Memory cell for storing a data bit value despite atomic radiation

• US 7,684,232 B1
• Filed: 09/11/2007
• Issued: 03/23/2010
• Est. Priority Date: 09/11/2007
• Status: Active Grant

• Current Assignee: Xilinx, Inc. (Advanced Micro Devices, Inc.)
• Original Assignee: Xilinx, Inc. (Advanced Micro Devices, Inc.)
• Inventors: Lesea, Austin H.
• Primary Examiner(s): Dinh; Son
• Assistant Examiner(s): Byrne; Harry W
• Application Number:
  US11/900,549
• Time in Patent Office: 924 Days
• Field of Search: 365/63, 365/72, 365/154, 365/156, 365/188, 257/368, 257/393
• US Class Current: 365/154
• CPC Class Codes: G11C 11/4125 Cells incorporating circuit means for protecting against loss of information
• CPC Class Codes: G11C 11/413 Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
• CPC Class Codes: H03K 19/00338 In field effect transistor circuits

Abstract

A memory cell stores a data bit value despite atomic radiation. The memory cell includes two inverters, an access circuit, and two switch circuits. Each inverter has an input and an output. The access circuit is arranged to write and read the data bit value in the memory cell. The switch circuits cross couple the outputs of the two inverters to the inputs of the two inverters. The switch circuits are arranged to alternately decouple and couple the inputs of the two inverters to limit corruption from atomic radiation of the data bit value in the memory cell.

Claims

1. A memory cell for storing a data bit value despite atomic radiation, the memory cell comprising:

two inverters comprising first and second inverters each having an input pin and an output pin;

an access circuit coupled to the two inverters, the access circuit arranged to write and read the data bit value in the memory cell; and

two switch circuits comprising first and second switch circuits cross coupling the output pins of the first and second inverters to the input pins of the second and first inverters, respectively, the two switch circuits arranged to alternately decouple and couple the input pins and the output pins of the two inverters for limiting corruption from the atomic radiation of the data bit value in the memory cell.

2. The memory cell of claim 1, wherein the atomic radiation comprises cosmic radiation or atomic byproducts of radioactive decay.

3. The memory cell of claim 1, wherein the data bit value in the memory cell remains uncorrupted in response to the atomic radiation that affects a value at the output pin of at least one of the two inverters within a time period in which the two switch circuits are decoupling the input pins from the output pins of the two inverters.

4. The memory cell of claim 1, wherein:

the first and second switch circuits include first and second transmission devices, respectively; and

the first transmission device couples the output pin of the first inverter to the input pin of the second inverter and the second transmission device couples the output pin of the second inverter to the input pin of the first inverter.

5. The memory cell of claim 4, wherein the access circuit includes a first and second transistor, the first transistor coupling a data line to the input pin of the second inverter and the second transistor coupling an inverted data line to the input pin of the first inverter.

6. The memory cell of claim 4, wherein the access circuit includes a first and second transistor, the first transistor coupling a data line to the output pin of the first inverter and the second transistor coupling an inverted data line to the output pin of the second inverter.

7. The memory cell of claim 4, wherein the first and second transmission devices comprise NMOS transistors that couple the output pins of the two inverters to the input pins of the two inverters in response to a voltage applied to respective gates of the NMOS transistors that is greater than a positive power supply voltage of the two inverters by at least a magnitude of a threshold voltage of the NMOS transistors.

8. The memory cell of claim 4, wherein the first and second transmission devices comprise PMOS transistors that couple the output pins of the two inverters to the input pins of the two inverters in response to a voltage applied to respective gates of the PMOS transistors that is less than a negative power supply voltage of the two inverters by at least a magnitude of a threshold voltage of the PMOS transistors.

9. The memory cell of claim 4, wherein the first and second transmission devices each comprise a parallel combination of an NMOS transistor and a PMOS transistor that couples the output pins of the two inverters to the input pins of the two inverters in response to a respective first voltage applied to a gate of each of the NMOS and PMOS transistors and that decouples the input pins from the output pins of the two inverters in response to a respective second voltage applied to the gates of the NMOS and PMOS transistors.

10. The memory cell of claim 1, wherein the two switch circuits decouple the input pins of the two inverters from the output pins of the two inverters within each occurrence of a clock period for greater than nine-tenths of the clock period.

11. The memory cell of claim 10, wherein the two switch circuits couple the output pins of the two inverters to the input pins of the two inverters within each occurrence of the clock period for a portion of the clock period less than the nine-tenths of the clock period.

12. The memory cell of claim 1, wherein the two switch circuits are arranged to alternately provide a high impedance and a low impedance at the input pins of the two inverters for limiting corruption from the atomic radiation of the data bit value stored in the memory cell.

13. The memory cell of claim 12, wherein the two switch circuits are arranged to concurrently provide the high impedance at the input pins of the two inverters.

14. The memory cell of claim 12, wherein the two switch circuits are arranged to provide the high impedance at the input pins of the two inverters during a fraction of each period of a clock signal that is greater than nine-tenths of the period.

15. The memory cell of claim 14, wherein the two switch circuits are arranged to provide the high impedance at the input pins of the two inverters during the fraction of each period that is greater than ninety-nine one-hundredths of the period.

16. The memory cell of claim 1, further comprising two capacitances, each coupled to the input pin of a respective one of the two inverters.

17. The memory cell of claim 16, wherein the data bit value in the memory cell is retained in the two capacitances in response to the atomic radiation affecting at least one of the two switch circuits.

18. The memory cell of claim 1, wherein the memory cell stores a value of a configuration bit for programming an array of programmable logic and interconnect resources of a programmable logic device.

19. A circuit for storing a data bit value in a memory cell despite atomic radiation, the circuit comprising:

means for writing the data bit value into the memory cell, the memory cell including first and second inverters;

means for transferring the data bit value from an output pin of the first inverter to an input pin of the second inverter via a first switch circuit;

means for transferring a complement of the data bit value from an output pin of the second inverter to an input pin of the first inverter via a second switch circuit;

means for repeatedly decoupling the input pins of the second and first inverters from the output pins of the first and second inverters with the first and second switch circuits, whereby corruption from the atomic radiation of the data bit value in the memory cell is limited; and

means for reading the data bit value from the memory cell.

20. The circuit of claim 19, further comprising:

means for retaining the data bit value in a first capacitance at the input pin of the second inverter in response to the atomic radiation affecting the first switch circuit; and

means for retaining the complement of the data bit value in a second capacitance at the input pin of the first inverter in response to the atomic radiation affecting the second switch circuit.