Signal integrity measurement systems and methods using a predominantly digital time-base generator

• US 7,681,091 B2
• Filed: 07/12/2007
• Issued: 03/16/2010
• Est. Priority Date: 07/14/2006
• Status: Expired due to Fees

• Current Assignee: DFT Microsystems, Inc.
• Original Assignee: DFT Microsystems, Inc.
• Inventors: Hafed, Mohamed M.
• Primary Examiner(s): TU, CHRISTINE TRINH LE
• Application Number:
  US11/776,825
• Publication Number:
  US 20080048726A1
• Time in Patent Office: 978 Days
• Field of Search: None
• US Class Current: 714/700
• CPC Class Codes: G01R 31/2882 Testing timing characteristics
• CPC Class Codes: G01R 31/31709 Jitter measurements; Jitter generators measuring jitter, noise figure or signal-to-noise ratio per se G01R29/26; analysis of tester signals G01R31/31901
• CPC Class Codes: G01R 31/31725 Timing aspects, e.g. clock distribution, skew, propagation delay for tester hardware G01R31/31937
• CPC Class Codes: G01R 31/31727 Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks G01R31/31725 takes precedence; concerning scan test G01R31/318552, for tester hardware G01R31/31922

Abstract

Signal-integrity measurement systems and methods utilizing unique time-base generation techniques for controlling the sampling of one or more signals under test. A time-base generator made in accordance with the present disclosure includes a phase filter and modulation circuitry that generates a rapidly varying phase signal as a function of the output of a sigma-delta modulator. The phase filter filters unwanted high-frequency phase components from the rapidly varying phase signal. The filtered signal is used to clock one or more samplers so as to create sampling instances of the signal(s) under test. The sampling instances are then analyze using any one or more of a variety of techniques suited to the type of signal(s) under test.

Claims

1. A tester for testing a circuit under test, comprising:

a time-base generator for generating a time-base signal as a function of a first clock signal, said time-base generator including;

modulation circuitry for generating a rapidly varying phase signal as a function of said first clock signal; and

a phase filter for receiving the rapidly varying phase signal and filtering therefrom unwanted high-frequency phase components so as to output the time-base signal; and

a sampler for sampling a signal under test as a function of the time-base signal so as to output a sampled signal.

2. The tester of claim 1, wherein said modulation circuitry includes clock-selection circuitry for continually selecting from among differing-delay versions of the first clock signal so as to generate the rapidly varying phase signal.

3. The tester of claim 2, wherein said modulation circuitry further includes a delay element for receiving said first clock signal and outputting a second clock signal phase-shifted relative to the first clock signal, said clock-selection circuitry comprising a multiplexer for receiving the first clock signal and the second clock signal.

4. The tester of claim 3, wherein said delay element is programmable in coarse increments.

5. The tester of claim 3, wherein said multiplexer includes an output and a select port, said modulation circuitry also including a selection signal generator in operative communication with said select port of said multiplexer and configured to generate a high-frequency selection signal for causing said multiplexer to continually select between the first clock signal and the second clock signal.

6. The tester of claim 5, wherein the high-frequency selection signal of said multiplexer is synchronized with the first and second clock signals.

7. The tester of claim 5, wherein said selection signal generator comprises a circular memory containing digital data.

8. The tester of claim 7, wherein said digital data is configured in accordance with sigma-delta modulation.

9. The tester of claim 7, wherein said digital data is configured in accordance with first-order pulse-density modulation.

10. The tester of claim 7, wherein said digital data is configured in accordance with pulse-width modulation.

11. The tester of claim 7, wherein said digital data represents a sigma-delta modulated constant ramp signal.

12. The tester of claim 11, wherein said digital data represents a first-order pulse-density modulated ramp signal.

13. The tester of claim 11, wherein said digital data represents a pulse-width modulated ramp signal.

14. The tester of claim 7, wherein said digital data represents a sigma-delta modulated DC signal.

15. The tester of claim 14, wherein said digital data represents a first-order pulse-density modulated DC signal.

16. The tester of claim 7, wherein said digital data represents a pulse-width modulated DC signal.

17. The tester in claim 5, wherein said selection signal generator comprises a sigma-delta modulator driven by a digital word generator.

