×

Semiconductor device and test method of semiconductor device

  • US 7,660,257 B2
  • Filed: 03/23/2006
  • Issued: 02/09/2010
  • Est. Priority Date: 03/25/2005
  • Status: Expired due to Fees
First Claim
Patent Images

1. A semiconductor device, comprising:

  • a function unit portion including a circuit element;

    a non-volatile memory portion in which rank data are stored, the rank data presenting results of a rank-classification test on the circuit element, the rank-classification test being performed on the basis of a plurality of test criteria as wafer state; and

    a control portion reading out the rank data from the non-volatile memory portion, the control portion being used in a product test after packaging.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×