frequency range; and
Means for analyzing the sensed response to provide an indication of properties of the thin surface layer.
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Abstract
Apparatus for analyzing thin surface layers. An acoustic wave generating laser beam is amplitude modulated with continuous wave modulation of a frequency in the megahertz to gigahertz range and an optical system directs the modulated radiation to a surface of a thin surface layer. This in turn causes an acoustic wave that is sensed and analyzed to provide an indication of properties of thin surface layer.
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20 Claims
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1. Apparatus for analyzing thin surface layers comprising:
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A source of laser radiation; Means for modulating the laser radiation at a single frequency, capable of operating over a broad bandwidth from the MHz-GHz frequency range; An optical system for directing the modulated radiation to at least a first point on a surface of a thin surface layer to cause an acoustic wave therein; Means for sensing a response of the thin surface layer to the acoustic wave; Means for limiting the sensor bandwidth to a narrow frequency range; and Means for analyzing the sensed response to provide an indication of properties of the thin surface layer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification