×

Base and contour measuring system using the same

  • US 7,681,323 B2
  • Filed: 12/28/2007
  • Issued: 03/23/2010
  • Est. Priority Date: 07/26/2007
  • Status: Active Grant
First Claim
Patent Images

1. A contour measuring system comprising:

  • a base having;

    a first elastic element including two first spaced plates and a first connecting element connecting ends of the two first spaced plates at a same side, the two first spaced plates and the first connecting element cooperatively defining a first spacing;

    a second elastic element stacked on the first elastic element, the second elastic element including two second spaced plates and a second connecting element connecting ends of the two second spaced plates at a same side, the two second spaced plates and the second connecting element cooperatively defining a second spacing, wherein the first connecting element and the second connecting element are not in a same plane;

    at least one first adjustable spacer connecting the two first spaced plates of the first elastic element for adjusting a distance between the two first spaced plates; and

    at least one second adjustable spacer connecting the two second spaced plates of the second elastic element for adjusting a distance between the two second spaced plates; and

    a contour measuring probe disposed on the base, the contour measuring probe having a tip extension for touching a surface of an object.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×