Methods, arrangements and systems for polarization-sensitive optical frequency domain imaging of a sample

• US 7,742,173 B2
• Filed: 04/05/2007
• Issued: 06/22/2010
• Est. Priority Date: 04/05/2006
• Status: Active Grant

• Current Assignee: The General Hospital Corporation (Mass General Brigham, Inc.)
• Original Assignee: The General Hospital Corporation (Mass General Brigham, Inc.)
• Inventors: De Boer, Johannes F., Bouma, Brett Eugene, Yun, Seok-Hyun, Tearney, Guillermo J.
• Primary Examiner(s): Turner; Samuel A
• Application Number:
  US11/697,012
• Publication Number:
  US 20070236700A1
• Time in Patent Office: 1,174 Days
• Field of Search: 356/477, 356/479, 356/497
• US Class Current: 356/479
• CPC Class Codes: G01B 2290/70 Using polarization in the interferometer
• CPC Class Codes: G01B 9/02002 using two or more frequencies
• CPC Class Codes: G01B 9/02004 using frequency scans
• CPC Class Codes: G01B 9/02011 using temporal polarization variation
• CPC Class Codes: G01B 9/02091 Tomographic interferometers, e.g. based on optical coherence
• CPC Class Codes: G01N 21/4795 spatially resolved investigating of object in scattering medium in vivo A61B

Abstract

Arrangements and methods are provided for obtaining data associated with a sample. For example, at least one first electro-magnetic radiation can be provided to a sample and at least one second electro-magnetic radiation can be provided to a reference (e.g., a non-reflective reference). A frequency of such radiation(s) can repetitively vary over time with a first characteristic period. In addition, a polarization state of the first electro-magnetic radiation, the second electro-magnetic radiation, a third electro-magnetic radiation (associated with the first radiation) or a fourth electro-magnetic radiation (associated with the second radiation) can repetitively vary over time with a second characteristic period which is shorter than the first period. The data for imaging at least one portion of the sample can be provided as a function of the polarization state. In addition or alternatively, the third and fourth electro-magnetic radiations can be combined so as to determine an axial reflectance profile of at least one portion of the sample.

Claims

1. An apparatus comprising:

at least one first arrangement which is configured to provide at least one first electro-magnetic radiation to a sample and at least one second electro-magnetic radiation to a reference, wherein a frequency of radiation provided by the at least one first arrangement varies repetitively over time with a first characteristic period;

at least one second arrangement which is configured to repetitively vary a polarization state of at least one of the first electro-magnetic radiation, the second electro-magnetic radiation, a third electro-magnetic radiation or a fourth electro-magnetic radiation over time with a second characteristic period; and

at least one third arrangement which is configured to provide data for imaging at least one portion of the sample as a function of the polarization state,

wherein the third electro-magnetic radiation is associated with the at least one first radiation and the fourth electro-magnetic radiation is associated with the at least one second radiation, and wherein the second period is shorter than the first period.

2. The apparatus according to claim 1, wherein the at least one first arrangement is a polarized source.

3. The apparatus according to claim 1, wherein the at least one second arrangement is at least one of a polarization modulator, a delayed interferometer, a frequency shifter or a birefringence medium.

4. The apparatus according to claim 1, wherein the at least one first arrangement is an unpolarized source, and further comprising a polarization arrangement which is configured to polarize at least one of the first, second, third or fourth electro-magnetic radiations.

5. The apparatus according to claim 1, wherein the first and second arrangements are provided in a polarization-modulated source.

6. The apparatus according to claim 1, wherein the third electro-magnetic radiation is provided from the sample, and wherein the fourth electro-magnetic radiation is provided from the reference.

7. The apparatus according to claim 1, further comprising:

at least one fourth arrangement is configured to detect a first interference signal between the third and fourth radiations in a first polarization state; and

at least one fifth arrangement is configured to detect a second interference signal between the third and fourth electro-magnetic radiations in a second polarization state, wherein the first and second polarization states are different from one another.

8. The apparatus according to claim 7, wherein at least one of the fourth arrangement or the fifth arrangement is configured to receive a portion of at least one of the first electro-magnetic radiation, the second electro-magnetic radiation or the fourth electro-magnetic radiation, and wherein the fourth electro-magnetic radiation is provided from the reference.

9. The apparatus according to claim 7, further comprising at least one sixth arrangement is configured to digitize the first and second interference signals, and determine polarization properties of at least one portion of the sample.

10. The apparatus according to claim 7, wherein the first and second polarization states are approximately orthogonal with respect to one another.

11. The apparatus according to claim 1, wherein the at least one third arrangement generates at least one image of polarization properties of the sample.

12. The apparatus according to claim 11, wherein the polarization properties include at least one of a birefringence, an axis of the birefringence, a diattenuation, or an axis of the diattenuation.

13. The apparatus according to claim 1, wherein the reference is a non-reflective reference.

14. The apparatus according to claim 1, wherein the first characteristic period is shorter than approximately 100 microseconds.

15. The apparatus according to claim 1, wherein the frequency of the radiation provided by the at least one first arrangement is varied by approximately at least 1 Terra Hz within the first characteristic period.

16. The apparatus according to claim 1, wherein the frequency of the radiation provided by the at least one first arrangement is varied by approximately at most 100 GHz within the second characteristic period.

17. The apparatus according to claim 1, wherein the second period is shorter than approximately 1/10 of the first period.

