Method and apparatus for identifying photocatalytic coatings
First Claim
1. A method of determining whether a photocatalytic coating is present on the surface of a glass substrate, the method comprising:
- providing a source of light energy, at least a portion of the light energy having a wavelength below 350 nanometers (nm);
directing light energy from the source toward the surface of the glass substrate;
detecting light energy reflected from the surface of the glass substrate;
measuring an intensity level of the reflected light energy at wavelengths below 350 nm; and
determining whether a photocatalytic coating having a thickness of less than 200 angstroms is present on the surface of the glass substrate based on the measured intensity level of reflected light energy at wavelengths below 350 nm.
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Accused Products
Abstract
A method of and apparatus for identifying the presence of thin photocatalytic (PCAT) coatings on glass surfaces. An apparatus is disclosed that can determine whether a PCAT coating (which may comprise titanium dioxide, for example) having a thickness of less than about 100 Å is present on the surface of a substrate such as glass. The apparatus may measure the reflectance of electromagnetic energy (such as light energy) at the surface of a substrate using energy at selected wavelengths or wavelength ranges. The apparatus may determine reflectance values for PCAT coated surfaces of any thickness, as well as for uncoated surfaces.
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Citations
21 Claims
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1. A method of determining whether a photocatalytic coating is present on the surface of a glass substrate, the method comprising:
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providing a source of light energy, at least a portion of the light energy having a wavelength below 350 nanometers (nm); directing light energy from the source toward the surface of the glass substrate; detecting light energy reflected from the surface of the glass substrate; measuring an intensity level of the reflected light energy at wavelengths below 350 nm; and determining whether a photocatalytic coating having a thickness of less than 200 angstroms is present on the surface of the glass substrate based on the measured intensity level of reflected light energy at wavelengths below 350 nm. - View Dependent Claims (2)
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3. A device for determining whether a photocatalytic coating is present on a surface of a glass substrate comprising:
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a source of light energy having wavelengths below 350 nanometers (nm); means for directing the light energy from the source toward a surface of the glass substrate; detector means for detecting light energy reflected from the surface of the glass substrate; measuring means for measuring an intensity level of light energy reflected from the surface of the glass substrate; and processing means for determining whether a photocatalytic coating having a thickness of less than 200 angstroms is present on the surface of the glass substrate based on the measured intensity level of reflected light energy. - View Dependent Claims (4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. A method of determining whether a photocatalytic coating is present on the surface of a glass substrate, the method comprising:
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providing a source of light energy; directing electromagnetic energy from the source toward the surface of the glass substrate, wherein at least a portion of the electromagnetic energy comprises energy having wavelengths below 350 nanometers (nm); detecting electromagnetic energy reflected from the surface of the glass substrate; measuring an intensity level of the reflected electromagnetic energy; and determining whether a photocatalytic coating having a thickness of less than 200 angstroms is present on the surface of the glass substrate based on the measured intensity level of the reflected electromagnetic energy. - View Dependent Claims (19)
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20. A method of measuring the thickness of a photocatalytic coating on a surface of a glass substrate, the method comprising:
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providing a source of light energy, at least a portion of the light energy having a wavelength below 350 nanometers (nm); directing light energy from the source toward the surface of the glass substrate; detecting light energy reflected from the surface of the glass substrate; measuring an intensity level of the reflected light energy at wavelengths below 350 nm; and determining the thickness of a photocatalytic coating having a thickness of less than 200 angstroms on the surface of the glass substrate based on the measured intensity level of reflected light energy at wavelengths below 350 nm.
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21. An apparatus for measuring the thickness of a photocatalytic coating on a glass substrate comprising:
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a source of light energy having wavelengths below 350 nanometers (nm); means for directing the light energy from the source toward a surface of the glass substrate; detector means for detecting light energy reflected from the surface of the glass substrate; measuring means for measuring an intensity level of light energy reflected from the surface of the glass substrate; and processing means for determining the thickness of a photocatalytic coating having a thickness of less than 200 angstroms on the surface of the glass substrate based on the measured intensity level of reflected light energy at wavelengths below 350 nm.
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Specification