Apparatus and methods for adjusting the rotational frequency of a scanning device

• US 7,659,918 B2
• Filed: 10/08/2003
• Issued: 02/09/2010
• Est. Priority Date: 10/08/2003
• Status: Active Grant

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Turner, Arthur Monroe
• Primary Examiner(s): Meier; Stephen D
• Assistant Examiner(s): AL HASHIMI, SARAH
• Application Number:
  US10/680,928
• Publication Number:
  US 20050078169A1
• Time in Patent Office: 2,316 Days
• Field of Search: 347/230, 347/239, 347/241, 358/474
• US Class Current: 347/230
• CPC Class Codes: B41J 2/471 using dot sequential main scanning by means of a light deflector, e.g. a rotating polygonal mirror
• CPC Class Codes: G02B 26/0833 the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD G02B26/0825 takes precedence; micromechanical devices in general B81B
• CPC Class Codes: G02B 26/101 with both horizontal and vertical deflecting means, e.g. raster or XY scanners colour television using laser beams scanning a display screen H04N9/3129

Abstract

The present invention provides methods and apparatus for adjusting the resonant frequency, scan velocity or other parameters of a pivotally functional surface such as an oscillating mirror used as the scanning engine of a laser printer or projection display. The selected parameter is adjusted by the application of tensional or compression stress to the torsional hinges of the mirror. According to one embodiment, the appropriate stress is generated by a slice of piezoelectric material bonded to the mirror device itself or to other portions of the support structure of the scanning engine.

Claims

1. A method of adjusting a parameter of a pivotally oscillating structure having a functional surface comprising the steps of:

supporting a functional surface by a pair of torsional hinges extending between said functional surface and an anchor member such that said functional surface pivotally oscillates about said pair of torsional hinges;

mounting said anchor member to a support structure; and

adjusting the stress loading on said pair of torsional hinges to adjust a selected parameter of said pivotally oscillating structure;

wherein said step of adjusting the stress loading comprises the step of mounting a piezoelectrical element separate from an oscillatory drive mechanism for the functional surface and dedicated to applying said one of tension and compression forces to said pair of torsional hinges by providing electrical signals to distort said piezoelectric element.

2. The method of claim 1 further comprising the step of providing a drive force to pivotally oscillate said functional surface.

3. The method of claim 1 further comprising the step of sensing a selected parameter as said functional surface pivotally oscillates around said torsional hinges and providing a signal representative of said selected parameter.

4. A method of adjusting a parameter of a pivotally oscillating structure having a functional surface comprising the steps of:

supporting a functional surface by a pair of torsional hinges extending between said functional surface and an anchor member such that said functional surface pivotally oscillates about said pair of torsional hinges;

mounting said anchor member to a support structure, said support structure having a gap therein; and

adjusting the stress loading on said pair of torsional hinges by adjusting a size of said gap to adjust a selected parameter of said pivotally oscillating structure;

further comprising the step of monitoring a selected parameter as said functional surface pivotally oscillates around said torsional hinges and providing a signal representative of said selected parameter.

5. The method of claim 4 wherein said selected parameter is the resonant frequency of said functional surface pivotally oscillating around said torsional hinges.

6. A method of adjusting a parameter of a pivotally oscillating structure having a functional surface comprising the steps of:

supporting a functional surface by a pair of torsional hinges extending between said functional surface and an anchor member such that said functional surface pivotally oscillates about said pair of torsional hinges;

mounting said anchor member to a support structure; and

adjusting the stress loading on said pair of torsional hinges to adjust a selected parameter of said pivotally oscillating structure;

monitoring a selected parameter as said functional surface pivotally oscillates around said torsional hinges and providing a signal representative of said selected parameter;

wherein said selected parameter is the scan velocity of said functional surface pivotally oscillating around said torsional hinges.

7. A method of adjusting a parameter of a pivotally oscillating structure having a functional surface comprising the steps of:

supporting a functional surface by a pair of torsional hinges extending between said functional surface and an anchor member such that said functional surface pivotally oscillates about said pair of torsional hinges;

mounting said anchor member to a support structure; and

adjusting the stress loading on said pair of torsional hinges to adjust a selected parameter of said pivotally oscillating structure by applying at least one of tension and compressional forces to said pair of torsional hinges, wherein said step of applying comprises the step of mounting a piezoelectrical element for applying said one of tension and compression forces to said pair of torsional hinges by providing electrical signals to distort said piezoelectric element;

further comprising the step of sensing a selected parameter as said functional surface pivotally oscillates around said torsional hinges and providing a signal representative of said selected parameter, and the steps of receiving said signal representative of said sensed parameter, and generating said signals applied to said piezoelectric element so as to maintain the selected parameter of said pivotal oscillation of a scanning device between a selected minimum level and a selected maximum level.

8. The method of claim 7 wherein said selected parameter is the resonant frequency of a scanning device.

9. The method of claim 7 wherein said functional surface of said scanning structure is a reflective surface and further comprising the step of directing a beam of light on to said reflective surface to provide a scanning beam of light.

10. The method of claim 9 further comprising the steps of mounting said scanning structure in a printer for use as a scanning engine.

11. The method of claim 9 further comprising the step of mounting said scanning structure in a display device for use as the scanning engine.

12. The method of claim 9 further comprising the step of modulating said scanning beam of light and receiving said modulated scanning beam of light at a photosensitive target.

13. The method of claim 12 wherein said photosensitive target is a display screen and further comprising the step of moving said modulated beam of light orthogonal to said scanning motion to form an image on said display screen.

14. The method of claim 12 further comprising the step of moving said photosensitive target orthogonal to said scanning motion to form an image on said moving photosensitive target.