Subsystems and methods for use in patch clamp systems

• US 7,741,829 B2
• Filed: 12/04/2008
• Issued: 06/22/2010
• Est. Priority Date: 05/04/2007
• Status: Active Grant

• Current Assignee: Tecella LLC
• Original Assignee: Tecella LLC
• Inventors: Tanaka, Yokichi J.
• Primary Examiner(s): He; Amy
• Application Number:
  US12/328,439
• Publication Number:
  US 20090085584A1
• Time in Patent Office: 565 Days
• Field of Search: 324/76.12, 324/76.83, 324/677, 205/792
• US Class Current: 324/76.12
• CPC Class Codes: G01N 33/48728 Investigating individual cells, e.g. by patch clamp, voltage clamp investigating individual particles in general G01N15/10

Abstract

Subsystems and methods for use in patch clamp systems are provided. For example, in certain embodiments, compensation circuitry is used to compensate for non-idealities present in the patch clamp system. The accuracy of this compensation may be verified by employing, for example, circuitry that models the patch clamp system.

Claims

1. A method of compensating for a capacitive waveform present in a patch clamp system, comprising:

measuring a magnitude of the capacitive waveform at each of a plurality of times; and

outputting a gain-adjusted compensatory waveform from each of a plurality of compensation circuits to compensate for the capacitive waveform,

wherein each compensation circuit has a unique time constant.

2. The method of claim 1 further comprising outputting an unadjusted compensatory waveform from each of the plurality of compensation circuits.

3. The method of claim 2 further comprising measuring a magnitude of each unadjusted compensatory waveform at each of the plurality of times.

4. The method of claim 3 further comprising calculating a gain adjustment for each of the plurality of compensation circuits.

5. The method of claim 4, wherein each gain adjustment is calculated based on the measured magnitude of the capacitive waveform at each of the plurality of times and the measured magnitude of each unadjusted compensatory waveform at each of the plurality of times.

6. The method of claim 1 further comprising calculating a leakage resistance present in the patch clamp system.

7. The method of claim 6 further comprising adjusting the measurement of the capacitive waveform to account for a virtual peak to be introduced into the capacitive waveform following compensation of the leakage resistance.

8. The method of claim 6 further comprising compensating for the leakage resistance present in the patch clamp system.

9. The method of claim 8 further comprising re-measuring the magnitude of the capacitive waveform at each of the plurality of times while the leakage resistance is compensated for.

10. A subsystem for compensating for a capacitive waveform present in a patch clamp system, comprising:

measurement circuitry for measuring a magnitude of the capacitive waveform at each of a plurality of times; and

a plurality of compensation circuits, each compensation circuit having a unique time constant and configured to output a gain-adjusted compensatory waveform to compensate for the capacitive waveform.

11. The subsystem of claim 10, wherein each compensation circuit is further configured to output an unadjusted compensatory waveform.

12. The subsystem of claim 11, wherein the measurement circuitry is further configured to measure a magnitude of each unadjusted compensatory waveform at each of the plurality of times.

13. The subsystem of claim 12 further comprising calculation circuitry for calculating a gain adjustment for each of the plurality of compensation circuits.

14. The subsystem of claim 13, wherein each gain adjustment is calculated based on the measured magnitude of the capacitive waveform at each of the plurality of times and the measured magnitude of each unadjusted compensatory waveform at each of the plurality of times.

15. The subsystem of claim 10 further comprising calculation circuitry for calculating a leakage resistance present in the patch clamp system.

16. The subsystem of claim 15, wherein the calculation circuitry is further configured to adjust the measurement of the capacitive waveform to account for a virtual peak to be introduced into the capacitive waveform following compensation of the leakage resistance.

17. The subsystem of claim 15 further comprising leakage resistance compensation circuitry for compensating the leakage resistance present in the patch clamp system.

18. The subsystem of claim 17, wherein the measurement circuitry is further configured to re-measure the magnitude of the capacitive waveform at each of the plurality of times while the leakage resistance compensation circuitry compensates the leakage resistance.