Semiconductor device and inspection method of semiconductor device and wireless chip
First Claim
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1. A semiconductor device comprising:
- an antenna;
a reception circuit operationally connected with the antenna;
a state control register operationally connected with the reception circuit; and
a data storing portion operationally connected with the state control register,wherein the data storing portion, the reception circuit, and the state control register each comprises a thin film transistor;
wherein the data storing portion stores a test program received through the antenna by wireless communication; and
wherein the state control register becomes a test program executing state.
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Abstract
The invention provides an inspection method of a semiconductor device which receives a test program wirelessly. As an inspection method of the semiconductor device, a test program is transmitted as a communication signal for every test. By transmitting a test program as a communication signal wirelessly in the case of an operation test, test contents are changed as required. As a result, a test program can be easily changed and an inspection circuit or the like is not required. In this manner, manufacturing cost of a wireless chip can be reduced.
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Citations
20 Claims
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1. A semiconductor device comprising:
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an antenna; a reception circuit operationally connected with the antenna; a state control register operationally connected with the reception circuit; and a data storing portion operationally connected with the state control register, wherein the data storing portion, the reception circuit, and the state control register each comprises a thin film transistor; wherein the data storing portion stores a test program received through the antenna by wireless communication; and wherein the state control register becomes a test program executing state. - View Dependent Claims (2, 3)
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4. A semiconductor device comprising:
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an RF circuit; a reception circuit operationally connected with the RF circuit; a state control register operationally connected with the reception circuit; and a data storing portion operationally connected with the state control register; wherein the data storing portion, the reception circuit, the state control register, and the RF circuit each comprises a thin film transistor; wherein the data storing portion stores a test program received through the RF circuit by wireless communication; and wherein the state control register becomes a test program executing state. - View Dependent Claims (5, 6, 7)
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8. An inspection method of a semiconductor device comprising:
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starting an operation of an arithmetic circuit in accordance with a state of a state control register; reading a test program stored in a data storing portion by the arithmetic circuit; executing a test routine in accordance with the test program; deciding an execution result of the test routine in accordance with the test program; and writing the execution result to the data storing portion in accordance with the test program, wherein the test program is received through an RF circuit.
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9. An inspection method of a semiconductor device comprising:
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starting a test program when or after a state control register becomes a test program executing state; reading the test program from a data storing portion by an arithmetic circuit; executing a test routine in accordance with the test program; deciding an execution result of the test routine in accordance with the test program; writing the execution result to the data storing portion in accordance with the test program; setting the state control register to a transmission processing state when or after the test program is terminated; and setting the state control register to a reception processing state by the arithmetic circuit after a transmission is terminated, wherein the test program is received through an RF circuit.
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10. An inspection method of a wireless chip comprising:
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receiving a test program through an RF circuit; storing the test program in a data storing portion; and after an inspection is carried out by the test program, displaying a result of the inspection by a liquid crystal element. - View Dependent Claims (11)
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12. An inspection method of a wireless chip comprising:
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receiving a test program through an RF circuit; storing the test program in a data storing portion; and after an inspection is carried out by the test program, deciding a result of the inspection by whether light from a laser light source is inputted to a light receptor or not. - View Dependent Claims (13)
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14. A semiconductor device comprising:
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an antenna; a reception circuit operationally connected with the antenna; a state control register operationally connected with the reception circuit; and a data storing portion operationally connected with the state control register, wherein the data storing portion, the reception circuit, and the state control register each comprises a thin film transistor; wherein the data storing portion stores a test program received through the antenna by wireless communication for an operation test of the semiconductor device, and wherein the state control register becomes a test program executing state. - View Dependent Claims (15, 16)
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17. A semiconductor device comprising:
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an RF circuit; a reception circuit operationally connected with the RF circuit; a state control register operationally connected with the reception circuit; and a data storing portion operationally connected with the state control register; wherein the data storing portion, the reception circuit, the state control register, and the RF circuit each comprises a thin film transistor; wherein the data storing portion stores a test program received through the RF circuit by wireless communication for an operation test of the semiconductor device; and wherein the state control register becomes a test program executing state. - View Dependent Claims (18, 19, 20)
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Specification