Predictive, adaptive power supply for an integrated circuit under test
First Claim
1. A testing apparatus for testing a semiconductor device according to a test sequence, comprising:
- a tester configured to determine expected input demand at a power terminal of the semiconductor device individually for each cycle of the test sequence for the semiconductor device; and
a power supply coupled to the power terminal of the semiconductor device to supply power to the semiconductor device; and
an adjustment circuit configured to vary the supplied power to the semiconductor device in accordance with the expected input demand during testing of the semiconductor device.
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Accused Products
Abstract
A main power source supplies current through path impedance to a power terminal of an integrated circuit device under test (DUT). The DUT'"'"'s demand for current at the power input terminal temporarily increases following edges of a clock signal applied to the DUT during a test as transistors within the IC switch in response to the clock signal edges. To limit variation (noise) in voltage at the power input terminal, an auxiliary power supply supplies an additional current pulse to the power input terminal to meet the increased demand during each cycle of the clock signal. The magnitude of the current pulse is a function of a predicted increase in current demand during that clock cycle, and of the magnitude of an adaption signal controlled by a feedback circuit provided to limit variation in voltage developed at the DUT'"'"'s power input terminal.
44 Citations
27 Claims
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1. A testing apparatus for testing a semiconductor device according to a test sequence, comprising:
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a tester configured to determine expected input demand at a power terminal of the semiconductor device individually for each cycle of the test sequence for the semiconductor device; and a power supply coupled to the power terminal of the semiconductor device to supply power to the semiconductor device; and an adjustment circuit configured to vary the supplied power to the semiconductor device in accordance with the expected input demand during testing of the semiconductor device. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A testing apparatus for testing a semiconductor device according to a test sequence provided by a tester, comprising:
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a means for determining expected input demand at a power terminal of the semiconductor device individually for each cycle of a test sequence for the semiconductor device; a means for testing the semiconductor device in accordance with the test sequence; and a means for providing varying power to the semiconductor device in accordance with the expected input demand during the testing. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A method of testing a semiconductor device using a test apparatus, comprising:
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determining expected input demand at a power terminal of the semiconductor device individually for each cycle of a test sequence for the semiconductor device; testing the semiconductor device in accordance with the test sequence; and providing varying power to the semiconductor device in accordance with the expected input demand during the testing. - View Dependent Claims (16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27)
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Specification