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System and method for screening semiconductor lasers

  • US 7,723,659 B1
  • Filed: 10/10/2008
  • Issued: 05/25/2010
  • Est. Priority Date: 10/10/2008
  • Status: Active Grant
First Claim
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1. A method of screening a semiconductor laser comprising:

  • (a) operating the laser at a first of a number (D) of discrete drive currents in a range of drive currents;

    (b) acquiring a number (N) of frames of data from a sensor in an optical navigation system (ONS) receiving speckle pattern in light from the laser reflected from a surface proximal to the ONS, the sensor data including differential signal values;

    (c) calculating an average differential signal value (AVG value) for the N frames of data;

    (d) sorting the N frames of data across a plurality of bins, the plurality of bins including at least a Bin

    0 for frames of data having a differential signal value within a predetermined amount of the AVG value; and

    (e) determining if a number of frames of data in any of the plurality of bins other than Bin

    0 exceed a predetermined threshold, and if the number of frames of data in any of the plurality of bins exceed the predetermined threshold, recording the drive current.

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