Dynamic voltage scaling
First Claim
1. A method for dynamically controlling maximum operating frequency of an integrated circuit (IC) using one or more integral oscillators, the method comprising:
- measuring current frequency of operation for certain of the one or more oscillators;
identifying an operating point of the IC based on the current frequency and stored information, the stored information including a current voltage; and
adjusting one or more operating voltages of the IC to obtain a desired frequency of operation of the oscillator,wherein each oscillator comprises a plurality of logic gates, the plurality of logic gates forming a ring and being positioned on the IC to provide a representative indication of the operating point, wherein the IC comprises a second circuit that comprises a gate that is unused by said second circuit, wherein said gate is utilized as a logic element of at least one of the one or more oscillators to monitor operating conditions of said second circuit.
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Abstract
An apparatus and method for dynamically controlling the maximum frequency of operation of the IC is provided. The invention optimizes power consumption in a device by measuring a current maximum frequency of operation and adjusting IC operating voltage to provide a desired maximum operating frequency. The invention provides an apparatus and method for controlling multiple voltages in an IC to independently adjust maximum operating frequencies for a plurality of separate portions of the IC. The invention may equally be applied to a group of ICs. The invention further provides a method for calibrating an IC. Thus, the apparatus facilitates the operation of an IC at a minimum voltage for a selected maximum frequency, thereby minimizing power consumption overall a wide range of operating frequencies.
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Citations
26 Claims
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1. A method for dynamically controlling maximum operating frequency of an integrated circuit (IC) using one or more integral oscillators, the method comprising:
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measuring current frequency of operation for certain of the one or more oscillators; identifying an operating point of the IC based on the current frequency and stored information, the stored information including a current voltage; and adjusting one or more operating voltages of the IC to obtain a desired frequency of operation of the oscillator, wherein each oscillator comprises a plurality of logic gates, the plurality of logic gates forming a ring and being positioned on the IC to provide a representative indication of the operating point, wherein the IC comprises a second circuit that comprises a gate that is unused by said second circuit, wherein said gate is utilized as a logic element of at least one of the one or more oscillators to monitor operating conditions of said second circuit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. An apparatus for optimizing power consumption and frequency of operation in an IC, the apparatus comprising:
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a ring oscillator including a plurality of logic gates located on the IC, wherein the IC comprises a second circuit that comprises a gate that is unused by said second circuit, wherein said gate is utilized as a logic element of the ring oscillator to monitor operating conditions of said second circuit; a counter for measuring cycles of the ring oscillator in a predetermined interval; a variable voltage source providing voltages to the IC, wherein voltage level is set to obtain a desired frequency of operation, wherein the measured cycles are compared to stored values to obtain a current operating point, and the voltage level is set based on the current operating point. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24, 25)
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26. A method for characterizing an IC, the method comprising:
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setting a voltage of operation for the IC; after said setting, measuring frequency of operation of an oscillator integral to the IC, the oscillator comprises a plurality of logic gates, wherein the IC comprises a second circuit that comprises a gate that is unused by said second circuit, wherein said gate is a logic element of the oscillator that monitors operating conditions of said second circuit; obtaining a temperature of the IC; recording, in a table, the voltage, temperature and frequency; and iteratively repeating the setting, measuring, obtaining and recording for a desired range of voltage and temperatures.
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Specification