High performance, area efficient direct bitline sensing circuit
First Claim
1. A differential sense circuit for reading an 8 transistor (8T) memory cell, the differential sense circuit comprising:
- a differential input circuit having a pair of differential inputs and an output, wherein an output signal provided at the output is indicative of a difference between two signals received at the pair of differential inputs, wherein the difference is in accordance with a logic state read from the 8T memory cell; and
a sense amplifier coupled to the output, wherein the sense amplifier is operable to amplify a change in the output signal, the change being greater than a threshold, wherein the sense amplifier switches the output signal to have a voltage level corresponding to the logic state,wherein a first one of the pair of differential inputs is coupled to a soft ground level reference node of a read buffer of the 8T memory cell and a second one of the pair of differential inputs is coupled to a read bit line of the read buffer.
1 Assignment
0 Petitions
Accused Products
Abstract
In a method and apparatus for reading a logic state stored in an 8 transistor memory cell (8TMC), a differential sense circuit includes a differential input circuit having a pair of differential inputs and an output. An output signal is provided at the output and is indicative of a difference between two signals received at the pair of differential inputs. The difference is in accordance with the logic state read from the 8TMC. A sense amplifier is coupled to the output, the sense amplifier being operable to amplify the output signal that is greater than a threshold and switch the output signal to a voltage level corresponding to the logic state. The difference between the two signals measurable over a configurable time period is greater than a corresponding change in any one of the two signals measured over the same period, thereby improving the performance of the 8TMC.
13 Citations
19 Claims
-
1. A differential sense circuit for reading an 8 transistor (8T) memory cell, the differential sense circuit comprising:
-
a differential input circuit having a pair of differential inputs and an output, wherein an output signal provided at the output is indicative of a difference between two signals received at the pair of differential inputs, wherein the difference is in accordance with a logic state read from the 8T memory cell; and a sense amplifier coupled to the output, wherein the sense amplifier is operable to amplify a change in the output signal, the change being greater than a threshold, wherein the sense amplifier switches the output signal to have a voltage level corresponding to the logic state, wherein a first one of the pair of differential inputs is coupled to a soft ground level reference node of a read buffer of the 8T memory cell and a second one of the pair of differential inputs is coupled to a read bit line of the read buffer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
-
-
13. A method for reading a logic state stored in an 8 transistor (8T) memory cell, the method comprising:
-
coupling a soft ground level reference node of a read buffer of the 8T memory cell to one of two differential inputs of a differential sense amplifier, wherein a second one of the two differential inputs is coupled to a read bit line of the read buffer; and detecting a differential voltage across the two differential inputs to read the logic state, wherein a change in the differential voltage is indicative of the logic state. - View Dependent Claims (14, 15, 16, 17)
-
-
18. A memory device comprising:
-
an array formed by a plurality of rows and a plurality of columns of an 8 transistor (8T) memory cell; a differential input circuit having a pair of differential inputs and an output, wherein an output signal provided at the output is a difference between two signals received at the pair of differential inputs, wherein the difference is indicative of a logic state read from the 8T memory cell, wherein the differential input circuit includes; a pull-up circuit shared between selected ones of the plurality of columns of the array, wherein the pull-up circuit is operable to couple the output to a logic high level during an initialization phase; a pull-down circuit corresponding to each of the selected ones of the plurality of columns, wherein the pull-down circuit is coupled to receive the pair of differential inputs and provide the output signal at the output; and a sense amplifier coupled to the output, wherein the sense amplifier is shared between the selected ones of the plurality of columns of the array, wherein the sense amplifier is operable to amplify the output signal to the logic state in response to the difference being greater than a threshold. - View Dependent Claims (19)
-
Specification