Method and apparatus for calibrating an RDAC for end-to-end tolerance correction of output resistance

• US 7,688,240 B2
• Filed: 05/02/2008
• Issued: 03/30/2010
• Est. Priority Date: 05/02/2008
• Status: Active Grant

• Current Assignee: Analog Devices, Inc.
• Original Assignee: Analog Devices, Inc.
• Inventors: Jha, Kaushal Kumar, Jain, Dinesh
• Primary Examiner(s): JEAN PIERRE, PEGUY
• Application Number:
  US12/113,946
• Publication Number:
  US 20090273497A1
• Time in Patent Office: 697 Days
• Field of Search: 341/154, 341/118, 341/120, 341/144
• US Class Current: 341/120
• CPC Class Codes: H03M 1/1028 at two points of the transfer characteristic, i.e. by adjusting two reference values, e.g. offset and gain error gain setting for range control H03M1/18
• CPC Class Codes: H03M 1/682 both converters being of the unary decoded type
• CPC Class Codes: H03M 1/765 using a single level of switches which are controlled by unary decoded digital signals

Abstract

A system and method for calibrating an RDAC to obtain an expected resistance are disclosed. In one embodiment, a method of obtaining an expected resistance from an RDAC circuit includes receiving a digital signal comprising a digital code by an on-chip calibration code engine, automatically deriving a calibrated digital code based on resistance versus digital code characteristic curves of an expected RDAC and the RDAC associated with the calibration code engine, and inputting the calibrated digital code into the RDAC associated with the calibration code engine to obtain an expected resistance. The method also includes forming the resistance versus digital code characteristic curves of the expected RDAC and the RDAC, computing a gain error and an offset error using the formed resistance versus digital code characteristic curves of the RDAC and the expected RDAC and storing the gain error and the offset error in a non-volatile/volatile RDAC memory.

Claims

1. A method of calibrating a resistor digital-to-analog converter (RDAC), comprising:

receiving a digital signal comprising a digital code by an RDAC; and

automatically deriving a calibrated digital code based on resistance versus digital code characteristic curves of an expected RDAC and the RDAC for end-to-end tolerance correction in output resistance of the RDAC to obtain an expected resistance.

2. The method of claim 1, further comprising:

inputting the calibrated digital code into the RDAC to obtain an expected resistance.

3. The method of claim 1, wherein automatically deriving the calibrated digital code based on resistance versus digital code characteristic curves comprises:

automatically deriving the calibrated digital code based on parameters associated with the resistance versus digital code characteristic curves of the expected RDAC and the RDAC.

4. The method of claim 3, wherein the parameters comprise offset error and gain error.

5. The method of claim 4, wherein automatically deriving the calibrated digital code comprises:

computing the calibrated digital code for each received digital code using the offset error and the gain error.

6. The method of claim 5, further comprising:

storing the offset error and the gain error in memory.

7. The method of claim 4, wherein automatically deriving the calibrated digital code comprises:

forming a look-up table of the received digital codes versus associated calibrated digital codes;

storing the look-up table in a non-volatile/volatile RDAC memory; and

automatically obtaining the calibrated digital code for the received digital code using the stored look-up table.

8. A method of obtaining an expected resistance from an RDAC (resistor digital-to-analog converter) circuit comprising:

receiving a digital signal comprising a digital code by an on-chip calibration code engine;

automatically deriving a calibrated digital code based on resistance versus digital code characteristic curves of an expected RDAC and an on-chip RDAC associated with the on-chip calibration code engine; and

inputting the calibrated digital code from the on-chip calibration code engine into the RDAC associated with the on-chip calibration code engine to obtain an expected resistance.

9. The method of claim 8, further comprising:

forming the resistance versus digital code characteristic curves of the expected RDAC and the RDAC;

computing a gain error and an offset error using the formed resistance versus digital code characteristic curves of the RDAC and the expected RDAC; and

storing the gain error and the offset error in a non-volatile/volatile RDAC memory.

10. The method of claim 8, wherein automatically deriving the calibrated digital code comprises:

forming a look-up table of the received digital codes versus associated calibrated digital codes;

storing the look-up table in a non-volatile/volatile RDAC memory; and

automatically obtaining the calibrated digital code for the received digital code using the stored look-up table.

11. An RDAC circuit, comprising:

a calibration code engine configured to supply a calibrated digital code to a digital input array upon receiving a digital signal including a digital code; and

a resistor digital to analog converter (RDAC) coupled to the calibration code engine, the resistor digital to analog converter including the digital input array and an analog output node, wherein the RDAC is configured to receive the calibrated digital code and output an expected resistance and wherein the calibrated digital code is derived from resistance versus digital code characteristic curves of an expected RDAC and the RDAC associated with the RDAC circuit to obtain the expected resistance.

12. The RDAC circuit of claim 11, wherein the RDAC further comprises:

high and low analog reference voltage nodes;

first and second separate outer strings of respective predetermined series connected resistors, one end of the first outer resistor string being connected to the high reference voltage node and one end of the second outer resistor string being connected to the low reference voltage node, the resistors of each outer string being connected directly in series;

an inner string of series connected resistors; and

first and second outer switch networks connected respectively to the first and second outer resistor strings to provide selectable unbuffered taps from the outer resistor strings to opposite ends of the inner resistor string to provide a selectable tap from the inner resistor string to the output node.

13. The RDAC circuit of claim 12, where the RDAC further comprises:

a decoder which responds to the received calibrated digital code by controlling the first and second outer switch networks to switch selected portions of the outer resistor strings into a series connection with said inner resistor string, the selected portions having a substantially constant aggregate series resistance over the switching ranges of the outer switch networks, the decoder further controlling the inner switch network to tap the inner resistor string at a location whose analog resistance level corresponds to the digital input signal, wherein the number and resistance values of the resistors in the outer resistor strings decrementing the voltage between the high and low reference voltage nodes in a maimer that corresponds to either the most significant hits (MSBs) or the least significant bits (LSBs) of the input digital signal, and the number and resistance values of the resistors in the inner resistor string decrementing the voltage between the outer resistor strings in a manner that corresponds to the other of the MSBs and LSBs.

14. The RDAC circuit of claim 13, wherein the decoder alters the switching pattern of the outer switch networks in response to a change in the input digital signal by first altering the switching switch network for the outer string that results in an increase in the total resistance between the high or low reference voltage nodes and the analog output node, and then altering the switching pattern of the switch network for the other outer string.

15. The RDAC circuit of claim 13, wherein the digital code comprises N bits and the DAC is configured to computationally process N plus one or more bits of digital input.

16. The RDAC circuit of claim 15, wherein a maximum resistance of the digital to analog converter equal to or greater than a desired maximum resistance divided by an over range factor, the over range factor equal to one minus a maximum expected sheet resistivity variation percentage.

17. The RDAC circuit of claim 13, wherein the first and second outer resistor strings have equal number of resistors with substantially equal resistances.

18. The RDAC circuit of claim 13, wherein each MSB resistor string includes 2^N/2−

1 equal value resistors.

19. The RDAC circuit of claim 18, wherein each LSB resistor string includes 2^N/2 equal value resistors.

20. The RDAC circuit of claim 19, wherein the resistance value of each resistor in each MSB resistor string is 2^N/2 times the resistance value of each resistor in each LSB resistor string.

21. The RDAC circuit of claim 13, further comprising:

memory for storing parameters associated with the resistance versus the digital code characteristic curve of RDAC.

22. The RDAC circuit of claim 21, wherein the memory comprises a non-volatile/volatile RDAC memory.