Apparatus, system, and method for detecting cracking within an aftertreatment device
First Claim
1. An apparatus for detecting cracking in an aftertreatment device, the apparatus comprising:
- an aftertreatment device comprising a substrate and a substrate surface;
a conductive material forming at least one conduction path bonded to the substrate surface;
a plurality of access points conductively coupled to the at least one conduction path;
a degradation module that determines at least one degradation value for the aftertreatment device, the degradation value being based on a resistance value across the at least one conduction path; and
an event detection module that determines a degradation event on the aftertreatment device based at least partially on a high temperature event experienced by the aftertreatment device.
1 Assignment
0 Petitions
Accused Products
Abstract
An apparatus, system, and method are disclosed for detecting cracking in a particulate filter. The method may include providing an apparatus comprising an aftertreatment device with a substrate and a substrate surface, a conductive material forming a conduction path bonded to the surface of the substrate surface, and access points configured to allow a resistance measurement of the conduction path. The method may include measuring the resistance of the conduction path, and determining if one or more cracks have occurred on the substrate surface based on the resistance measurement. The method may further include labeling the degradation level of the aftertreatment device based on the indicated amount of cracking, and replacing the aftertreatment device with an equivalent aftertreatment device, based on the degradation level, after a service event.
-
Citations
27 Claims
-
1. An apparatus for detecting cracking in an aftertreatment device, the apparatus comprising:
-
an aftertreatment device comprising a substrate and a substrate surface; a conductive material forming at least one conduction path bonded to the substrate surface; a plurality of access points conductively coupled to the at least one conduction path; a degradation module that determines at least one degradation value for the aftertreatment device, the degradation value being based on a resistance value across the at least one conduction path; and an event detection module that determines a degradation event on the aftertreatment device based at least partially on a high temperature event experienced by the aftertreatment device. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
-
-
17. A method of detecting fractures in an aftertreatment device, the method comprising:
-
providing an apparatus comprising;
an aftertreatment device comprising a substrate and a substrate surface, a conductive material forming at least one conduction path bonded to the substrate surface, and a plurality of access points conductively coupled to the at least one conduction path;measuring resistance values between two of the plurality of access points; determining a plurality of degradation values for the aftertreatment device based on the resistance values, wherein the plurality of degradation values are determined at predetermined time intervals; and predicting at least one degradation event on the aftertreatment device, wherein the predetermined time intervals are based on an estimated duration of the predicted at least one degradation event on the aftertreatment device. - View Dependent Claims (18, 19, 20, 21, 22, 23)
-
-
24. A system for detecting cracking in an aftertreatment device, the system comprising:
-
an aftertreatment device configured to treat exhaust gas from an internal combustion engine, the aftertreatment device comprising a substrate and a substrate surface; a conductive material forming at least one conduction path bonded to the substrate surface; a plurality of access points conductively coupled to the at least one conduction path; an event detection module that determines a degradation event on the aftertreatment device; a degradation module that determines a plurality of degradation values for the aftertreatment device, wherein each degradation value is based on a resistance value across the at least one conduction path; and a cracking history module that stores a rolling buffer of the determined degradation values, wherein degradation values determined during a predetermined time period prior to the degradation event are stored as a pre-event degradation value and degradation values determined during a predetermined time period after the degradation event are stored as a post-event degradation value, wherein crack detection is based at least partially on a comparison between the pre-event and post-event degradation values. - View Dependent Claims (25, 26, 27)
-
Specification