18. The apparatus according to claim 1, further comprising at least one second arrangement which includes a waveguide arrangement and which is configured to combine the third electro-magnetic radiation and the fourth electro-magnetic radiation so as to determine an axial reflectance profile of at least one portion of the sample during the first characteristic period.

19. The apparatus according to claim 18, wherein the data includes polarization properties of the sample.

20. The apparatus according to claim 18, wherein the at least one waveguide second arrangement includes at least one optical fiber.

21. An apparatus comprising:

at least one first arrangement which is configured to provide at least one first electro-magnetic radiation to a sample and at least one second electro-magnetic radiation to a reference, wherein a frequency of radiation provided by the at least one first arrangement varies repetitively over time with a first characteristic period;

at least one waveguide second arrangement which is configured to combine a third electro-magnetic radiation and a fourth electro-magnetic radiation, the third and fourth electromagnetic radiations being associated with the first and second electromagnetic radiations, respectively, so as to determine an axial reflectance profile of at least one portion of the sample;

at least one third arrangement which is configured to repetitively vary a polarization state of at least one of the first electro-magnetic radiation, the second electro-magnetic radiation, the third electro-magnetic radiation or the fourth electro-magnetic radiation over time with a second characteristic period; and

at least one fourth arrangement which is configured to provide data for imaging at least one portion of the sample as a function of the polarization state, wherein the second period is shorter than the first period.

22. The apparatus according to claim 21, wherein the at least one first arrangement is a polarized source.

23. The apparatus according to claim 21, wherein the at least one third arrangement is at least one of a polarization modulator, a delayed interferometer, a frequency shifter or a birefringence medium.

24. The apparatus according to claim 21, wherein the at least one first arrangement is an unpolarized source, and further comprising a polarization arrangement which is configured to polarize at least one of the first, second, third or fourth electro-magnetic radiations.

25. The apparatus according to claim 21, wherein the first and third arrangements are provided in a polarization-modulated source.

26. The apparatus according to claim 21, wherein the third electro-magnetic radiation is provided from the sample, and wherein the fourth electro-magnetic radiation is provided from the reference.

27. The apparatus according to claim 21, further comprising:

at least one fifth arrangement is configured to detect a first interference signal between the third and fourth radiations in a first polarization state; and

at least one sixth arrangement is configured to detect a second interference signal between the third and fourth electro-magnetic radiations in a second polarization state, wherein the first and second polarization states are different from one another.

28. The apparatus according to claim 27, wherein at least one of the fifth arrangement or the sixth arrangement is configured to receive a portion of at least one of the first electro-magnetic radiation, the second electro-magnetic radiation or the fourth electro-magnetic radiation, and wherein the fourth electro-magnetic radiation is provided from the reference.

29. The apparatus according to claim 27, further comprising at least one seventh arrangement is configured to digitize the first and second interference signals, and determine polarization properties of at least one portion of the sample.

30. The apparatus according to claim 27, wherein the first and second polarization states are approximately orthogonal with respect to one another.

31. The apparatus according to claim 21, wherein the at least one fourth arrangement generates at least one image of polarization properties of the sample.

32. The apparatus according to claim 31, wherein the polarization properties include at least one of a birefringence, an axis of the birefringence, a diattenuation, or an axis of the diattenuation.

33. The apparatus according to claim 21, wherein the reference is a non-reflective reference.

34. The apparatus according to claim 21, wherein the first characteristic period is shorter than approximately 100 microseconds.

35. The apparatus according to claim 21, wherein the frequency of the radiation provided by the at least one first arrangement is varied by approximately at least 1 Terra Hz within the first characteristic period.

36. The apparatus according to claim 21, wherein the frequency of the radiation provided by the at least one first arrangement is varied by approximately at most 100 GHz within the second characteristic period.

37. The apparatus according to claim 21, wherein the second period is shorter than approximately 1/10 of the first period.

38. The apparatus according to claim 21, wherein the axial reflectance profile is determined during a first characteristic period.

39. The apparatus according to claim 21, wherein the data includes polarization properties of the sample.

40. The apparatus according to claim 21, wherein the at least one waveguide second arrangement includes at least one optical fiber.

41. A method comprising for providing data associated with a sample:

providing at least one first electro-magnetic radiation to the sample and at least one second electro-magnetic radiation to a reference, wherein a frequency of at least one of the first and second radiations varies repetitively over time with a first characteristic period;

repetitively varying a polarization state of at least one of the first electro-magnetic radiation, the second electro-magnetic radiation, a third electro-magnetic radiation or a fourth electro-magnetic radiation over time with a second characteristic period; and

providing the data for imaging at least one portion of the sample as a function of the polarization state,

wherein the third electro-magnetic radiation is associated with the at least one first radiation and the fourth electro-magnetic radiation is associated with the at least one second radiation, and wherein the second period is shorter than the first period.

42. A method comprising for providing data associated with a sample:

providing at least one first electro-magnetic radiation to the sample and at least one second electro-magnetic radiation to a reference, wherein a frequency of radiation provided by the at least one first arrangement varies repetitively over time with a first characteristic period;

combining a third electro-magnetic radiation and a fourth electro-magnetic radiation, the third and fourth electromagnetic radiations being associated with the first and second electromagnetic radiations, respectively, so as to determine an axial reflectance profile of at least one portion of the sample;

repetitively varying a polarization state of at least one of the first electro-magnetic radiation, the second electro-magnetic radiation, the third electro-magnetic radiation or the fourth electro-magnetic radiation over time with a second characteristic period; and

providing the data for imaging at least one portion of the sample as a function of the polarization state, wherein the second period is shorter than the first period.