Analyzing tool with knob part
First Claim
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1. A test tool attached to an analyzing device far sample analysis, the analyzing device including a plurality of terminals and an analyzing circuit, the test tool being manually attached to or removed from the analyzing device, the test tool comprising:
- a base plate having a pinching recess or projection used for attachment to the analyzing device or for removal from the analyzing device;
a plurality of electrodes formed on the base plate for contact with the terminals when the test tool is attached to the analyzing device; and
an insulating film for covering the plurality of electrodes;
wherein at least when one of the electrodes serves as a counter-disturbance noise electrode that is more likely to receive disturbance noises than another electrode,wherein the insulating film does not cover a portion of the counter-disturbance noise electrode located at the pinching recess or projection.
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Abstract
The present invention relates to a test tool (X1) attached to an analyzing device (1) for analyzing a sample. The test tool (X1) includes a pinching portion (6) for attachment to the analyzing device (1) or removal from the analyzing device (1). The pinching portion (6) may include recesses or projections.
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Citations
12 Claims
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1. A test tool attached to an analyzing device far sample analysis, the analyzing device including a plurality of terminals and an analyzing circuit, the test tool being manually attached to or removed from the analyzing device, the test tool comprising:
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a base plate having a pinching recess or projection used for attachment to the analyzing device or for removal from the analyzing device; a plurality of electrodes formed on the base plate for contact with the terminals when the test tool is attached to the analyzing device; and an insulating film for covering the plurality of electrodes; wherein at least when one of the electrodes serves as a counter-disturbance noise electrode that is more likely to receive disturbance noises than another electrode, wherein the insulating film does not cover a portion of the counter-disturbance noise electrode located at the pinching recess or projection. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A test tool attached to an analyzing device for sample analysis, the analyzing device including a plurality of terminals and an analyzing circuit, the test tool being mutually attached to or removed from the analyzing device, the test tool comprising:
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a pinching portion used for attachment to the analyzing device or for removal from the analyzing device; and a plurality of electrodes brought into contact with the terminals when the test tool is attached to the analyzing device; wherein at least one of the electrodes serves as a counter-disturbance noise electrode that is more likely to receive disturbance noise than another electrode; wherein the counter-disturbance noise electrode is partly exposed at the pinching portion; and wherein the electrodes include a first electrode electrically connected to the analyzing circuit, and a second electrode cooperating with the first electrode to apply a voltage across a target portion at the test tool, the second electrode working as the counter-disturbance noise electrode.
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12. A test tool attached to an analyzing device for sample analysis, the analyzing device including a plurality of terminals and an analyzing circuit, the test tool being mutually attached to or removed from the analyzing device, the test tool comprising:
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a pinching portion used for attachment to the analyzing device or for removal from the analyzing device; and a plurality of electrodes brought into contact with the terminals when the test tool is attached to the analyzing device; wherein at least one of the electrodes serves as a counter-disturbance noise electrode that is more likely to receive disturbance noise than another electrode; wherein the counter-disturbance noise electrode is partly exposed at the pinching portion; wherein one of the terminals of the analyzing device is grounded as a ground connection terminal; wherein the counter-disturbance noise electrode is brought into contact with the ground connection terminal when the test tool is attached to the analyzing device.
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Specification