18. The tester of claim 17, wherein said digital word generator represents a constant ramp output.

19. The tester of claim 17, wherein said digital word generator represents a constant, unchanging output.

20. The tester of claim 1, wherein said sampler comprises an analog-to-digital converter.

21. The tester of claim 1, wherein said sampler comprises a D-flip-flop.

22. The tester of claim 1, further comprising a voltage comparator for receiving the sampled signal.

23. The tester of claim 22, wherein said voltage comparator is configured to sample the signal under test so as to generate the sampled signal.

24. The tester of claim 22, wherein the sampled signal has a voltage and the tester further comprises a programmable reference generator for generating a reference voltage signal for sweeping said voltage, said voltage comparator configured to compare the swept reference voltage signal and the sampled signal with one another.

25. The tester of claim 22, wherein said voltage comparator has an output, the tester further including memory for storing the output for further analysis.

26. The tester of claim 1, wherein said phase filter comprises a phase-locked loop.

27. The tester of claim 1, wherein said modulation circuitry generates the rapidly varying phase signal as a function of digital data.

28. The tester of claim 27, wherein said digital data is configured in accordance with sigma-delta modulation.

29. The tester of claim 27, wherein said digital data is configured in accordance with first-order pulse-density modulation.

30. The tester of claim 27, wherein said digital data is configured in accordance with pulse-width modulation.

31. The tester of claim 27, wherein said digital data represents a sigma-delta modulated constant ramp signal.

32. The tester of claim 27, wherein said digital data represents a sigma-delta modulated DC signal.

33. The tester of claim 1, wherein the tester performs a plurality of cycles and further comprises a memory controller and test data capture memory having a plurality of storage locations, said memory controller configured for repeatingly storing output of said sampler in said plurality of storage locations during said plurality of cycles.

34. The tester of claim 1, further comprising:

a plurality of samplers for receiving a corresponding plurality of signals under test, each of said plurality of samplers responsive to the time-base signal of said time-base generator; and

a digital signal processor for receiving output of said plurality of samplers.

35. The tester of claim 34, further comprising an oscillator for driving said time-base generator and the circuit under test.

36. The tester of claim 34, wherein the circuit under test is located on a first integrated circuit chip and said time-base generator is located on a second integrated circuit chip.

37. The tester of claim 1, wherein the circuit under test is located on a first integrated circuit chip and said time-base generator is located on a second integrated circuit chip.

38. The tester of claim 1, wherein the circuit under test and said time-base generator are located on a common chip.

39. The tester of claim 1, further comprising:

an expected data memory for providing an expected data signal; and

a digital comparator for comparing said sampling signal to said expected data signal.

40. The tester of claim 39, further comprising an error counter in communication with said digital comparator for counting mismatch errors between said sampling signal and said expected data signal.

41. The tester of claim 39, further comprising a demultiplexer, responsive to said time-base signal, for demultiplexing said sampling signal for input into said digital comparator.

42. The tester of claim 1, further comprising a plurality of probe points each having a corresponding respective sampler associated therewith that is responsive to said time-base signal.

43. A tester of claim 42, further comprising memory behind each of said plurality of probe points.

44. The tester of claim 1, further comprising a memory and a digital signal processor controller for selectively collecting said sampled signal from said sampler and storing said sampled signal in said memory.

45. A method of testing a circuit under test, comprising:

stimulating the circuit under test to produce a response signal under test;

generating a rapidly varying phase signal as a function of a first clock signal;

filtering the rapidly varying phase signal to remove unwanted high-frequency phase components so as to generate a fine resolution time-base signal; and

sampling the response signal under test as a function of the time-base signal so as to provide a sampled signal under test.

