Color sensor

• US 7,688,447 B2
• Filed: 02/24/2006
• Issued: 03/30/2010
• Est. Priority Date: 12/29/2005
• Status: Active Grant

• Current Assignee: Honeywell International Inc.
• Original Assignee: Honeywell International Inc.
• Inventors: Shakespeare, John F., Shakespeare, Tarja T.
• Primary Examiner(s): PUNNOOSE, ROY M
• Application Number:
  US11/362,582
• Publication Number:
  US 20070153277A1
• Time in Patent Office: 1,495 Days
• Field of Search: 356/402, 356/417
• US Class Current: 356/402
• CPC Class Codes: G01J 2003/1282 Spectrum tailoring
• CPC Class Codes: G01J 2003/468 of objects containing fluorescent agent
• CPC Class Codes: G01J 3/10 Arrangements of light sources specially adapted for spectrometry or colorimetry
• CPC Class Codes: G01J 3/50 using electric radiation detectors
• CPC Class Codes: G01J 3/501 Colorimeters using spectrally-selective light sources, e.g. LEDs
• CPC Class Codes: G01J 3/524 Calibration of colorimeters
• CPC Class Codes: G01N 21/86 Investigating moving sheets G01N21/89 takes precedence

Abstract

Devices, systems, and methods for measuring the color of a sample are disclosed. The exemplary device may have one or more light emitting diodes for directing a beam of ultraviolet light onto the sample and may also have one or more light emitting diodes for directing a beam of visible light onto the sample. The exemplary device may have a component for controlling the timing and power of operation of each light emitting diode. The exemplary device may also have at least one light detector for receiving the beam of light reflected from or transmitted through the sample and measuring at least one wavelength band of the received light. The exemplary device may further have a measurement analyzer for determining the color of the sample based on the measured light. The color may be determined for a specified illuminator incorporating effects of fluorescence.

Claims

1. An apparatus for measuring one or more characteristics of a sample, the apparatus comprising:

at least one light emitting diode configured to illuminate an area of the sample with first light, the first light including at least one band of ultraviolet light;

a detector configured to receive second light and to measure a spectral power distribution of the second light in a plurality of wavelength bands substantially spanning at least a visible range of light to form a measured spectral power distribution, the second light based on the first light that has interacted with the sample; and

an analyzer configured to determine the one or more characteristics of the sample using the measured spectral power distribution.

2. The apparatus of claim 1, wherein the at least one light emitting diode and the detector are on a same side of the sample.

3. The apparatus of claim 2, further comprising at least two backings on an opposite side of the sample, the backings having substantially different known reflectivities in the visible range;

wherein the analyzer is configured to employ at least one measured spectral power distribution obtained with each of the backings.

4. The apparatus of claim 1, wherein the at least one light emitting diode and the detector are on different sides of the sample.

5. The apparatus of claim 1, further comprising at least one additional light emitting diode configured to emit at least one band of visible light.

6. The apparatus of claim 1, wherein the at least one light emitting diode is configured to emit the at least one band of ultraviolet light and at least one band of visible light.

7. The apparatus of claim 1, further comprising at least one additional light emitting diode configured to illuminate the area of the sample with light that substantially spans at least the visible range.

8. The apparatus of claim 1, further comprising a controller configured to control the at least one light emitting diode such that the at least one light emitting diode produces the at least one band of ultraviolet light in an intermittent manner.

9. The apparatus of claim 1, further comprising a controller configured to control operation of the at least one light emitting diode such that an intensity of the first light is varied.

10. The apparatus of claim 1, further comprising a controller configured to control operation of the at least one light emitting diode such that the first light has at least one desired spectral power distribution.

11. The apparatus of claim 10, wherein the analyzer is configured to employ multiple measured spectral power distributions obtained using multiple spectral power distributions of the first light.

12. The apparatus of claim 11, wherein the analyzer is configured to determine the one or more characteristics of the sample for a specified illumination that is not expressible as an exact linear combination of the spectral power distributions used to illuminate the sample, such that an interval of the one or more characteristics is determined for a range of linear combinations that bracket the specified illumination.

13. The apparatus of claim 1, wherein the first light also includes at least one band of visible light, and further comprising:

one or more optical elements configured to divide the first light, such that a first portion of the first light is used to illuminate the sample and a second portion of the first light is not used to illuminate the sample; and

a second detector configured to receive the second portion of the first light and to measure a spectral power distribution of the second portion of the first light in the plurality of wavelength bands substantially spanning at least the visible range to form a reference spectral power distribution.

14. The apparatus of claim 13, wherein the analyzer is configured to employ both the measured spectral power distribution and the reference spectral power distribution.

15. The apparatus of claim 13, further comprising a controller configured to control operation of the at least one light emitting diode such that the reference spectral power distribution is a desired spectral power distribution.

16. The apparatus of claim 1, wherein the at least one light emitting diode is provided with one or more optical elements configured to modify at least one characteristic of the first light.

17. The apparatus of claim 16, wherein the at least one modified characteristic of the first light comprises a spatial intensity distribution.

18. The apparatus of claim 16, wherein the at least one modified characteristic of the first light comprises a spectral power distribution of the first light.

19. The apparatus of claim 16, wherein the at least one modified characteristic of the first light comprises a state of polarization.

20. A method for detecting one or more characteristics of a sample, comprising:

supplying power to at least one visible light emitting diode;

directing a first beam of light from the at least one visible light emitting diode onto a sample;

supplying power to at least one ultraviolet light emitting diode;

directing a second beam of light from the at least one ultraviolet light emitting diode onto the sample;

detecting visible light and ultraviolet light that have interacted with the sample, wherein the visible light and ultraviolet light that have interacted with the sample are based on the first and second beams of light; and

determining the one or more characteristics of the sample based on the detected visible light and ultraviolet light.

21. The method of claim 20, wherein supplying power to the at least one ultraviolet light emitting diode is performed intermittently.

22. The method of claim 20, wherein:

supplying the power to the at least one visible light emitting diode comprises supplying the power via a first circuit board; and

supplying the power to the at least one ultraviolet light emitting diode comprises supplying the power via a second circuit board.

23. The method of claim 20, wherein supplying the power to the at least one ultraviolet light emitting diode is performed by varying a current supplied to the at least one ultraviolet light emitting diode.