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System for testing semiconductors

  • US 7,656,172 B2
  • Filed: 01/18/2006
  • Issued: 02/02/2010
  • Est. Priority Date: 01/31/2005
  • Status: Active Grant
First Claim
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1. A probing system for a device under test comprising:

  • (a) an objective lens, light illuminating said device under test traversing a single optical path extending through said objective lens;

    (b) a first imaging device sensing a first video sequence of said device under test at a first magnification from said single optical path;

    (c) a second imaging device sensing a second video sequence of said device under test at a second magnification from said single optical path;

    (d) a third imaging device sensing a third video sequence of said device under test at a third magnification from said single optical path;

    (e) providing a video signal to a display that simultaneously presents said first video sequence, said second video sequence, and said third video sequence to a monitor.

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