46. The method of claim 45, wherein said generating of the rapidly varying phase signal includes continually selecting from among differing-delay versions of the first clock signal.

47. The method of claim 46, wherein said continually selecting from among said differing-delay versions of the first clock signal includes selecting from among said differing-delay versions as a function of a sigma-delta modulated repeating waveform.

48. The method of claim 47, wherein said continually selecting from among said differing-delay versions of the first clock signal includes selecting from among said differing-delay versions as a function of a digital representation of a sigma-delta modulated repeating waveform.

49. The method of claim 47, wherein said continually selecting from among said differing-delay versions of the first clock signal includes selecting from among said differing-delay versions as a function of a sigma-delta modulated constant ramp signal.

50. The method of claim 47, wherein said continually selecting from among said differing-delay versions of the first clock signal includes selecting from among said differing-delay versions as a function of a sigma-delta modulated DC signal.

51. The method of claim 46, wherein said generating of the rapidly varying phase signal includes delaying the first clock signal to create a second clock signal phase-shifted relative to the first clock signal, and rapidly selecting between the first clock signal and second clock signal in response to a digital signal so as to generate the rapidly varying phase signal.

52. The method of claim 51, wherein said delaying of the first clock signal includes imparting a coarse delay into the first clock signal.

53. The method of claim 51, further comprising storing the digital signal in a circular memory, said generating of the rapidly varying phase signal including cycling through the digital signal.

54. The method of claim 51, further comprising encoding the digital signal with the output of a sigma-delta modulator.

55. The method of claim 51, wherein said encoding of the digital signal includes encoding the digital signal in accordance with first-order pulse-density modulation.

56. The method of claim 51, wherein said encoding of the digital signal includes encoding the digital signal in accordance with first-order pulse-width modulation.

57. The method of claim 51, wherein said encoding of the digital signal includes encoding the digital signal with a sigma-delta modulated constant ramp signal.

58. The method of claim 51, wherein said encoding of the digital signal includes encoding the digital signal with a sigma-delta modulated DC signal.

59. The method of claim 46, wherein said continually selecting from among said differing-delay versions of the first clock signal includes cyclically reading a series of selection bits from a circular memory.

60. The method of claim 45, wherein said filtering of the rapidly varying phase signal includes filtering the rapidly varying phase signal using a phase-locked loop.

61. The method of claim 45, wherein said filtering of the rapidly varying phase signal includes filtering the rapidly varying phase signal using a delay-locked loop.

62. The method of claim 45, wherein said sampling of the signal under test includes sampling said test data using a D-flip-flop.

63. The method of claim 45, wherein said sampling of the signal under test includes sampling said test data using an analog-to-digital converter.

64. The method of claim 45, further comprising comparing the sampled signal under test to a reference signal.

65. The method of claim 64, wherein said comparing of the sampled signal under test to the reference signal includes comparing the sampled signal under test to a voltage-swept reference signal.

66. The method of claim 45, wherein the sampled signal under test has a first frequency and the time-base signal has a second frequency selected to ensure that a least common multiple exists as between the first frequency and the second frequency.

67. The method of claim 45, wherein the response signal under test includes a high-speed repeating serial pattern that is equivalent to a differing frequency clock signal.

68. The method of claim 45, further comprising calculating a bit-error rate as a function of the sampled signal under test.

69. The method of claim 68, wherein the calculating of the bit-error rate includes comparing the sampled signal under test to an expected data signal.

70. The method of claim 69, wherein the sampled signal under test has a speed and the method further comprises slowing the speed prior to comparing the sampled signal to the expected data signal for the purpose of calculating the bit-error rate.

71. The method of claim 45, wherein said sampling of the signal under test is performed over a plurality of cycles and the method further comprises writing and accumulating said sampling signal under test to a particular memory space over the plurality of cycles.

72. The method of claim 45, wherein said sampling of the signal under test is performed over a plurality of probe sites and the method further comprises writing the sampled signal under test from each of the plurality of probe sites to a respective memory.