System for testing semiconductors
First Claim
Patent Images
1. A probing system for a device under test comprising:
- (a) an objective lens, light illuminating said device under test traversing a single optical path extending through said objective lens;
(b) a first imaging device sensing a first video sequence of said device under test at a first magnification from said single optical path;
(c) a second imaging device sensing a second video sequence of said device under test at a second magnification from said single optical path;
(d) a third imaging device sensing a third video sequence of said device under test at a third magnification from said single optical path;
(e) providing a video signal to a display that simultaneously presents said first video sequence, said second video sequence, and said third video sequence to a monitor.
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Abstract
A semiconductor testing system that includes an plural imaging devices for capturing plural video sequences from a single optical path and concurrently displaying the video sequences for effectively positioning a probe for testing a semiconductor wafer.
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Citations
12 Claims
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1. A probing system for a device under test comprising:
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(a) an objective lens, light illuminating said device under test traversing a single optical path extending through said objective lens; (b) a first imaging device sensing a first video sequence of said device under test at a first magnification from said single optical path; (c) a second imaging device sensing a second video sequence of said device under test at a second magnification from said single optical path; (d) a third imaging device sensing a third video sequence of said device under test at a third magnification from said single optical path; (e) providing a video signal to a display that simultaneously presents said first video sequence, said second video sequence, and said third video sequence to a monitor. - View Dependent Claims (2, 6)
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3. A probing system for a device under test comprising:
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(a) an objective lens, light illuminating said device under test traversing a single optical path extending through said objective lens; (b) a first imaging device sensing a first video sequence of said device under test at a first selectable magnification from said single optical path; (c) a second imaging device sensing a second video sequence of said device under test at a second selectable magnification from said single optical path; (d) simultaneously providing said first video sequence, and said second video sequence, to a display. - View Dependent Claims (4)
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5. A probing system for a device under test comprising:
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(a) an objective lens, light illuminating said device under test traversing a single optical path extending through said objective lens; (b) an imaging device sensing a video sequence of said device under test at a first magnification from said single optical path; and (c) a display displaying the video sequence in a first window;
said display concurrently displaying a region of said first video sequence in a second window.
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7. A method for displaying video for a probing system comprising:
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(a) receiving a video sequence of a device under test, said video sequence comprising a plurality of frames sequentially presented at a frame rate, a frame comprising an image of a portion of said device under test; (b) presenting said video sequence in a first window on a display; (c) concurrently presenting a first portion of said video sequence in a second window on a portion of said display, said first portion of said video sequence comprising first portions of a plurality of said sequentially presented images, said first portions being selectable; and (d) concurrently presenting a second portion of said video sequence in a third window on a portion of said display, said second portion of said video sequence comprising second portions of a plurality of said sequentially presented images, said second portions being selectable. - View Dependent Claims (8, 9, 10, 11, 12)
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Specification