Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle
First Claim
1. A computer-implemented method for sorting defects in a design pattern of a reticle, comprising:
- searching for defects of interest in inspection data using priority information and defect attributes associated with individual defects in combination with one or more characteristics of a region proximate the individual defects and one or more characteristics of the individual defects, wherein the inspection data is generated by comparing images of the reticle to each other to detect the individual defects in the design pattern of the reticle, wherein the images that are compared to each other are generated for different values of a lithographic variable, wherein the images comprise at least one reference image and at least one modulated image, and wherein the priority information is derived from a relationship between the individual defects and their corresponding modulation levels of the lithographic variable; and
assigning one or more identifiers to the defects of interest.
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Accused Products
Abstract
Various computer-implemented methods are provided. One method for sorting defects in a design pattern of a reticle includes searching for defects of interest in inspection data using priority information associated with individual defects in combination with one or more characteristics of a region proximate the individual defects. The priority information corresponds to modulation levels associated with the individual defects. The inspection data is generated by comparing images of the reticle generated for different values of a lithographic variable. The images include at least one reference image and at least one modulated image. A composite reference image can be generated from two or more reference images. The method also includes assigning one or more identifiers to the defects of interest. The identifier(s) may include, for example, a defect classification and/or an indicator identifying if the defects of interest are to be used for further processing.
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Citations
19 Claims
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1. A computer-implemented method for sorting defects in a design pattern of a reticle, comprising:
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searching for defects of interest in inspection data using priority information and defect attributes associated with individual defects in combination with one or more characteristics of a region proximate the individual defects and one or more characteristics of the individual defects, wherein the inspection data is generated by comparing images of the reticle to each other to detect the individual defects in the design pattern of the reticle, wherein the images that are compared to each other are generated for different values of a lithographic variable, wherein the images comprise at least one reference image and at least one modulated image, and wherein the priority information is derived from a relationship between the individual defects and their corresponding modulation levels of the lithographic variable; and assigning one or more identifiers to the defects of interest. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. A storage medium, comprising program instructions executable on a computer system to perform a computer-implemented method for sorting defects in a design pattern of a reticle, wherein the computer-implemented method comprises:
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searching for defects of interest in inspection data using priority information and defect attributes associated with individual defects in combination with one or more characteristics of a region proximate the individual defects and one or more characteristics of the individual defects, wherein the inspection data is generated by comparing images of the reticle to each other to detect the individual defects in the design pattern of the reticle, wherein the images that are compared to each other are generated for different values of a lithographic variable, wherein the images comprise at least one reference image and at least one modulated image, and wherein the priority information is derived from a relationship between the individual defects and their corresponding modulation levels of the lithographic variable; and assigning one or more identifiers to the defects of interest.
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19. A system configured to sort defects in a design pattern of a reticle, comprising:
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an inspection tool configured to generate image data for a wafer that contains information about the design pattern printed on the wafer by the reticle; a processor configured to receive the image data; and a storage medium comprising program instructions executable on the processor for performing a computer-implemented method, wherein the computer-implemented method comprises; generating inspection data by comparing the image data to each other to detect individual defects in the design pattern of the reticle, wherein the image data that is compared to each other is generated for different values of a lithographic variable, and wherein the image data comprises at least one reference image and at least one modulated image; searching for defects of interest in the inspection data using priority information and defect attributes associated with the individual defects in combination with one or more characteristics of a region proximate the individual defects and one or more characteristics of the individual defects, wherein the priority information is derived from a relationship between the individual defects and their corresponding modulation levels of the lithographic variable; and assigning one or more identifiers to the defects of interest.
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Specification