Substrate labeling system
First Claim
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1. A method for labeling a material, the method comprising:
- focusing a first high energy electromagnetic or particle wave generator, producing a wave transmissible to a subsurface of a material without causing any substantial disruption of the surface of the material, on a first portion of said subsurface;
focusing one or more second high energy electromagnetic or particle wave generator(s), producing a wave transmissible to a subsurface of said material without causing any substantial disruption of the surface of said material, on said first portion of said subsurface;
wherein the first and second generators are set in combination to allow for marking said first portion of said subsurface without any substantial disruption of the surface of said material, but the setting individually of which alone does not allow for said marking of said first portion of said substrate.
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Abstract
In an embodiment, there is disclosed a product labeling system comprising: a first high energy electromagnetic or particle wave generator, at least one second high energy electromagnetic of particle wave generator; and a controller operatively configured to direct wave produced by said first generator and the wave produced by said second generator onto a portion of the subsurface of the product to mark the product at said subsurface without generating any substantial disruption of the surface of said product.
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Citations
20 Claims
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1. A method for labeling a material, the method comprising:
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focusing a first high energy electromagnetic or particle wave generator, producing a wave transmissible to a subsurface of a material without causing any substantial disruption of the surface of the material, on a first portion of said subsurface; focusing one or more second high energy electromagnetic or particle wave generator(s), producing a wave transmissible to a subsurface of said material without causing any substantial disruption of the surface of said material, on said first portion of said subsurface; wherein the first and second generators are set in combination to allow for marking said first portion of said subsurface without any substantial disruption of the surface of said material, but the setting individually of which alone does not allow for said marking of said first portion of said substrate. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A product labeling system comprising:
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a first high energy electromagnetic or particle wave generator at least one second high energy electromagnetic of particle wave generator; and a controller operatively configured to direct wave produced by said first generator and the wave produced by said second generator onto a portion of the subsurface of the product to mark the product at said subsurface without generating any substantial disruption of the surface of said product and to control the settings of said first and at least one second high energy electromagnetic or particle wave generator such that each individually alone cannot effectively mark said first portion of said substrate. - View Dependent Claims (12, 13, 14, 15)
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16. A method for labeling a material, the method comprising:
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focusing a first high energy electromagnetic or particle wave generator on a first portion of the subsurface of a material; focusing one or more second high energy electromagnetic or particle wave generator(s) on said first portion of said subsurface; wherein the first and second generators are set in combination to have a power to allow for marking said first portion of said subsurface without any substantial disruption of the surface of said material but the setting of which individually alone does not allow for said marking of said first portion of said substrate . - View Dependent Claims (17, 18, 19, 20)
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Specification