Circuit simulator parameter extraction using a configurable ring oscillator
First Claim
1. A method comprising:
- (a) operating a configurable ring oscillator in a first configuration, wherein the ring oscillator is configurable to have a selectable one of a plurality of signal paths between a first node of the ring oscillator and a second node of the ring oscillator, wherein in the first configuration a first oscillating signal passes from the first node through a first of the signal paths and to the second node;
(b) making a first measurement of an operational characteristic of the ring oscillator configured in the first configuration;
(c) operating the configurable ring oscillator in a second configuration, wherein in the second configuration a second oscillating signal passes from the first node through a second of the signal paths and to the second node;
(d) making a second measurement of the operational characteristic of the ring oscillator configured in the second configuration;
(e) using the first and second measurements to determine a circuit simulator parameter and designing a circuit with a circuit simulation tool configured with the circuit simulator parameter.
1 Assignment
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Accused Products
Abstract
A configurable ring oscillator is operated in a first configuration so that an oscillating signal passes from a first node to a second node through a first signal path. A first measurement of an operational characteristic is made. The ring oscillator is operated in a second configuration where an oscillating signal passes from the first node to the second node through a second signal path. A second measurement is made. The first and second measurements are used to determine a circuit simulator parameter. If the first path has little interconnect and the second path has substantial interconnect, then the effect on circuit operation due to interconnect loading can be isolated from the effects on circuit operation due to variations in transistor performance. If the first and second paths are laid out to be identical, then the first and second measurements are usable to determine a circuit simulator mismatch parameter.
10 Citations
17 Claims
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1. A method comprising:
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(a) operating a configurable ring oscillator in a first configuration, wherein the ring oscillator is configurable to have a selectable one of a plurality of signal paths between a first node of the ring oscillator and a second node of the ring oscillator, wherein in the first configuration a first oscillating signal passes from the first node through a first of the signal paths and to the second node; (b) making a first measurement of an operational characteristic of the ring oscillator configured in the first configuration; (c) operating the configurable ring oscillator in a second configuration, wherein in the second configuration a second oscillating signal passes from the first node through a second of the signal paths and to the second node; (d) making a second measurement of the operational characteristic of the ring oscillator configured in the second configuration; (e) using the first and second measurements to determine a circuit simulator parameter and designing a circuit with a circuit simulation tool configured with the circuit simulator parameter. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A method comprising:
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(a) operating a configurable ring oscillator in a first configuration, wherein the ring oscillator is configurable to have a selectable one of a plurality of signal paths between a first node of the ring oscillator and a second node of the ring oscillator, wherein in the first configuration a first oscillating signal passes from the first node through a first of the signal paths and to the second node; (b) making a frequency measurement of the first oscillating signal when the configurable ring oscillator is operating in the first configuration; (c) making a power consumption measurement when the configurable ring oscillator is operating in the first configuration; (d) adjusting a first circuit simulator parameter and a second circuit simulator parameter such that a simulated frequency of the configurable ring oscillator in the first configuration substantially matches the frequency measured in the step (b) and such that a simulated power consumption of the ring oscillator in the first configuration substantially matches the power consumption measured in the step (c); (e) operating the configurable ring oscillator in a second configuration, wherein in the second configuration a second oscillating signal passes from the first node through a second of the signal paths and to the second node; (f) making a frequency measurement of the second oscillating signal when the configurable ring oscillator is operating in the second configuration; and (g) adjusting one or more additional circuit simulator parameters such that a simulated frequency of the configurable ring oscillator in the second configuration substantially matches the frequency measured in the step (f); (h) designing a circuit with a circuit simulation tool configured with the adjusted first circuit simulator parameter, adjusted second circuit simulator parameter, and adjusted one or more additional circuit simulator parameters; and (i) realizing the circuit.
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14. A method comprising:
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(a) operating a configurable ring oscillator in a first configuration, wherein the ring oscillator is configurable to have a selectable one of a plurality of signal paths between a first node of the ring oscillator and a second node of the ring oscillator, wherein in the first configuration a first oscillating signal passes from the first node through a first of the signal paths and to the second node; (b) making a first frequency measurement of the oscillating signal when the configurable ring oscillator is operating in the first configuration; (c) operating the configurable ring oscillator in a second configuration, wherein in the second configuration a second oscillating signal passes from the first node through a second of the signal paths and to the second node; (d) making a second frequency measurement of the oscillating signal when the configurable ring oscillator is operating in the second configuration; (e) determining a circuit simulator mismatch parameter based at least in part on the first and second measurements; (f) designing a circuit with a circuit simulation tool using the mismatch parameter; and (g) realizing the circuit.
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15. A method comprising:
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step for using a configurable ring oscillator to determine a circuit simulator parameter, wherein the configurable ring oscillator is part of an integrated circuit and has a first configuration and a second configuration, wherein in the first configuration an oscillating signal passes from a first node of the ring oscillator to a second node of the ring oscillator through a first signal path and not through a second signal path, whereas in the second configuration the oscillating signal passes from the first node to the second node through the second signal path and not through the first signal path; (h) designing an integrated circuit with a circuit simulation tool configured with the circuit simulator parameter; and (i) realizing the circuit. - View Dependent Claims (16, 17)
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Specification