Inspection system with material identification
First Claim
1. An inspection system, comprising:
- a) a conveyor adapted to move items in a first direction;
b) a source assembly comprising;
i) an x-ray source adapted to irradiate an item on the conveyor; and
ii) a source collimator positioned between the x-ray source and the conveyor;
c) a first positioning mechanism adapted and arranged to move the source assembly in a second direction, transverse to the first direction;
d) a detector assembly comprising;
i) a detector; and
ii) a detector collimator positioned between the detector and the conveyor;
e) a second positioning mechanism adapted and arranged to move the detector assembly in the second direction, the second positioning mechanism adapted and arranged to be controlled in at least one direction independently of the first positioning mechanism; and
f) a controller adapted to control the first and second positioning mechanisms to independently position the source and detector assemblies relative to the item to focus the inspection system on a region within the item on the conveyor and to move the source and detector assemblies in the first direction in synchrony with the conveyor, thereby maintaining the focus on the region as the item moves on the conveyor.
1 Assignment
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Accused Products
Abstract
An angular analysis system that can be controlled to receive radiation at a defined angle from a defined focus region. The angular analysis system is used for level 2 inspection in an explosive detection system. Level 2 inspection is provided by a three-dimensional inspection system that identifies suspicious regions of items under inspection. The angular analysis system is focused to gather radiation scattered at defined angles from the suspicious regions. Focusing may be achieved in multiple dimensions by movement of source and detector assemblies in a plane parallel to a plane holding the item under inspection. Focusing is achieved by independent motion of the source and detector assemblies. This focusing arrangement provides a compact device, providing simple, low cost and accurate operation.
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Citations
23 Claims
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1. An inspection system, comprising:
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a) a conveyor adapted to move items in a first direction; b) a source assembly comprising; i) an x-ray source adapted to irradiate an item on the conveyor; and ii) a source collimator positioned between the x-ray source and the conveyor; c) a first positioning mechanism adapted and arranged to move the source assembly in a second direction, transverse to the first direction; d) a detector assembly comprising; i) a detector; and ii) a detector collimator positioned between the detector and the conveyor; e) a second positioning mechanism adapted and arranged to move the detector assembly in the second direction, the second positioning mechanism adapted and arranged to be controlled in at least one direction independently of the first positioning mechanism; and f) a controller adapted to control the first and second positioning mechanisms to independently position the source and detector assemblies relative to the item to focus the inspection system on a region within the item on the conveyor and to move the source and detector assemblies in the first direction in synchrony with the conveyor, thereby maintaining the focus on the region as the item moves on the conveyor. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 21)
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9. A method of operating an inspection system having:
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a) an inspection region adapted and arranged to position an item under inspection in a plane; b) a source; and c) a detector; the method comprising; i. moving the source and the detector parallel to the plane in synchrony with the item to create a focus region in an item under inspection; ii. with the source, radiating a portion of the item under inspection, the portion including the focus region; iii. with the detector, measuring radiation emanating at an angle from the focus region; and iv. analyzing the measured radiation. - View Dependent Claims (10, 11, 12, 13, 22)
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14. A method of operating an inspection system, the method comprising:
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a) moving an item through an inspection area; and b) gathering data on a focus region of the item using a source and a detector while moving the source and the detector synchronously with the item. - View Dependent Claims (15, 16, 17, 18, 19, 20, 23)
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Specification