Diode lamp for simulating a filament lamp, and lamp monitoring method

• US 7,671,541 B2
• Filed: 06/12/2007
• Issued: 03/02/2010
• Est. Priority Date: 06/12/2007
• Status: Active Grant

• Current Assignee: Video Refurbishing Services, Inc.
• Original Assignee: Video Refurbishing Services, Inc.
• Inventors: Hickey, Robert J.
• Primary Examiner(s): Owens; Douglas W
• Assistant Examiner(s): Chen; Jianzi
• Application Number:
  US11/811,915
• Publication Number:
  US 20080309257A1
• Time in Patent Office: 994 Days
• Field of Search: 315/291, 315/307, 315/308, 362/600
• US Class Current: 315/307
• CPC Class Codes: B64D 2011/0053 Cabin passenger reading lights
• CPC Class Codes: B64D 2203/00 Aircraft or airfield lights using LEDs
• CPC Class Codes: B64F 5/60 Testing or inspecting aircraft components or systems
• CPC Class Codes: F21K 9/23 Retrofit light sources for lighting devices with a single fitting for each light source, e.g. for substitution of incandescent lamps with bayonet or threaded fittings
• CPC Class Codes: F21Y 2115/10 Light-emitting diodes [LED]
• CPC Class Codes: H05B 45/3574 Emulating the electrical or functional characteristics of incandescent lamps
• CPC Class Codes: H05B 45/395 Linear regulators
• CPC Class Codes: H05B 45/40 Details of LED load circuits
• CPC Class Codes: Y02B 20/30 Semiconductor lamps, e.g. solid state lamps [SSL] light emitting diodes [LED] or organic LED [OLED]

Abstract

An LED-based lamp assembly or diode lamp assembly effectively replaces a filament or incandescent type lamp assembly for cabin/compartment reading light applications for reducing power consumption and improving fuel efficiency. The diode lamp assembly comprises a light-emitting diode in circuit with peripheral components for effecting or simulating a low resistance through the diode lamp assembly. The simulation of a low resistance via the diode lamp assembly appears the same as the normal operation of a filament lamp assembly to existent circuit polling mechanisms so that the latter need not be replaced. Rather, the targeted element to be replaced is a relatively high power consumption filament lamp. A lamp monitoring method is further disclosed as bootstrap-supported by the teaching of the diode lamp assembly.

Claims

1. A light-emitting, diode lamp, the diode lamp for replacing a filament lamp, the diode lame comprising:

a light-emitting diode;

a load resistor, the load resistor being in series with the light-emitting diode for forming a two-component, first current path;

a current-limiting diode; and

a low resistance resistor, the low resistance resistor being in series with the current-limiting diode for forming a two component, second current path, a potential difference being applicable across the first and second current paths for driving current through said paths, enabling light emission from the light-emitting diode, and simulating a relatively low resistance through the diode lamp; and

wherein the diode lamp is usable in combination with resistance detection means for detecting resistance through the diode lamp, the resistance detection means providing a lamp replacement signal when detecting a relatively high resistance through the diode lamp.

2. The diode lamp of claim 1 wherein the load resistor, current-limiting diode, and low resistance resistor simulate low resistance across the light-emitting diode, the simulated low resistance for preventing the lamp replacement signal via the resistance detection means.

3. The diode lamp of claim 2 wherein the low resistance resistor comprises a select resistance, the select resistance being selected from a resistance range, the resistance range ranging from 1 to 600 ohms.

4. A diode lamp, the diode lame for replacing a filament lamp, the diode lamp comprising:

a light-emitting diode;

a load resistor, the load resistor being in series with the light-emitting diode for forming a two-component, first current path;

a Zener-diode;

a capacitor, the capacitor being in parallel with the Zener diode for forming a voltage-decaying path segment; and

a low resistance resistor, the low resistance resistor being in series with the voltage-decaying path segment for forming a three-component, second current path, a potential difference being applicable across the first and second current paths for driving current through said paths, enabling light emission from the light-emitting diode, and simulating a relatively low resistance through the diode lamp; and

wherein the diode lamp is usable in combination with resistance detection means for detecting resistance through the lamp, the resistance detection means providing a lamp replacement signal when detecting a relatively high resistance through the diode lamp.

5. The lamp of claim 4 wherein the load resistor, Zener-diode, capacitor, and low resistance resistor simulate low resistance through the light-emitting diode, the simulated low resistance for preventing the lamp replacement signal via the resistance detection means.

