Integrated circuit protection and detection grid
First Claim
1. A protection circuit for integrity monitoring of an electronic device comprisinga first grid check line interleaved between a first set of conductor lines, each distributing a first potential reference to the electronic device,a second grid check line interleaved between a second set of conductor lines, each distributing a second potential reference to the electronic device, anda grid check circuit coupled to the first and second grid check lines,wherein the first and second grid check lines are configured to provide first and second voltage references, respectively, to the grid check circuit for monitoring the integrity of the electronic device.
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Accused Products
Abstract
A mesh of conductors forms a grid in a multi-layered electronic device. The mesh of conductors includes (1) a first set of conductors disposed in one layer forming parallel lines in the one layer, and (2) a second set of conductors disposed in another layer forming parallel lines in the other layer. The first set of conductors is configured to provide a first voltage reference, and the second set of conductors is configured to provide a second voltage reference. At least one grid check circuit is coupled to the first set of conductors and the second set of conductors for monitoring presence and/or absence of the first or second voltage references. The parallel lines formed in the one layer and the parallel lines formed in the other layer are substantially perpendicular to each other.
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Citations
20 Claims
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1. A protection circuit for integrity monitoring of an electronic device comprising
a first grid check line interleaved between a first set of conductor lines, each distributing a first potential reference to the electronic device, a second grid check line interleaved between a second set of conductor lines, each distributing a second potential reference to the electronic device, and a grid check circuit coupled to the first and second grid check lines, wherein the first and second grid check lines are configured to provide first and second voltage references, respectively, to the grid check circuit for monitoring the integrity of the electronic device.
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13. A mesh of conductors forming a grid in a multi-layered electronic device comprising
a first set of conductors disposed in one layer forming parallel lines in the one layer, a second set of conductors disposed in another layer forming parallel lines in the other layer, the first set of conductors configured to provide a first voltage reference, and the second set of conductors configured to provide a second voltage reference, at least one grid check circuit, coupled to the first set of conductors and the second set of conductors, for monitoring presence and/or absence of at least one of the first or second voltage references.
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20. A method for integrity monitoring of a multi-layered electronic device, comprising the steps of:
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(a) distributing a first potential reference by way of one conducting layer of the electronic device; (b) distributing a second potential reference by way of another conducting layer of the electronic device; (c) distributing a first voltage reference, which is different from the first potential reference in the one conducting layer; (d) distributing a second voltage reference, which is different from the second potential reference in the other conducting layer; and (e) periodically monitoring the distribution of the first and second voltage references to determine the integrity of the multi-layered electronic device.
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Specification