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Methods and systems for semiconductor testing using reference dice

  • US 7,679,392 B2
  • Filed: 12/30/2008
  • Issued: 03/16/2010
  • Est. Priority Date: 07/05/2006
  • Status: Active Grant
First Claim
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1. A computer program product comprising a computer useable medium having computer readable program code embodied therein of semiconductor testing, the computer program product comprising:

  • computer readable program code for causing the computer to determine a group of semiconductor dice in a wafer which can be assumed to respond similarly to testing, wherein said group includes less than all dice in said wafer; and

    computer readable program code for causing the computer to select at least one reference die from said group for testing differently than other dice in said group which were not selected as reference dice, wherein said at least one reference die includes less than all dice in said group.

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