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Methods and apparatus for sensing characteristics of the contents of a process abatement reactor

  • US 7,700,049 B2
  • Filed: 10/31/2006
  • Issued: 04/20/2010
  • Est. Priority Date: 10/31/2005
  • Status: Expired due to Fees
First Claim
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1. An apparatus for use during the abatement of a semiconductor manufacturing process comprising:

  • a thermal reaction unit having;

    an interior porous wall that defines a central chamber, the interior porous wall formed from a plurality of stacked ceramic sections;

    at least one waste gas inlet in fluid communication with the central chamber, adapted to introduce a gaseous waste stream to the central chamber, and disposed so as to direct the gaseous waste stream away from the interior porous wall of the chamber;

    a thermal mechanism positioned within the central chamber and adapted to decompose the gaseous waste stream within the central chamber, thereby forming reaction products; and

    a fluid delivery system adapted to provide a fluid to the central chamber through the interior porous wall with sufficient pressure to reduce deposition of reaction products on an inner surface of the interior porous wall of the central chamber.

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