×

Analyzing tool with knob part

  • US 7,651,595 B2
  • Filed: 02/13/2004
  • Issued: 01/26/2010
  • Est. Priority Date: 02/14/2003
  • Status: Active Grant
First Claim
Patent Images

1. A test tool attached to an analyzing device far sample analysis, the analyzing device including a plurality of terminals and an analyzing circuit, the test tool being manually attached to or removed from the analyzing device, the test tool comprising:

  • a base plate having a pinching recess or projection used for attachment to the analyzing device or for removal from the analyzing device;

    a plurality of electrodes formed on the base plate for contact with the terminals when the test tool is attached to the analyzing device; and

    an insulating film for covering the plurality of electrodes;

    wherein at least when one of the electrodes serves as a counter-disturbance noise electrode that is more likely to receive disturbance noises than another electrode,wherein the insulating film does not cover a portion of the counter-disturbance noise electrode located at the pinching recess or projection.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×