6. The lamp of claim 5 wherein the low resistance resistor comprises a select resistance, the select resistance being selected from a resistance range, the resistance range ranging from 1 to 600 ohms.

7. The lamp of claim 6 wherein the capacitor comprises a select capacitance, the select capacitance being selected from a capacitance range, the capacitance range ranging from 4-10 picofarads.

8. A diode lamp assembly, the diode lame assembly for simulating a filament lame assembly, the diode lame assembly comprising:

a light-emitting diode; and

low-resistance-simulating means for simulating relatively low resistance across the light-emitting diode, a potential difference being applicable across the light-emitting diode and low-resistance simulating means for driving current therethrough and enabling light emission from the light-emitting diode; and

wherein the diode lamp assembly is usable in combination with resistance detection means for detecting resistance through the diode lamp assembly, the resistance detection means providing a lamp replacement signal when detecting a relatively high resistance through the diode lamp assembly.

9. The diode lamp assembly of claim 8 wherein the low-resistance-simulating means are defined by first and second current paths, the first current path comprising a load resistor in series with the light-emitting diode, and the second current path comprising a low resistance resistor in series with a current-limiting diode, the first and second current paths for simulating a relatively low resistance across the light-emitting diode.

10. The diode lamp assembly of claim 9 wherein the low resistance resistor comprises a select resistance, the select resistance being selected from a resistance range, the resistance range ranging from 1 to 600 ohms.

11. A lamp monitoring method, the lamp monitoring method for testing a lamp socket, the method comprising the steps of:

installing a diode lamp into a lamp socket;

applying a potential difference across the diode lamp via the lamp socket;

simulating a low resistance through the diode lamp; and

polling the lamp socket for a high resistance signal from the diode lamp.

12. The method of claim 11 comprising the step of outputting a first signal if a low resistance is poll-detected.

13. The method of claim 12 comprising the step of outputting a second signal if a high resistance is poll-detected.

14. The method of claim 13 comprising the step of removing a filament lamp from the lamp socket before installing the diode lamp into the lamp socket.

15. A circuit-monitoring method, the circuit monitoring method for testing light-emitting diode circuitry, the method comprising the steps of:

installing a light-emitting diode into a diode-lighting circuit;

sending current through the diode-lighting circuit for emitting light from the light-emitting diode;

simulating a low resistance through the light-emitting diode; and

polling the diode-lighting circuit for a high resistance signal.

16. The method of claim 15 comprising the step of outputting a first signal if a low resistance is poll-detected.

17. The method of claim 15 comprising the step of outputting a second signal if a high resistance is poll-detected.

18. The method of claim 15 comprising the step of removing an incandescent filament from the diode-lighting circuit before installing the light-emitting diode into the diode-lighting circuit.

19. A light-emitting, diode lamp for replacing a filament lamp, the diode lamp comprising:

a light-emitting diode;

a load resistor, the load resistor being in series with the light-emitting diode for forming a first current path; and

a resistance simulation circuit for forming a second current path in parallel with the first current path, the resistance simulation circuit being configured to simulate a resistance for the diode lamp such that the diode lamp appears as a filament lamp to a resistance detection circuit.

20. The diode lamp of claim 19 wherein the resistance simulation circuit comprises a capacitor in parallel with the first current path.

21. The diode lamp of claim 20 wherein the capacitor comprises a select capacitance, the select capacitance being selected from a capacitance range, the capacitance range ranging from 4-10 picofarads.

22. The diode lamp of claim 20 wherein the light-emitting diode, the load resistor and the resistance simulation circuit comprises a self-contained assembly for insertion in an aircraft light socket that is designed to receive a filament lamp.

23. The diode lamp of claim 22 further comprising the resistance detection circuit for communicating with the self-contained assembly via the socket, the resistance detection circuit being configured to output a signal indicative of the diode lamp not needing replacement in response to detecting a low resistance from the self-contained assembly.

24. The diode lamp of claim 23 wherein the resistance detection circuit is further configured to output a signal indicative of the diode lamp needing replacement in response to detecting a high resistance from the self-contained assembly.

25. The diode lamp of claim 22 wherein the resistance detection circuit comprises existing aircraft circuitry for testing whether an operational lamp is installed in the socket.

26. The diode lamp of claim 19 wherein the first current path is a two-component, first current path.